JPS6033064A - Method and device for inspecting pattern of printed wiring board - Google Patents

Method and device for inspecting pattern of printed wiring board

Info

Publication number
JPS6033064A
JPS6033064A JP58141326A JP14132683A JPS6033064A JP S6033064 A JPS6033064 A JP S6033064A JP 58141326 A JP58141326 A JP 58141326A JP 14132683 A JP14132683 A JP 14132683A JP S6033064 A JPS6033064 A JP S6033064A
Authority
JP
Japan
Prior art keywords
printed wiring
wiring board
inspection
pattern
pins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58141326A
Other languages
Japanese (ja)
Other versions
JPH0354312B2 (en
Inventor
Yoshifumi Miyazawa
宮沢 美文
Kazumasa Adachi
足立 和正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ibiden Co Ltd
Original Assignee
Ibiden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibiden Co Ltd filed Critical Ibiden Co Ltd
Priority to JP58141326A priority Critical patent/JPS6033064A/en
Publication of JPS6033064A publication Critical patent/JPS6033064A/en
Publication of JPH0354312B2 publication Critical patent/JPH0354312B2/ja
Granted legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To allow an inspecting device to diagnose optionally its functions by itself by interposing a solid pattern substrate, and short-circuiting when an optional couple of probe pins of the inspecting device are brought into contact with each other. CONSTITUTION:Tips of probe pins of the inspecting device A contact the solid pattern substrate 8 which has a conductive surface 10 as its top surface, and a previously specified couple of pins which do not short-circuit also short-circuit by contacting the conductive surface in addition to couples of pins, e.g. B1 and B2, and C1 and C2 which conduct to each other, so short-circuit display is obtained for all. Thus, when the inspecting device A makes a self-diagnosis, the solid pattern is interposed to short-circuit each couple of pins, so data on that is stored in an IC memory then the inspection of the pattern of the printed wiring board and the self-diagnosis of the inspecting device are executed optionally and simultaneously.

Description

【発明の詳細な説明】 本発明は、プリント配線板のパターン検査方法とその装
置に係り、さらに詳しくは、プリント配線板のパターン
検査と共に、この検査に使用する当該検査装置の機能が
正常であるかどうかを簡易迅速に自己診断できるプリン
ト配線板のパターンの検査方法とその装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a printed wiring board pattern inspection method and an apparatus therefor, and more specifically, the present invention relates to a printed wiring board pattern inspection method and an apparatus for inspecting the pattern, and more specifically, to inspect the pattern of a printed wiring board and to check whether the inspection apparatus used for this inspection is functioning normally. The present invention relates to a printed wiring board pattern inspection method and apparatus that can easily and quickly self-diagnose whether the

プリント配線板のパターン検査は、一般に被検査体であ
るプリント配線板のパターンの一部であるランドにプロ
ーブビンを接触させ、各ランド間の導通状態の有無を検
査するに当り、あらかじめ例えば中央制御装置(ICメ
モリ)に記憶させておいた良品のプリント配線板のパタ
ーンの基準データと各被検査体のデータとを比較するこ
とにより、パターンの断線或いは短絡などの不良回路部
分金有するプリント配線板を発見する方法である。
In general, pattern inspection of printed wiring boards involves placing a probe bin in contact with lands that are part of the pattern of the printed wiring board to be inspected, and inspecting the presence or absence of continuity between each land. By comparing the standard data of patterns of good printed wiring boards stored in the device (IC memory) with the data of each test object, printed wiring boards with defective circuit parts such as disconnections or short circuits in the patterns can be detected. This is a way to discover.

ところが、上記の検査方法はこれに使用する当該検査装
置のプローブビンに不良個所があったり、プローブビン
と検査機本体とを連結する中継ケーブルの断線不良があ
ると当然のことながらプリント配線板のパターンの正錐
な検査をすることができない。
However, with the above inspection method, if there is a defective part in the probe bin of the inspection equipment used for this, or if there is a disconnection in the relay cable connecting the probe bin and the inspection machine main body, the printed wiring board may be damaged. It is not possible to perform a regular cone inspection of the pattern.

