JPS59220717A - Testing method of display element - Google Patents
Testing method of display elementInfo
- Publication number
- JPS59220717A JPS59220717A JP9733783A JP9733783A JPS59220717A JP S59220717 A JPS59220717 A JP S59220717A JP 9733783 A JP9733783 A JP 9733783A JP 9733783 A JP9733783 A JP 9733783A JP S59220717 A JPS59220717 A JP S59220717A
- Authority
- JP
- Japan
- Prior art keywords
- test
- terminals
- substrate
- display element
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Liquid Crystal (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
【発明の詳細な説明】
く技術分野〉
本発明は液晶表示素子等の２枚の基板間に表示用物質が
充填され前記基板の少な（とも一方の基板端に電極端子
が配置される表示素子の試験方法に関するものであって
、特に上記電極端子が極めて高密度に配置される表示素
子の試験方法に関するものである。[Detailed Description of the Invention] [Technical Field] The present invention relates to a display element, such as a liquid crystal display element, in which a display material is filled between two substrates, and electrode terminals are disposed at the edge of one of the substrates. The present invention relates to a testing method for a display element in which the electrode terminals are arranged in an extremely high density.
〈従来技術〉
従来、液晶表示素子の完成時においてその素子の基板内
面上に形成された電極リード線に断線。<Prior art> Conventionally, when a liquid crystal display element was completed, the electrode lead wires formed on the inner surface of the element's substrate were broken.
短絡等の不備が無いかベテストされた。第１図にそのテ
スト状態を示す。同図で１は完成した液晶表示素子、２
はゴムコネクター、３はプリント基板である。同図に示
す如〈従来ではプリント基板３上に設置された回路から
試験信−リ・をゴムコネクター２を介して液晶表示素子
１の電極端子１ａに供給して液晶表示素子１の基板内面
上に形成された電極リード線１ａの断線、短絡等の不備
の有無を検出するものであった。しかし以上の試験方法
では多デユーティ用液晶表示素子等の電極端子数が非常
に多いものにおいて問題があった。即ち上記電極端子数
が非常に多いものにおいては電極端子１ａが極めて高密
度に配置される為に電極端子１ａのパターンとゴムコネ
クター２の導電部との重ね合わせを正確に行なうことが
困難でなり、その為上記試験の際にミスマツチングを生
じたり或いは上記試験に長時間を要する等の不都合があ
った。この不都合を防止し確実な試験を行なう為には高
精度、高密度、高価格のゴムコネクター２（若しくはリ
ードピン）及びプリント基板３を使用せざるを得す、コ
スト高になっていた。It was tested to ensure that there were no defects such as short circuits. Figure 1 shows the test conditions. In the figure, 1 is the completed liquid crystal display element, 2
is a rubber connector, and 3 is a printed circuit board. As shown in the figure, in the past, a test signal was supplied from a circuit installed on a printed circuit board 3 to an electrode terminal 1a of a liquid crystal display element 1 through a rubber connector 2, and a test signal was applied to the inner surface of the substrate of the liquid crystal display element 1. The purpose was to detect the presence or absence of defects such as disconnections and short circuits in the electrode lead wires 1a formed in the electrode lead wires 1a. However, the above test method has a problem in devices with a large number of electrode terminals, such as multi-duty liquid crystal display devices. In other words, in the case where the number of electrode terminals is extremely large, the electrode terminals 1a are arranged at extremely high density, making it difficult to accurately overlap the pattern of the electrode terminals 1a and the conductive portion of the rubber connector 2. Therefore, there were inconveniences such as mismatching occurring during the above test or requiring a long time for the above test. In order to prevent this inconvenience and conduct a reliable test, it is necessary to use a rubber connector 2 (or lead pin) and a printed circuit board 3 that are highly accurate, dense, and expensive, resulting in high costs.
〈目的〉
本発明は以上の従来問題点を解消する為になされたもの
であり、電極端子が極めて高密度にされる表示素子の試
験を正確にしかも容易に行なうことを目的とするもので
ある。<Purpose> The present invention has been made to solve the above-mentioned conventional problems, and its purpose is to accurately and easily test display elements in which electrode terminals are arranged at extremely high density. .
