JPS5982739A - 自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置 - Google Patents

自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置

Info

Publication number
JPS5982739A
JPS5982739A JP19310582A JP19310582A JPS5982739A JP S5982739 A JPS5982739 A JP S5982739A JP 19310582 A JP19310582 A JP 19310582A JP 19310582 A JP19310582 A JP 19310582A JP S5982739 A JPS5982739 A JP S5982739A
Authority
JP
Japan
Prior art keywords
overdrive
wafer
base plate
semiconductor wafer
stylus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19310582A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0366812B2 (enrdf_load_html_response
Inventor
Tetsuya Utsunomiya
宇都宮　鉄也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TELMEC CO Ltd
Original Assignee
TELMEC CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TELMEC CO Ltd filed Critical TELMEC CO Ltd
Priority to JP19310582A priority Critical patent/JPS5982739A/ja
Publication of JPS5982739A publication Critical patent/JPS5982739A/ja
Publication of JPH0366812B2 publication Critical patent/JPH0366812B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP19310582A 1982-11-02 1982-11-02 自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置 Granted JPS5982739A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19310582A JPS5982739A (ja) 1982-11-02 1982-11-02 自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19310582A JPS5982739A (ja) 1982-11-02 1982-11-02 自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置

Related Child Applications (3)

Application Number Title Priority Date Filing Date
JP13566687A Division JPS62295428A (ja) 1987-05-29 1987-05-29 半導体ウエハ−プロ−バ−
JP1311593A Division JPH02290035A (ja) 1989-11-30 1989-11-30 半導体ウエハー測定装置
JP4215685A Division JP2520823B2 (ja) 1992-07-22 1992-07-22 半導体ウエハ―測定方法

Publications (2)

Publication Number Publication Date
JPS5982739A true JPS5982739A (ja) 1984-05-12
JPH0366812B2 JPH0366812B2 (enrdf_load_html_response) 1991-10-18

Family

ID=16302319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19310582A Granted JPS5982739A (ja) 1982-11-02 1982-11-02 自動半導体ウエハ−プロ−バ−のオ−バ−ドライブ装置

Country Status (1)

Country Link
JP (1) JPS5982739A (enrdf_load_html_response)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6239022A (ja) * 1985-08-14 1987-02-20 Toshiba Corp プロ−ブテスト方法
JPS6375669A (ja) * 1986-09-08 1988-04-06 テクトロニックス・インコーポレイテッド Ｉｃプローブ装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55125639A (en) * 1979-03-23 1980-09-27 Hitachi Ltd Inspection apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55125639A (en) * 1979-03-23 1980-09-27 Hitachi Ltd Inspection apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6239022A (ja) * 1985-08-14 1987-02-20 Toshiba Corp プロ−ブテスト方法
JPS6375669A (ja) * 1986-09-08 1988-04-06 テクトロニックス・インコーポレイテッド Ｉｃプローブ装置

Also Published As

Publication number Publication date
JPH0366812B2 (enrdf_load_html_response) 1991-10-18

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