そのため、プリント配線板のパターンの検査を当うては
、常時その検査に使用する当該検査装置の機能が、正常
であるがどうがを診断しておく必聾がある。
Therefore, when inspecting the pattern of a printed wiring board, it is necessary to constantly diagnose whether the function of the inspection device used for the inspection is normal or not.

このようなことに鑑み、従来はICメモリ忙記憶させて
おいたプリント配線板のパターンの基環データを一部カ
セットテープなどに保存(セーブ)しておき、検査装置
の機能を自己診断するためのデータをICメモリに書き
込みさせて、このような状態で検査装置の機能が正常で
あるかどうかを定期的に検査する方法が採用されていた
In view of this, conventionally, part of the base ring data of the printed wiring board pattern, which was stored in the IC memory, is stored on a cassette tape, etc., in order to self-diagnose the function of the inspection equipment. A method has been adopted in which the data of the test device is written into the IC memory, and it is periodically checked whether the testing device is functioning normally in such a state.

しかしながら、このような操作をプリント配線板のパタ
ーンの種類が変更されるごとに、また検査の信頼性を高
める上でも使用頻度の多い検査装置の機能の保持管理の
必要性からも、検査装置の自己診断に相当の時間をかけ
ている現状にある。
However, these operations have to be carried out every time the type of pattern on a printed wiring board is changed, and also because of the need to maintain and manage the frequently used functions of the inspection equipment in order to improve the reliability of inspection. The current situation is that a considerable amount of time is spent on self-diagnosis.

これは検査装置の機能が正常であることを確認しておく
ことが信頼性のあるプリント配線板のパターンの検査忙
不可欠で重要なことに鑑みて止む得ないこととされてい
た。
This was considered to be unavoidable in view of the fact that it is essential and important to confirm that the inspection equipment functions normally when inspecting reliable printed wiring board patterns.

本発明は、このような従来のプリント配線板のt 検査
方法の欠点を除去し、検査装置の自己診断をK 簡易迅
速に行うべく、被検査体であるプリント配線板に代えて
表面に導通面を有するプリント配線用基板(以下ベタパ
ターン基板ともいう)を介在させ、当該検査装置のプロ
ーブビンの任意の! 一対のビンを接触させたとき短絡
させることにより当該検査装置の機能の自己診断を随時
併せて行うことを特徴とする信頼性の高いプリント配線
板のパターン検査方法とその装置を提供することを目的
とする。
The present invention eliminates the drawbacks of the conventional printed wiring board inspection method and provides a conductive surface on the surface of the printed wiring board instead of the printed wiring board to be inspected in order to perform self-diagnosis of the inspection device easily and quickly. A printed wiring board (hereinafter also referred to as a solid pattern board) with An object of the present invention is to provide a highly reliable printed wiring board pattern inspection method and its device, characterized in that a self-diagnosis of the function of the inspection device is performed at any time by short-circuiting a pair of bottles when they come into contact with each other. shall be.

以下、本発明のプリント配線板のパターンの検査方法と
その装置の実施例について14面に基づき具体的に説明
する。
Hereinafter, embodiments of the printed wiring board pattern inspection method and apparatus of the present invention will be specifically described based on 14 pages.

第1図は、プリント配線板のパターンの検査方法の概要
説明図であり、第2図はペタパターンノ^板を介在させ
た当該検査装置りの自己診断の概要説明図である。
FIG. 1 is a schematic explanatory diagram of a method for inspecting a pattern of a printed wiring board, and FIG. 2 is a schematic explanatory diagram of a self-diagnosis of the inspection apparatus using a peta-pattern board.

第1図において、1は被検査体であるプリント配線板の
基板、2は被検査体であるプリント配線板上のパターン
(導体回路)、3は被検査体であるプリント配線板上の
ランド(導体部分)、4は検査装置におけるプローブビ
ン、5はプローブビンの保持体、6#−を中継用ケーブ
ル、7は検査機本体、8け検査機本体の主要部分である
中央制御装置(ICメモリ)である。
In Fig. 1, 1 is the substrate of the printed wiring board which is the object to be inspected, 2 is the pattern (conductor circuit) on the printed wiring board which is the object to be inspected, and 3 is the land (on the printed wiring board which is the object to be inspected). 4 is the probe bin in the inspection device, 5 is the probe bin holder, 6 is the relay cable, 7 is the inspection machine body, and the central control unit (IC memory) which is the main part of the 8-piece inspection machine body. ).

