JPH06174774A - Electric inspection method for tab film carrier tape - Google Patents

Abstract

PURPOSE:To provide an electric inspection method for PAB film carrier tape which can electrically inspect open circuit or short circuit of a pattern between outer lead and inner lead, in particular. CONSTITUTION:A detecting end 6 provided at the tip of jig part 5 of an open inspection unit 4 abuts on the circuit surface in a device hole of a TAB film carrier tape 1 having inner lead while a protruding part of an inspection stage 7 abuts on the rear surface of inner lead 11 thus holding the inner lead and conducting patterns using a probe provided independently from the detecting end 6. This constitution allows electrical detection of open circuit or short circuit of a pattern between an outer lead 10 and an inner lead 11.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for electrically inspecting a TAB film carrier tape, and more particularly, it can electrically inspect for disconnection or short circuit of a pattern between outer leads and inner leads at the same time, and electrically inspects a plurality of pieces. The present invention relates to an electrical inspection method for a TAB film carrier tape, which can simultaneously inspect and, if defective, automatically perform defective marking.

[0002]

2. Description of the Related Art Conventionally, TAB (Tape Automa) is used.
(Ted Bonding)) In order to electrically inspect for a wire break or short circuit of a pattern on the film carrier tape, the following method is adopted.

That is, the probe pin is brought into contact with the outer lead of the TAB film carrier tape, and the insulation resistance between the patterns, a short circuit or the disconnection of the short pattern is electrically inspected, and the defective product is marked. . However, the disconnection and short-circuit inspection of the pattern from the outer lead to the inner lead relies on human visual inspection (transmitted light inspection), and an electrical inspection method has not been found. The reason for this is that the inner lead is weak in strength, and therefore when the probe pin is brought into contact with the inner lead, the inner lead is deformed such as bent or drooped. As a result of relying on human visual inspection in this way, the reliability as an electrical component is lacking. Further, this visual inspection requires a large labor force and is not preferable from the viewpoint of labor saving.

Further, as TAB film carrier tapes have become slimmer, the pitch of conductor patterns has also rapidly become fan pitch. Therefore, in the conventional inspection method, the number of patterns that can be inspected within a unit time is limited, and the inspection efficiency is currently reduced.

Further, regarding the simultaneous inspection of a plurality of pieces of a TAB film carrier tape, a method of selecting defective products of a plurality of pieces that have been simultaneously inspected and a method of performing defective marking have not been established, and from inspection to defective marking. It wasn't an automatic device.

[0006]

The object of the present invention is to solve these problems of the prior art, to improve the reliability as an electrical component, to be excellent in productivity, and to contribute to labor saving. It is an object of the present invention to provide an electrical inspection method for a TAB film carrier tape, which can automatically perform defective marking, and in particular can electrically inspect for pattern disconnection and short circuit between the outer lead and the inner lead.

[0007]

The above object of the present invention can be achieved by the inspection method described below. That is, according to the present invention, the detection end provided at the tip of the jig portion of the open inspection unit is brought into contact with the circuit surface of the device hole having the inner lead of the TAB film carrier tape, and the projection of the inspection stage having the projection is provided. A method for electrically inspecting a TAB film carrier tape, characterized in that the inner lead is held by abutting a portion on the lower surface of the inner lead, and electrical continuity is provided between the patterns by the probe provided separately from the detection end. is there.

The electrical inspection method of the present invention will be specifically described below with reference to the drawings. FIG. 1 is a schematic cross-sectional view for explaining the electrical inspection method of the present invention, and FIG. 2 is a plan view of a TAB film carrier tape. 1-2, 1 is a TAB film carrier tape, 2 is a conductive pattern, 3 is a film, 4 is an open inspection unit, 5
Is a jig portion, 6 is a detection end (jig head portion), 7 is an inspection stage, 8 is a probe card, 9 is a probe pin, 10 is an outer lead, 11 is an inner lead, 12 is a device hole, and 13 is a test pad. Are shown respectively.

In the present invention, the TAB film carrier tape 1 including the conductive pattern 2 and the film 3 is conveyed to a predetermined measuring position using a turntable or the like. next,
The jig portion 5 of the open inspection unit 4 is moved right above the TAB film carrier tape 1 and then lowered, so that the detection end 6 at the tip of the jig portion 5 contacts the inner lead 11 located in the device hole 12. Make contact. The detection end 6 is made of a conductive material such as conductive rubber.

The open inspection unit 4 includes a jig section 5, a detection end 6, an arm, an upper and lower air cylinder section, and an XY section.
A stage section, a Z-axis adjusting section, an open unit opening / closing mechanism section, etc. are provided (not shown). Among them, the upper and lower air cylinder parts are parts for vertically moving the jig part 5 at the time of inspection, and the XY stage part has an X-axis adjusting micrometer and a Y-axis adjusting micrometer. It is a part that is moved in the X and Y directions and adjusted to fit the inner lead 11 part. Further, the Z-axis adjusting section is a section for adjusting the adhesive pressure between the detection end (jig head section) 6 and the inner lead 11 at the time of inspection.

