JPS5963738A - 誘電体分離基板の製造方法 - Google Patents
誘電体分離基板の製造方法Info
- Publication number
- JPS5963738A JPS5963738A JP57174263A JP17426382A JPS5963738A JP S5963738 A JPS5963738 A JP S5963738A JP 57174263 A JP57174263 A JP 57174263A JP 17426382 A JP17426382 A JP 17426382A JP S5963738 A JPS5963738 A JP S5963738A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- polycrystalline silicon
- substrate
- dielectric isolation
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/019—
-
- H10W10/10—
Landscapes
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57174263A JPS5963738A (ja) | 1982-10-04 | 1982-10-04 | 誘電体分離基板の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57174263A JPS5963738A (ja) | 1982-10-04 | 1982-10-04 | 誘電体分離基板の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5963738A true JPS5963738A (ja) | 1984-04-11 |
| JPS6244417B2 JPS6244417B2 (cg-RX-API-DMAC10.html) | 1987-09-21 |
Family
ID=15975575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57174263A Granted JPS5963738A (ja) | 1982-10-04 | 1982-10-04 | 誘電体分離基板の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5963738A (cg-RX-API-DMAC10.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5382551A (en) * | 1993-04-09 | 1995-01-17 | Micron Semiconductor, Inc. | Method for reducing the effects of semiconductor substrate deformities |
-
1982
- 1982-10-04 JP JP57174263A patent/JPS5963738A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5382551A (en) * | 1993-04-09 | 1995-01-17 | Micron Semiconductor, Inc. | Method for reducing the effects of semiconductor substrate deformities |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6244417B2 (cg-RX-API-DMAC10.html) | 1987-09-21 |
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