JPS62233777A - Many wiring inspecting method - Google Patents
Many wiring inspecting methodInfo
- Publication number
- JPS62233777A JPS62233777A JP61076693A JP7669386A JPS62233777A JP S62233777 A JPS62233777 A JP S62233777A JP 61076693 A JP61076693 A JP 61076693A JP 7669386 A JP7669386 A JP 7669386A JP S62233777 A JPS62233777 A JP S62233777A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- electrode
- electrodes
- plating
- breaking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 11
- 238000007747 plating Methods 0.000 claims abstract description 26
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 238000007689 inspection Methods 0.000 claims abstract description 12
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 4
- 230000005611 electricity Effects 0.000 claims abstract 2
- 238000005530 etching Methods 0.000 abstract description 3
- 230000007547 defect Effects 0.000 abstract 1
- 238000007598 dipping method Methods 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 239000002184 metal Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 2
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000007772 electrode material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229960003280 cupric chloride Drugs 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、ストライプ状に形成された多数の電極を有す
る基板の断線検査法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for inspecting disconnections of a substrate having a large number of electrodes formed in a stripe shape.
[開示の概要]
本明細書及び図面は、ストライプ状に形成された多数の
電極を有する基板において、この基板をメッキ液中に浸
漬して通電し、析出するメッキ層の形成状態から断線ま
たは短絡の有無を判定することにより、電極構成に制約
を受けず、且つ検査時間を短縮できるようにしたもので
ある。[Summary of the Disclosure] This specification and drawings describe a substrate having a large number of electrodes formed in a stripe shape, which is immersed in a plating solution and energized, and the formed state of the deposited plating layer causes disconnection or short circuit. By determining the presence or absence of , the test time can be shortened without being restricted by the electrode configuration.
[従来の技術]
従来、この種の断線検査法としては、ブロービングマシ
ーンを用いる方法がある。この方法は。[Prior Art] Conventionally, as this type of wire breakage inspection method, there is a method using a blobbing machine. This method is.
ストライプ状電極の一端を全て共通に接続し、他端をプ
ロ・バーにより順次接続しながら、各電極の電気的な導
通を確認する方法である。In this method, one end of the striped electrodes is all connected in common, and the other ends are sequentially connected using a pro bar to check the electrical continuity of each electrode.
[発明が解決しようとする問題点]
A4サイズ(210mmX 30Gmm)の有効部を持
つガラス基板の短辺に対して、16本/I1m(ライン
50Bm、スペース12.5gm )のストライプ電極
を形成すると、電極本数は3360本となる。一方、現
在の汎用ブロービングマシーンのスキャンスピードは1
本/sec程度であり、前述した基板の検査には約1時
間を要し、検査終了後には基板上の断線位置を測定テス
ター等で確認しなければならなかった。また、ブロービ
ングマシーンの可動性能、ステージ寸法等により、被測
定基板の構成が制約を受けるという欠点があった。[Problems to be Solved by the Invention] When 16/I1m (line 50Bm, space 12.5gm) stripe electrodes are formed on the short side of a glass substrate having an effective part of A4 size (210mm x 30Gmm), The number of electrodes is 3360. On the other hand, the scan speed of current general-purpose blobbing machines is 1
It took approximately one hour to inspect the board as described above, and after the inspection was completed, the position of the disconnection on the board had to be confirmed using a measurement tester or the like. Another drawback is that the configuration of the substrate to be measured is restricted by the movability of the blowing machine, the dimensions of the stage, and the like.
本発明は、上記従来例の欠点を除去し、測定基板の電極
構成に制約を受けず、且つ、検査時間を短縮した多数配
線検査法を提供することを目的とするものである。SUMMARY OF THE INVENTION An object of the present invention is to provide a multi-wiring inspection method that eliminates the drawbacks of the conventional example, is not limited by the electrode configuration of the measurement board, and shortens inspection time.
[問題点を解決するための手段]
本発明は、多数のストライプ状電極を設けた基板と、こ
の基板と対向する電極基板をメッキ液中に浸し1両電極
間を通電することによりストライプ電極上にメッキ層を
析出させ、このメッキ層の形成状態からストライプ電極
の断線または短絡の有無を判断するものである。[Means for Solving the Problems] The present invention provides a substrate on which a large number of striped electrodes are provided, and an electrode substrate facing this substrate, which is immersed in a plating solution and a current is passed between the two electrodes. A plating layer is deposited on the stripe electrode, and the presence or absence of a disconnection or short circuit in the stripe electrode is determined from the state of formation of this plating layer.