[0011]

Next, the inspection stage 7 is raised, the convex portion of the inspection stage 7 is brought into contact with the lower surface of the inner lead, the inner lead 11 is held, and the inner lead is prevented from being bent or sagging.

Next, the probe pin 9 held by the probe card 8 is brought into contact with the test pad 13, and the detection end 6
And probe pin 9 are used to conduct electrical continuity between the same patterns, and a disconnection inspection is performed.

After performing the disconnection inspection, the open inspection unit 4 is raised to interrupt the circuit once, and then the open inspection unit is lowered again to conduct electricity between adjacent patterns to perform the short circuit inspection.

The disconnection inspection and the short circuit inspection are performed by the TAB.
It can be performed in about 2 seconds per one film carrier tape.

After the disconnection inspection and the short-circuit inspection are completed in this way, the open inspection unit 4 is raised and at the same time the inspection stage 7 is lowered, and the TAB film carrier tape 1 is conveyed.

By repeating such an operation in sequence, the electrical inspection of the TAB film carrier tape can be automatically and labor-saving and carried out in large quantities.

[0018]

EXAMPLES Next, the present invention will be specifically described based on examples.

Example 1 Inner lead pitch 82 in the pattern for liquid crystal driver
A TAB film carrier tape having an outer lead output pitch of 170 μm and a lead number of 320 pins was manufactured.

An electrolytic copper foil having a thickness of 35 μm is used as a metal foil, and ordinary processing is performed from lamination to plating. The inner lead width is 35 μm, the thickness is 25 μm, and the pitch is 8.
2 μm, outer lead output line width 85 μm, pitch 17
A test sample of 0 μm was prepared. Among 1000 pieces of this sample, 20 pieces of partial disconnection of pattern, 20 pieces of short circuit between patterns, and 96 pieces of normal pattern
Created as 0 piece.

As a result of carrying out the electrical inspection method of the present invention using this sample, there was no error in the determination.

Example 2 In the same manner as in Example 1, inner lead width 35 μm, thickness 27 μm, pitch 80 μm, outer lead output line width 1
A test simulation sample having a pitch of 200 μm, a pitch of 200 μm, and a lead number of 290 pins was prepared.

As a result of carrying out the electrical inspection method of the present invention using this sample in the same manner as in Example 1, there was no error in the determination.

Example 3 By the same method as in Example 1, a test sample having an inner lead width of 45 μm, a thickness of 25 μm, a pitch of 101 μm, an outer lead output line width of 105 μm, a pitch of 210 μm and a lead count of 512 pins was prepared.

As a result of carrying out the electrical inspection method of the present invention using this sample in the same manner as in Example 1, there was no error in the determination.

Example 4 In the same manner as in Example 1, a test sample having an inner lead width of 80 μm, a thickness of 23 μm, a pitch of 140 μm, an outer lead output line width of 110 μm, a pitch of 220 μm and a lead number of 492 pins was prepared.

As a result of carrying out the electrical inspection method of the present invention using this sample in the same manner as in Example 1, there was no error in the determination.

[0028]

The present invention as described above has the following effects. It is possible to electrically and simultaneously inspect for a pattern disconnection and a short circuit between the outer lead and the inner lead of the TAB film carrier tape.

By using a plurality of inspection devices, a plurality of pieces of the TAB film carrier tape can be electrically inspected at the same time.

Defective products found by the above inspection can be automatically selected / marked.

Since the above-mentioned inspection can be performed automatically, not only the labor saving can be achieved, but also a large amount of processing can be performed and the economy is excellent.

[Brief description of drawings]

FIG. 1 is a schematic sectional view for explaining an electrical inspection method of the present invention.

FIG. 2 is a plan view of a TAB film carrier tape.

[Explanation of symbols]

1: TAB film carrier tape, 2: conductive pattern, 3: film, 4: open inspection unit, 5: jig part, 6: detection end (jig head part), 7: inspection stage, 8: probe card, 9: probe pin, 10: outer lead, 11: inner lead, 12: device hole, 13: test pad.

Claims (2)

[Claims] 1. A convex portion of an inspection stage having a convex portion while a detection end provided at a tip of a jig portion of an open inspection unit is brought into contact with a circuit surface of a device hole having an inner lead of a TAB film carrier tape. The inner lead is held by bringing the inner lead into contact with the lower surface of the inner lead, and electrical continuity is provided between the patterns by the probe provided separately from the detection end.
Electrical inspection method for film carrier tape. 2. The detection end is a conductive rubber.
5. An electrical inspection method for a TAB film carrier tape according to.