JPS5987681U - Electrical component testing equipment - Google Patents
Electrical component testing equipmentInfo
- Publication number
- JPS5987681U JPS5987681U JP18445582U JP18445582U JPS5987681U JP S5987681 U JPS5987681 U JP S5987681U JP 18445582 U JP18445582 U JP 18445582U JP 18445582 U JP18445582 U JP 18445582U JP S5987681 U JPS5987681 U JP S5987681U
- Authority
- JP
- Japan
- Prior art keywords
- electrical component
- circuit
- signal
- measured
- signal generation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図はICとソケットの一般的な接続の図、第2図は
CANタイプICの端子の接続の一般的な図、第3図は
従来の電気部品の試験装置のブロック図、第4図はこの
考案による装置の一実施例を示す図、第5図はこの考案
による装置の一部分である切換回路のブロック図である
。
図中1はIC,2はソケット、3は端子、4はコンタク
ト、6はICの合マーク、7はソケットの合マーク、8
は絶縁物、9は内部接続ワイヤ、10は操作パネイレ、
11は制御回路、12はマトリックス回路、13は信号
発生回路、14は計測回路、15はアダプタ、16は切
換回路、17はICケース接触子、19はコンパレータ
、2oは抵抗器、21はAND回路、22は直流電源、
23はパルスモータ、24はパルス発生回路、25はチ
ップ、26はICケースである。なお図中、同一あるい
は相当部分には同一符号を付して示しである。Figure 1 is a diagram of a general connection between an IC and a socket, Figure 2 is a diagram of a general connection of a CAN type IC terminal, Figure 3 is a block diagram of a conventional electrical component testing device, and Figure 4 is a diagram of a general connection between an IC and a socket. 5 is a diagram showing an embodiment of the device according to this invention, and FIG. 5 is a block diagram of a switching circuit that is a part of the device according to this invention. In the figure, 1 is the IC, 2 is the socket, 3 is the terminal, 4 is the contact, 6 is the IC match mark, 7 is the socket match mark, 8
is an insulator, 9 is an internal connection wire, 10 is an operation panel,
11 is a control circuit, 12 is a matrix circuit, 13 is a signal generation circuit, 14 is a measurement circuit, 15 is an adapter, 16 is a switching circuit, 17 is an IC case contactor, 19 is a comparator, 2o is a resistor, 21 is an AND circuit , 22 is a DC power supply,
23 is a pulse motor, 24 is a pulse generation circuit, 25 is a chip, and 26 is an IC case. In the drawings, the same or corresponding parts are designated by the same reference numerals.
Claims (1)
るための信号を発生する信号発生回路と、上記電気部品
の入出力信号を計測する計測回路と、上記信号発生回路
および計測回路の被測定電気部品への接続を切換えるマ
トリックス回路と、上記信号発生回路、計測回路、マト
リックス回路を制御する制御回路と、上記制御回路を操
作する操作パネルと、被測定電気部品の入力端子に印加
する信号および上記電気部品の出力端子から出力される
信号の増巾をするアダプタと、上記電気部品の入力端子
に信号を印加し、更に出力端子からの信号を計測回路に
接続するために、上記電気部品の合マークを基準にして
上記電気部品を装着するテストソケットとから成る電気
部品の試験装置において、被測定電気部品の合マークに
関係なくテストソケットに装着した場合でも上記電気部
品の合マークを基準にして装着した時と等価の接続にな
る様な切換回路を付加したことを特徴とする電気部品の
試験装置。A signal generation circuit that generates a signal to be applied to an input terminal of an electrical component to be measured having a plurality of terminals, a measurement circuit that measures input/output signals of the electrical component, and a signal generation circuit that is connected to the signal generation circuit and the measurement circuit. A matrix circuit that switches the connection to the electrical component to be measured, a control circuit that controls the signal generation circuit, measurement circuit, and matrix circuit, an operation panel that operates the control circuit, and a signal that is applied to the input terminal of the electrical component to be measured. and an adapter for amplifying the signal output from the output terminal of the electrical component, and an adapter for applying the signal to the input terminal of the electrical component and further connecting the signal from the output terminal to the measurement circuit. In an electrical component testing device consisting of a test socket to which the electrical component is mounted based on the alignment mark, the alignment mark of the electrical component mentioned above is used as the reference even when the electrical component is installed in the test socket regardless of the alignment mark of the electrical component to be measured. A testing device for electrical parts, characterized in that a switching circuit is added so that the connection is equivalent to that when the electrical parts are mounted.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18445582U JPS5987681U (en) | 1982-12-06 | 1982-12-06 | Electrical component testing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18445582U JPS5987681U (en) | 1982-12-06 | 1982-12-06 | Electrical component testing equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5987681U true JPS5987681U (en) | 1984-06-13 |
Family
ID=30398949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18445582U Pending JPS5987681U (en) | 1982-12-06 | 1982-12-06 | Electrical component testing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5987681U (en) |
-
1982
- 1982-12-06 JP JP18445582U patent/JPS5987681U/en active Pending
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