JPS5940275A - コレクタ損失算出装置 - Google Patents

コレクタ損失算出装置

Info

Publication number
JPS5940275A
JPS5940275A JP15219482A JP15219482A JPS5940275A JP S5940275 A JPS5940275 A JP S5940275A JP 15219482 A JP15219482 A JP 15219482A JP 15219482 A JP15219482 A JP 15219482A JP S5940275 A JPS5940275 A JP S5940275A
Authority
JP
Japan
Prior art keywords
output
collector loss
load
power amplifier
loss
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15219482A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429983B2 (enrdf_load_stackoverflow
Inventor
Hideyasu Jikou
秀保 慈幸
Katsuhiko Higashiyama
勝比古 東山
Takeshi Sato
剛士 佐藤
Kazuo Toda
戸田　一雄
Takashi Fujii
喬 藤井
Shizuyoshi Matsubara
松原　静喜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP15219482A priority Critical patent/JPS5940275A/ja
Publication of JPS5940275A publication Critical patent/JPS5940275A/ja
Publication of JPH0429983B2 publication Critical patent/JPH0429983B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP15219482A 1982-08-31 1982-08-31 コレクタ損失算出装置 Granted JPS5940275A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15219482A JPS5940275A (ja) 1982-08-31 1982-08-31 コレクタ損失算出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15219482A JPS5940275A (ja) 1982-08-31 1982-08-31 コレクタ損失算出装置

Publications (2)

Publication Number Publication Date
JPS5940275A true JPS5940275A (ja) 1984-03-05
JPH0429983B2 JPH0429983B2 (enrdf_load_stackoverflow) 1992-05-20

Family

ID=15535111

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15219482A Granted JPS5940275A (ja) 1982-08-31 1982-08-31 コレクタ損失算出装置

Country Status (1)

Country Link
JP (1) JPS5940275A (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51144152A (en) * 1975-06-05 1976-12-10 Kikusui Denshi Kogyo Kk Power detector
JPS55122170A (en) * 1979-03-15 1980-09-19 Fujitsu Ltd Method of measuring lag time of integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51144152A (en) * 1975-06-05 1976-12-10 Kikusui Denshi Kogyo Kk Power detector
JPS55122170A (en) * 1979-03-15 1980-09-19 Fujitsu Ltd Method of measuring lag time of integrated circuit

Also Published As

Publication number Publication date
JPH0429983B2 (enrdf_load_stackoverflow) 1992-05-20

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