[作 用]
ストライプ電極に異常がない場合、メッキ層は電極表面
に一様に形成される。一方、電極が何らかの原因により
断線している場合は、その部分だけメッキ層が形成され
ないため、すべての電極における断線の有無を一度に判
定することができる。しかも、この検査と同時に断線箇
所が直接メッキ層の有無によって目印されるため、断線
した位置を容易に確認することができる。[Function] If there is no abnormality in the striped electrode, the plating layer is uniformly formed on the electrode surface. On the other hand, if an electrode is disconnected for some reason, the plating layer is not formed in that portion, so it is possible to determine at once whether or not all electrodes are disconnected. Moreover, since the wire breakage point is directly marked by the presence or absence of the plating layer at the same time as this inspection, the location of the wire breakage can be easily confirmed.
[実施例]
第1図は本発明の検査法に使用する装置の一例を示す概
略構成図である。第1図において、lはストライプ電極
の形成された基板であり、前述したA4サイズの有効面
積を持つ基板上に、■↑0(Indium−Tin−O
xide)より成る透明電極が、基板の短辺に対して1
6木/1III(ライン50弘腸、スペース12.5I
L層)のストライプ状に形成されている。2はメッキ時
に陽極となる金属板、3は基板lと金属板2の間に電流
を流すための直流電源であり、基板1が陰極、金属板2
が陽極となるように接続されている。この極性は、互い
に反対であってもよい、4はメッキ液5を満たしたメッ
キ槽である。一般的な銅メッキの場合における硫酸銅浴
の条件を以下に示す。[Example] FIG. 1 is a schematic configuration diagram showing an example of an apparatus used in the inspection method of the present invention. In Fig. 1, l is a substrate on which stripe electrodes are formed, and ■↑0 (Indium-Tin-O
A transparent electrode consisting of
6th tree/1III (line 50 Hiromu, space 12.5I
L layer) is formed in a stripe shape. 2 is a metal plate that becomes an anode during plating, 3 is a DC power supply for passing a current between the substrate 1 and the metal plate 2, the substrate 1 is a cathode, and the metal plate 2
is connected so that it becomes the anode. The polarities may be opposite to each other. 4 is a plating tank filled with a plating solution 5. The conditions of the copper sulfate bath in the case of general copper plating are shown below.
組 成:硫酸銅 200〜250 Cg/R)硫酸4
0〜80 (g#)
温 度:20〜50℃
電流密度=2〜8(A/■2)
上記構成において、まず、基板1の電極の一端に導電性
テープ6を貼り付け、すべての電極を共通に接続する0
次に、導電性テープ6を貼り付けた部分を残して基板l
を金属板2と共にメッキ液5に漬け、上記の条件により
直流電圧を印加する。この時、基板lのストライプ電極
に異常がない場合、メッキ液に漬けた部分の電極には正
常な電位が発生し、金属板2との間に電流が流れ、電極
表面には一様に銅がメッキされる。これに対し、ストラ
イプ電極の一部にエツチング不良、キズなどの原因によ
り断線がある場合、その部分はメッキされない、したが
って、断線の有無はこのメッキの形成状態により判定す
ることができる。Composition: Copper sulfate 200-250 Cg/R) Sulfuric acid 4
0 to 80 (g#) Temperature: 20 to 50°C Current density = 2 to 8 (A/■2) In the above configuration, first, conductive tape 6 is attached to one end of the electrode of substrate 1, and all electrodes are 0 to connect in common
Next, leave the part where the conductive tape 6 has been pasted, and then
is immersed together with the metal plate 2 in the plating solution 5, and a DC voltage is applied under the above conditions. At this time, if there is no abnormality in the striped electrodes on the substrate 1, a normal potential will be generated in the part of the electrode immersed in the plating solution, a current will flow between it and the metal plate 2, and the electrode surface will be coated with copper uniformly. is plated. On the other hand, if a part of the stripe electrode is broken due to poor etching, scratches, etc., that part is not plated, and therefore whether or not there is a break can be determined by the state of the plating.
また、断線箇所もこのメッキの有無によって目印される
ため、特別な装置を用いることなく容易にその位置を確
認することができる。Furthermore, since the disconnection point is marked by the presence or absence of this plating, its position can be easily confirmed without using any special equipment.
なお、基板上に形成された銅メッキは、塩化第二銅など
の銅のエツチング液により、筒単に剥離することができ
る。Note that the copper plating formed on the substrate can be simply peeled off using a copper etching solution such as cupric chloride.