〈実施例〉
以下本発明に係る表示素子の試験方法の一実施例につい
て詳細に説明を行なう。第２図は本発明に係る表示素子
の試験方法の一実施例の説明図である。同図で４は電極
端子４ａが極めて高密度に配置された液晶表示素子であ
る。ここで高密度に配置された電極端子とは１叫あたり
３本以上の導体が形成されているものを言う。例えばＩ
Ｍあたりにおいて中１５０μの導体が３本存在（１５０
μ×８＝４５０μ）し、中１８０μの非導体部が３本存
在（１８０μＸ ３＝５４０μ）する構成がそれである
。上記液晶表示素子４の電極端子４ａが形成された基板
は延出形成され、その基板延出個所４′には上記電極端
子４ａが延長されている。そしてこの延長部に試験用端
子４’ａが設けられる。この試験用端子４’ａはその長
さが周期的に異なり、同図に示される如（ａ 、ａ
、−、ａ が同一長さ、ｂｌ、ｂ２゜＋２
ｎ
・・・、ｂ が同一長さ、Ｊ、Ｃ２＋・・・、ｃｎが同
一長さである。５はゴムコネクターであり、該ゴムコネ
クター５は３本の通常のゴムコネクター５ａ。<Example> Hereinafter, an example of the method for testing a display element according to the present invention will be described in detail. FIG. 2 is an explanatory diagram of an embodiment of the display element testing method according to the present invention. In the figure, reference numeral 4 denotes a liquid crystal display element in which electrode terminals 4a are arranged at extremely high density. Here, the term "electrode terminals arranged in high density" refers to those in which three or more conductors are formed per electrode terminal. For example I
There are three conductors of medium 150μ around M (150
μ×8=450μ), and there are three non-conductor portions with a diameter of 180μ (180μ×3=540μ). The substrate on which the electrode terminals 4a of the liquid crystal display element 4 are formed is formed to extend, and the electrode terminals 4a are extended to the extending portions 4' of the substrate. A test terminal 4'a is provided in this extension. The length of this test terminal 4'a varies periodically, as shown in the figure (a, a
, -, a have the same length, bl, b2゜+2
n..., b have the same length, and J, C2+..., cn have the same length. 5 is a rubber connector, and the rubber connector 5 is three ordinary rubber connectors 5a.
５ｂ ＋ ５ｃから構成されている。この通常のコムコ
ネクター５ａ 、５ｂ 、５ｃとしては通常腕時計用、
電卓用、計測用に使われるもので十分使用可能である。It is composed of 5b + 5c. These normal com connectors 5a, 5b, 5c are for normal wristwatches,
Those used for calculators and measurements are fully usable.
ゴムコネクター５ａは試験用端子ａ１゜ａ２．・・・Ｉ
ａｏと接続され、ゴムコネクター５ｂは試験用端子す、
、ｂ２．・・・ｌｂ、 と接続され、ゴムコネクター
５ｃは試験用端子Ｃ１＋Ｃ２，・・・＋ Ｃｎと接続さ
れるものである。The rubber connector 5a has test terminals a1, a2. ...I
ao, and the rubber connector 5b is a test terminal.
, b2. ...lb, and the rubber connector 5c is connected to test terminals C1+C2,...+Cn.
次に試験手順について説明する。Next, the test procedure will be explained.
（１） まずゴムコネクター５ａに図示されない回路
より試験信号を供給する。この時試験用端子ａＩ＋電極
に試験信号が送られる。この時試験用端子ａｌ、ａ２．
・・・、ａｎが繋がる電極が断線していれば該当電極が
全く点灯しないか若しくは不完全点灯するのでその異常
を瞬時に判別できる。(1) First, a test signal is supplied to the rubber connector 5a from a circuit not shown. At this time, a test signal is sent to the test terminal aI+ electrode. At this time, test terminals al, a2.
. . . If the electrode connected to an is disconnected, the corresponding electrode will not light up at all or will light up incompletely, so the abnormality can be instantly determined.
又試験用端子ａ１ｒａ２．・・・ｒ ａｎに繋がる電極
と他の電極とが短絡していれば、その他の電極が点灯す
るのでその異常を瞬時に判別できる。Also, test terminals a1ra2. ...If the electrode connected to RAN and another electrode are short-circuited, the other electrodes will light up, so the abnormality can be instantly determined.
（２）次にゴムコネクター５ａ及びゴムコネクター５ｂ
に試験信号を供給する。この時試験用端子” ｌ ＋
” ２＋ ”’ ＋ ａ ｎ 及び試験用端子す、、ｂ
２゜・・、ｂｎに試験信号が供給され、従って上記試験
用端子ａＩ、ａ２＋・・・、ａｎ 及び試験用端子ｂ１
゜ｂ２．・・・、ｂｎに接続される各電極に試験信号が
送られる。この時試験用端子ａＩ、ａ２＋・・、ａｎ及
び試験用端子す、、ｂ２．・・、ｂｎに繋がる電極が断
線していれば該当電極が全く点灯しないか若しくは不完
全点灯する為にその異常を瞬時に判別できる。又試験用
端子す、、ｂ２．・・・、ｂｎに繋がる電極と試験用端
子Ｃ１，Ｃ２，・・・＋ Ｃｎに繋がる電極とが短絡し
ていれば試験用端子Ｃ１＋Ｃ２，・・・ＩＣｎに繋がる
電極の何れかが点灯するのでその異常を瞬時に判別でき
る。(2) Next, rubber connector 5a and rubber connector 5b
The test signal is supplied to the At this time, test terminal "l +
"2+"' + a n and test terminals,, b
A test signal is supplied to the test terminals aI, a2+..., an and the test terminal b1.
