JPS5930288B2 - クロツク信号監視方法 - Google Patents
クロツク信号監視方法Info
- Publication number
- JPS5930288B2 JPS5930288B2 JP51116470A JP11647076A JPS5930288B2 JP S5930288 B2 JPS5930288 B2 JP S5930288B2 JP 51116470 A JP51116470 A JP 51116470A JP 11647076 A JP11647076 A JP 11647076A JP S5930288 B2 JPS5930288 B2 JP S5930288B2
- Authority
- JP
- Japan
- Prior art keywords
- clock
- monitoring
- supervisory
- register
- bit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
- Manipulation Of Pulses (AREA)
- Dc Digital Transmission (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Alarm Systems (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
- Detection And Correction Of Errors (AREA)
- Selective Calling Equipment (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPC336475 | 1975-09-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5243335A JPS5243335A (en) | 1977-04-05 |
JPS5930288B2 true JPS5930288B2 (ja) | 1984-07-26 |
Family
ID=3766383
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51116470A Expired JPS5930288B2 (ja) | 1975-09-29 | 1976-09-28 | クロツク信号監視方法 |
Country Status (25)
Country | Link |
---|---|
US (1) | US4081662A (en, 2012) |
JP (1) | JPS5930288B2 (en, 2012) |
AR (1) | AR212340A1 (en, 2012) |
BE (1) | BE846703A (en, 2012) |
BR (1) | BR7606344A (en, 2012) |
CA (1) | CA1074020A (en, 2012) |
CH (1) | CH607460A5 (en, 2012) |
CS (1) | CS251055B2 (en, 2012) |
DD (1) | DD126299A5 (en, 2012) |
DE (1) | DE2641700A1 (en, 2012) |
DK (1) | DK153605C (en, 2012) |
EG (1) | EG13396A (en, 2012) |
ES (1) | ES451922A1 (en, 2012) |
FI (1) | FI64474C (en, 2012) |
FR (1) | FR2326080A1 (en, 2012) |
GB (1) | GB1527167A (en, 2012) |
HU (1) | HU174136B (en, 2012) |
IN (1) | IN146507B (en, 2012) |
IT (1) | IT1072928B (en, 2012) |
MY (1) | MY8100229A (en, 2012) |
NL (1) | NL187136C (en, 2012) |
NO (1) | NO147199C (en, 2012) |
PL (1) | PL108782B1 (en, 2012) |
SU (1) | SU1109073A3 (en, 2012) |
YU (1) | YU37408B (en, 2012) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4095045A (en) * | 1977-01-19 | 1978-06-13 | General Datacomm Industries, Inc. | Method and apparatus for signaling in a communication system |
DE3317642A1 (de) * | 1982-05-21 | 1983-11-24 | International Computers Ltd., London | Datenverarbeitungseinrichtung |
FR2553559B1 (fr) * | 1983-10-14 | 1988-10-14 | Citroen Sa | Controle du chargement de circuits integres du type registre serie parallele ayant un registre de chargement distinct des etages de sortie |
US4542509A (en) * | 1983-10-31 | 1985-09-17 | International Business Machines Corporation | Fault testing a clock distribution network |
US4653054A (en) * | 1985-04-12 | 1987-03-24 | Itt Corporation | Redundant clock combiner |
US4800564A (en) * | 1986-09-29 | 1989-01-24 | International Business Machines Corporation | High performance clock system error detection and fault isolation |
EP0294505B1 (en) * | 1987-06-11 | 1993-03-03 | International Business Machines Corporation | Clock generator system |
DE8816680U1 (de) * | 1988-02-18 | 1990-04-19 | Dr. Johannes Heidenhain Gmbh, 83301 Traunreut | Positionsmeßeinrichtung mit einer Schaltungsanordnung zur Erkennung von Störsignalen |