本発明による検査法は、このようなストライプ電極の断
線検査以外にも、例えば第2図に示すような千鳥状電極
の取り出し部における隣接する電極との短絡検査や、第
3図に−示すような、わずかな間隔をもって組合わされ
た上下電極間の短絡検査にも使用することができる。The inspection method according to the present invention can be used not only to inspect striped electrodes for disconnection, but also to inspect for short circuits with adjacent electrodes at the lead-out portions of staggered electrodes as shown in FIG. Furthermore, it can also be used to test for short circuits between upper and lower electrodes that are combined with a small interval.
また、本発明による検査法は、電極材に合わせてメッキ
液の成分を変えることにより、電極材の種類に制限され
ることなく使用することができる。さらには、ストライ
プ電極の一端に発生する電位によって任意の電流電界を
発生させ、これらの作用により形状変化する物質1例え
ば液晶、感熱材などを用いても、前記実施例と同様の効
果を得ることができる。Further, the testing method according to the present invention can be used without being limited to the type of electrode material by changing the components of the plating solution depending on the electrode material. Furthermore, the same effect as in the above embodiment can be obtained by generating an arbitrary current electric field by the potential generated at one end of the stripe electrode, and using a material 1 such as liquid crystal, heat-sensitive material, etc. whose shape changes due to the action of the electric field. I can do it.
[発明の効果]
以上説明したように5本発明によれば、ストライプ電極
の断線の有無及びその位置の確認を同時に行うことがで
き、検査工程及び検査時間を大幅に短縮することができ
る。また、従来の方法に比べ、被測定基板の構成(サイ
ズ、電極本数、電極ピッチ等)に制約されずに、同時に
多数の電極を検査することができる。さらには、高精度
の装置を必要としないため、簡単で安価な設備で検査を
行うことが可能となる。[Effects of the Invention] As explained above, according to the present invention, it is possible to simultaneously confirm the presence or absence of disconnection of the stripe electrode and its position, and it is possible to significantly shorten the inspection process and inspection time. Furthermore, compared to conventional methods, a large number of electrodes can be tested simultaneously without being restricted by the configuration of the substrate to be measured (size, number of electrodes, electrode pitch, etc.). Furthermore, since a highly accurate device is not required, the inspection can be performed using simple and inexpensive equipment.
第1図は装置の一例を示す概略構成図、第2図及び第3
図は電極の構成例を示す図である。
l・・・基板、2・・・金属板、3・・・直流電源、4
・・・メッキ槽、5・・・メッキ液、6・・・導電性テ
ープ。Figure 1 is a schematic configuration diagram showing an example of the device, Figures 2 and 3 are
The figure is a diagram showing an example of the configuration of electrodes. l... Board, 2... Metal plate, 3... DC power supply, 4
... Plating tank, 5... Plating solution, 6... Conductive tape.
Claims (1)
電極基板をメッキ液中に浸漬した後、両電極間を通電し
、析出するメッキ層の形成状態により前記ストライプ状
電極の断線または短絡の有無を判定することを特徴とす
る多数配線検査法。1) After immersing a substrate with a large number of striped electrodes and an opposing electrode substrate in a plating solution, electricity is passed between the two electrodes to determine whether the striped electrodes are disconnected or shorted depending on the formation state of the deposited plating layer. A multiple wiring inspection method characterized by determining the presence or absence of wiring.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61076693A JPH0636006B2 (en) | 1986-04-04 | 1986-04-04 | Multiple wiring inspection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61076693A JPH0636006B2 (en) | 1986-04-04 | 1986-04-04 | Multiple wiring inspection method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62233777A true JPS62233777A (en) | 1987-10-14 |
JPH0636006B2 JPH0636006B2 (en) | 1994-05-11 |
Family
ID=13612556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61076693A Expired - Lifetime JPH0636006B2 (en) | 1986-04-04 | 1986-04-04 | Multiple wiring inspection method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0636006B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022946A (en) * | 1988-06-17 | 1990-01-08 | Kyoei Seigyo Kiki Kk | Conduction detecting method for electronic circuit wire |
-
1986
- 1986-04-04 JP JP61076693A patent/JPH0636006B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022946A (en) * | 1988-06-17 | 1990-01-08 | Kyoei Seigyo Kiki Kk | Conduction detecting method for electronic circuit wire |
Also Published As
Publication number | Publication date |
---|---|
JPH0636006B2 (en) | 1994-05-11 |
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