第2図において、1から8までは上記第1図と同様であ
り、9は全面に導通面を有するプリント配線用基板(ベ
タパターン基板)、1oは導通面(例えば銅箔面)であ
る。
In FIG. 2, 1 to 8 are the same as in FIG. 1 above, 9 is a printed wiring board (solid pattern board) having a conductive surface on the entire surface, and 1o is a conductive surface (for example, a copper foil surface).

まず、上記第1図のプリント配線板のパターンの検査方
法について説明する。被検査体であるプリント配線板(
1)は、通常ガラス・エポキシ材料の基板又は紙・フェ
ノール又はエポキシ材料の基板であり、この基板上には
導体回路であるパターン(2)が形成されており、この
パターンの一部にはスルホール(2)があり、このスル
ポールの周辺には導体部分としてのランド(3)が形成
されている。そのため、検査装置(5)におけるプロー
ブビン(4)はその保持体(5)によりす椿玄れつり傭
ゆぼ油ぼゴ1ノフ騨降機などを介して持ち上げられ、プ
ローブビンの先端部分が被検査体のランド(3)と接触
して、プリント配線板のパターンにおける各ランド間の
導通状態を検査することができる。このとき、明らかに
短絡していない各一対のピンを予め指定しておくことに
よりプリント配線板の検査であることの表示を得るよう
にしておくことが重要である。
First, a method for inspecting the pattern of the printed wiring board shown in FIG. 1 will be explained. The printed wiring board that is the object to be inspected (
1) is usually a substrate made of glass/epoxy material or paper/phenol or epoxy material, and a pattern (2) which is a conductive circuit is formed on this substrate, and a part of this pattern has through holes. (2), and a land (3) as a conductive portion is formed around this pole. Therefore, the probe bin (4) in the inspection device (5) is lifted up by the holder (5) via a Tsubaki Genretsu Yubo Yubogo 1 Nof descending machine, etc., and the tip of the probe bin is lifted. By making contact with the lands (3) of the object to be inspected, it is possible to inspect the conduction state between the lands in the pattern of the printed wiring board. At this time, it is important to specify in advance each pair of pins that are not obviously short-circuited so that an indication that the printed wiring board is being inspected can be obtained.

次K、上記第2図のベタパターン基板を介在させた当該
検査装置の自己診断方法について説明する。表面に導通
面を有するベタパターン基板(9)は、通常プリント配
線板の基材となるガラス・エポキシ材料基板又は紙・フ
ェノール又はエポキシ材料基板であり、少くとも片面の
表面には銅箔などの導通面(10)が貼着形成されたも
のである。そして、望ましくは全面に導通面が貼着形成
されたものであることが、各一対のプローブビンと接触
し短絡させる上で有利である。しかしながら、プローブ
ビンと接触することのない部分、たとえば該基板の周辺
部分などは結縁不導体面であってもよい。
Next, a self-diagnosis method of the inspection apparatus using the solid pattern board shown in FIG. 2 will be explained. The solid pattern board (9) having a conductive surface on its surface is usually a glass/epoxy material board, or a paper/phenol or epoxy material board, which is the base material of a printed wiring board, and at least one surface is coated with copper foil or the like. The conductive surface (10) is adhesively formed. Preferably, a conductive surface is adhered to the entire surface, which is advantageous for contacting each pair of probe bottles and short-circuiting them. However, portions that do not come into contact with the probe bin, such as the peripheral portion of the substrate, may be bonded nonconductive surfaces.