゜b2. ..., a test signal is sent to each electrode connected to bn. At this time, test terminals aI, a2+..., an and test terminals S, b2. ..., if the electrode connected to bn is disconnected, the relevant electrode will not light up at all or will light up incompletely, so the abnormality can be instantly determined. Also, test terminals, b2. If the electrode connected to ..., bn and the electrode connected to the test terminals C1, C2, ... + Cn are short-circuited, one of the electrodes connected to the test terminals C1 + C2, ... ICn will light up. Abnormalities can be identified instantly.
（３）次にゴムコネクター５ｂ及びゴムコネクター５ｃ
に試験信号を供給する。判別の仕方は上述の説明と同様
である。(3) Next, rubber connector 5b and rubber connector 5c
The test signal is supplied to the The method of determination is the same as the above explanation.
（４）以上の試験を実行後良品のものは第２図のＡ−Ｂ
線で切断を行ない、基板延出個所４′を液晶表示素子か
ら分離する。この分離後の液晶表示素子４を第３図に示
す。この第３図の液晶表示素子４は上記手順によって良
品であることが確認済のものである。勿論電極端子４ａ
は高密度に配置されている。(4) After performing the above tests, the non-defective products are A-B in Figure 2.
A cut is made along the line to separate the substrate extension portion 4' from the liquid crystal display element. The liquid crystal display element 4 after this separation is shown in FIG. The liquid crystal display element 4 shown in FIG. 3 has been confirmed to be a good product by the above procedure. Of course the electrode terminal 4a
are densely arranged.
〈効果〉
本発明によれはゴムコネクター、プリント基板等の端子
精度をそれ程高度なものにせずともハイデユーティ用液
晶表示素子、超小型液晶表示素子等の高密度に配置され
た端子を有する表示素子の試験を充分行なうことができ
るので、試験時間の短縮及びコストダウンが可能となる
。<Effects> According to the present invention, display elements having terminals arranged in a high density, such as high-duty liquid crystal display elements, ultra-small liquid crystal display elements, etc., can be produced without making the terminal precision of rubber connectors, printed circuit boards, etc. that high. Since it is possible to conduct sufficient tests, it is possible to shorten test time and reduce costs.
第１図は従来の液晶表示素子の試験方法の実施状態を示
す説″四囲、第２図は本発明に係る液晶表示素子の試験
方法の実施状態を示す説明図、第３図はその完成状態の
液晶表示素子の外観斜視図を示す。
図中、１：液晶表示素子 ２：ゴムコネクター３ニブ
リント基板 ４：液晶表示素子５：ゴムコネクターFigure 1 is an explanatory diagram showing the state of implementation of the conventional test method for liquid crystal display elements, Figure 2 is an explanatory diagram showing the state of implementation of the test method for liquid crystal display elements according to the present invention, and Figure 3 is its completed state. This is a perspective view of the external appearance of a liquid crystal display element. In the figure, 1: liquid crystal display element 2: rubber connector 3 Niblint board 4: liquid crystal display element 5: rubber connector
Claims (1)
な（とも一方の基板端に高密度に配置された端子か形成
されてなる表示素子の試験方法であって、 前記高密度に配置された端子が形成される基板を延出し
て形？該基板の延出個所に前記端子を延長すると共に、
該延長した端子の延長長さを周期的に異ならせ、前記延
長した端子の延長長さが等しい端子から構成される端子
群に夫奎 々信号を供給する前記端子群に対向した複数コネクター
を設け、該コネクターを介して前記基板上の電極の断線
、短絡等の状態を試験する試験信号を供給し、前記試験
完了後に前記基板の延出部分を分離したことを特徴とす
る表示素子の試験方法。1. A test method for a display element in which a display substance is filled between two circular plates and terminals arranged at a high density on one end of the substrate are formed, the high density Extending and shaping a substrate on which terminals arranged on the substrate are formed?Extending the terminals to the extending portions of the substrate, and
A plurality of connectors are provided opposite to the terminal group, which periodically vary the extension length of the extended terminal, and supply signals to the terminal group constituted by the terminals having the same extension length. , a method for testing a display element, characterized in that a test signal for testing the state of disconnection, short circuit, etc. of the electrode on the substrate is supplied via the connector, and after the test is completed, the extended portion of the substrate is separated. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9733783A JPS59220717A (en) | 1983-05-30 | 1983-05-30 | Testing method of display element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9733783A JPS59220717A (en) | 1983-05-30 | 1983-05-30 | Testing method of display element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59220717A true JPS59220717A (en) | 1984-12-12 |
Family
ID=14189667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9733783A Pending JPS59220717A (en) | 1983-05-30 | 1983-05-30 | Testing method of display element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59220717A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100478973B1 (en) * | 1996-05-29 | 2005-10-14 | 가부시키가이샤 엔프라스 | Contact device for display panel |
-
1983
- 1983-05-30 JP JP9733783A patent/JPS59220717A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100478973B1 (en) * | 1996-05-29 | 2005-10-14 | 가부시키가이샤 엔프라스 | Contact device for display panel |
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