US5077739A (en) * | 1989-05-17 | 1991-12-31 | Unisys Corporation | Method for isolating failures of clear signals in instruction processors |
DE19923231C1 (de) * | 1999-05-20 | 2001-01-11 | Beta Res Gmbh | Digitale Analysierung von Frequenzen bei Chipkarten |
US9115870B2 (en) * | 2013-03-14 | 2015-08-25 | Cree, Inc. | LED lamp and hybrid reflector |
US9897651B2 (en) * | 2016-03-03 | 2018-02-20 | Qualcomm Incorporated | Ultra-fast autonomous clock monitoring circuit for safe and secure automotive applications |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE197047C1 (en, 2012) * | ||||
US3056108A (en) * | 1959-06-30 | 1962-09-25 | Internat Bushiness Machines Co | Error check circuit |
US3176269A (en) * | 1962-05-28 | 1965-03-30 | Ibm | Ring counter checking circuit |
DE1537379C3 (de) * | 1967-09-22 | 1980-07-03 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Sicherheitsschaltung zum Durchführen logischer Verknüpfungen für binäre Schaltvariable und deren antivalente Schaltvariable |
US3659088A (en) * | 1970-08-06 | 1972-04-25 | Cogar Corp | Method for indicating memory chip failure modes |
US3805152A (en) * | 1971-08-04 | 1974-04-16 | Ibm | Recirculating testing methods and apparatus |
US3815025A (en) * | 1971-10-18 | 1974-06-04 | Ibm | Large-scale integrated circuit testing structure |
US3789205A (en) * | 1972-09-28 | 1974-01-29 | Ibm | Method of testing mosfet planar boards |
US3761695A (en) * | 1972-10-16 | 1973-09-25 | Ibm | Method of level sensitive testing a functional logic system |
US3961252A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
-
1976
- 1976-09-09 IN IN1665/CAL/76A patent/IN146507B/en unknown
- 1976-09-13 US US05/722,673 patent/US4081662A/en not_active Expired - Lifetime
- 1976-09-16 DE DE19762641700 patent/DE2641700A1/de active Granted
- 1976-09-16 CA CA261,360A patent/CA1074020A/en not_active Expired
- 1976-09-20 NL NLAANVRAGE7610427,A patent/NL187136C/xx not_active IP Right Cessation
- 1976-09-22 YU YU2324/76A patent/YU37408B/xx unknown
- 1976-09-22 FI FI762704A patent/FI64474C/sv not_active IP Right Cessation
- 1976-09-23 BR BR7606344A patent/BR7606344A/pt unknown
- 1976-09-24 GB GB39859/76A patent/GB1527167A/en not_active Expired
- 1976-09-27 PL PL1976192689A patent/PL108782B1/pl unknown
- 1976-09-27 CH CH1217876A patent/CH607460A5/xx not_active IP Right Cessation
- 1976-09-27 DD DD195000A patent/DD126299A5/xx unknown
- 1976-09-28 DK DK436276A patent/DK153605C/da not_active IP Right Cessation
- 1976-09-28 AR AR264896A patent/AR212340A1/es active
- 1976-09-28 ES ES451922A patent/ES451922A1/es not_active Expired
- 1976-09-28 HU HU76EI701A patent/HU174136B/hu unknown
- 1976-09-28 NO NO76763310A patent/NO147199C/no unknown
- 1976-09-28 FR FR7629130A patent/FR2326080A1/fr active Granted
- 1976-09-28 JP JP51116470A patent/JPS5930288B2/ja not_active Expired
- 1976-09-29 BE BE171039A patent/BE846703A/xx not_active IP Right Cessation
- 1976-09-29 IT IT7627776A patent/IT1072928B/it active
- 1976-09-29 EG EG596/76A patent/EG13396A/xx active
- 1976-09-29 CS CS766293A patent/CS251055B2/cs unknown
- 1976-09-29 SU SU762404801A patent/SU1109073A3/ru active
-
1981
- 1981-12-30 MY MY229/81A patent/MY8100229A/xx unknown
Also Published As
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