矛しイ 前P笛1(支)π卦げふ追分に局番り柚査装置
(2)におけるプローブピン(4)はその保持体(5)
により支持された状態でプレスによシ移動して来たプロ
ーブビンの先端部分が表面に導通面(10)を有するベ
タパターン基板(9)と接触して、各一対のピン、たと
えばBlとB2又はC1とC2のような導通した各一対
のピンの他にも予め指定しておいた明らかに短絡してい
ない各一対ビンも上記導通面と接触させて短絡するため
、すべて短絡(ショート)表示がされる。そのため、予
め指定しておいたピンのショート又はオープン表示によ
りプリント配線板の検査であるか検査装置の自己診断で
あるかを区別することができる。
The probe pin (4) in the inspection device (2) is attached to its holder (5).
The tip of the probe bottle that has been moved by the press while being supported by contacts the solid pattern substrate (9) having a conductive surface (10) on the surface, and connects each pair of pins, for example, Bl and B2. Or, in addition to each pair of conductive pins such as C1 and C2, each pair of pins specified in advance that are not clearly shorted are also brought into contact with the conductive surface and shorted, so all short circuits are displayed. is done. Therefore, it is possible to distinguish between a printed wiring board inspection and a self-diagnosis of the inspection device by displaying short or open pins specified in advance.

このように、検査装置面の自己診断はベタパターンを介
在させることにより各一対ピンが短絡するので、このデ
ータをICメモリに記憶させておけば、たとえプリント
配線板の基準データが別途記憶されていても、−gの間
にプリント配線板のパターンの検査と検査装置の自己診
断とを随時併せて行うことができる。このとき、プリン
ト配線板のパターンの非導通部分である明らかに短絡し
ない部分の一対のピンを予め指定しておくことによシ、
この指定したピンが被検有体f装置く所定の位置に載置
したベタパターン基板と接触したときには短絡(ショー
ト)表示がされ、一方被検査体であるプリント配線板を
所定の位置に載置したときには非導通部分である明らか
に短絡しない部分とピンとが接触したときには予め指定
しておいた一対のピンの部分はオープン表示がされるこ
とになる。このように、ショート表示とオープン表示と
によってプリント配線板の検査とこの検査装置の自己診
断とを区別することになる。
In this way, self-diagnosis on the inspection device surface shorts each pair of pins by interposing a solid pattern, so if this data is stored in the IC memory, even if the standard data of the printed wiring board is stored separately. However, during -g, the inspection of the pattern of the printed wiring board and the self-diagnosis of the inspection device can be carried out at any time. At this time, by specifying in advance a pair of pins in a non-conducting part of the printed wiring board pattern that will not obviously be shorted, it is possible to
When this specified pin comes into contact with the solid pattern board placed at a predetermined position on the tangible device to be tested, a short circuit will be displayed, while the printed wiring board, which is the object to be tested, is placed in a predetermined position. In this case, when the pin comes into contact with a non-conducting part that is clearly not short-circuited, the pair of pins designated in advance will be displayed as open. In this way, the short-circuit display and the open display distinguish the inspection of the printed wiring board from the self-diagnosis of the inspection apparatus.

そのため、プリント配線板のパターンの基Qlt、デー
タとベタプリント基板とのデータ金比較検査することに
よシ随時相互にプリント配線板のパターン検査と当該検
査装置の自己診11′Jrとを瞬時に4)(゛ぜて行う
ことができるので、従来手回と長時間とを要していた検
査装置の自己診断がきわめて短時間にしかも信頼性のあ
るプリント配線板のパターン検査をすることができる。
Therefore, by comparing the base Qlt and data of the pattern of the printed wiring board with the data of the solid printed circuit board, the pattern inspection of the printed wiring board and the self-diagnosis 11'Jr of the inspection equipment can be carried out instantaneously at any time. 4) (Since it can be performed all at once, the self-diagnosis of the inspection equipment, which conventionally required manual labor and a long time, can be done in an extremely short time, and reliable pattern inspection of printed wiring boards can be performed. .

以上)ように、本発明によればプリント配線板のパター
ンの検査を行いつつ、当該検査袋の機能が正常であるか
どうかを確認するための自己診断も随時併行して簡易迅
速に行うことができるので、検査に要する作業時間を大
幅に短縮し作業能率を向上させると共に、検査の信頼性
を著しく高めることができる。
As described above, according to the present invention, while inspecting the pattern of a printed wiring board, it is possible to simultaneously conduct a self-diagnosis at any time to confirm whether the function of the inspection bag is normal or not, in a simple and quick manner. Therefore, the work time required for inspection can be significantly shortened, work efficiency can be improved, and the reliability of inspection can be significantly increased.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はプリント配線板のパターンの検査方法の概要を
示す説明図、第2図は当該検査装置の自己診断方法の概
要を示す説明図である。 l・・・・・・・・・プリント配線板の基板、2・・・
・・・・・・導体パターン、3・・・・・・・・・ラン
ド、4・・・・・・・・・プローブピン、5・・・・・
・・・・プローブピン保持体、6・間曲中継ケーブル、
7・・・・・・・・・検査機本体、8・・・・曲・中央
制御装置、9・・・・・−・・ベタパターン基板、lO
・・・・・・・・・導通面(たとえば銅箔面) 持許出゛願大の名称 イビデン株式会社 代表者多賀潤一部 (
FIG. 1 is an explanatory diagram showing an outline of a method for inspecting a pattern of a printed wiring board, and FIG. 2 is an explanatory diagram showing an outline of a self-diagnosis method of the inspection apparatus. l......Printed wiring board substrate, 2...
...Conductor pattern, 3...Land, 4...Probe pin, 5...
...probe pin holder, 6. bending relay cable,
7...Inspection machine main body, 8...Music/central control unit, 9...---solid pattern board, lO
・・・・・・・・・Conductive surface (e.g. copper foil surface)

Claims (1)

【特許請求の範囲】 1、被検査体であるプリント配線板の検査に代えて表面
に導通面を有するプリント配線用基板を介在させ、当該
検査装置のプローブピンの予め指定した任意の各一対の
ピンをも接触させ短絡させることによ2り当該検査装置
の機能の自己診断をも併せて行うことを特徴とするプリ
ント配線板のパターン検査方法。 2、被検査体であるプリント配線板の検査に代えて表面
に導通面を有するプリント配線用基板を介在させて当該
検査装置のプローブビンの予め指定した任意の各一対の
ピンの短絡の有無を検知する自己診断用ルーチンワーク
を有して成るプリント配線板のパターン検査装置。
[Claims] 1. Instead of testing a printed wiring board as an object to be inspected, a printed wiring board having a conductive surface on the surface is interposed, and each prespecified pair of probe pins of the testing device is inspected. 2. A pattern inspection method for a printed wiring board, characterized in that a self-diagnosis of the function of the inspection device is also performed by bringing pins into contact and causing a short circuit. 2.Instead of inspecting the printed wiring board, which is the object to be inspected, a printed wiring board with a conductive surface on the surface is used to check for short circuits in each pre-designated pair of pins of the probe bin of the inspection equipment. A printed wiring board pattern inspection device comprising a routine work for self-diagnosis.
JP58141326A 1983-08-01 1983-08-01 Method and device for inspecting pattern of printed wiring board Granted JPS6033064A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58141326A JPS6033064A (en) 1983-08-01 1983-08-01 Method and device for inspecting pattern of printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58141326A JPS6033064A (en) 1983-08-01 1983-08-01 Method and device for inspecting pattern of printed wiring board

Publications (2)

Publication Number Publication Date
JPS6033064A true JPS6033064A (en) 1985-02-20
JPH0354312B2 JPH0354312B2 (en) 1991-08-19

Family

ID=15289327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58141326A Granted JPS6033064A (en) 1983-08-01 1983-08-01 Method and device for inspecting pattern of printed wiring board

Country Status (1)

Country Link
JP (1) JPS6033064A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6279997A (en) * 1985-10-04 1987-04-13 沖電気工業株式会社 Function self-diagnostic method of sensor
KR100544343B1 (en) * 2003-07-16 2006-01-23 주식회사 영테크 Apparatus for Inspecting Printed Circuit Board
JP2021163593A (en) * 2020-03-31 2021-10-11 矢崎総業株式会社 Inspection device for terminal processing unit of shielded electric wire and functional diagnosis method for inspection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6279997A (en) * 1985-10-04 1987-04-13 沖電気工業株式会社 Function self-diagnostic method of sensor
KR100544343B1 (en) * 2003-07-16 2006-01-23 주식회사 영테크 Apparatus for Inspecting Printed Circuit Board
JP2021163593A (en) * 2020-03-31 2021-10-11 矢崎総業株式会社 Inspection device for terminal processing unit of shielded electric wire and functional diagnosis method for inspection device

Also Published As

Publication number Publication date
JPH0354312B2 (en) 1991-08-19

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