JPH0636006B2 - Multiple wiring inspection method - Google Patents

Multiple wiring inspection method

Info

Publication number
JPH0636006B2
JPH0636006B2 JP61076693A JP7669386A JPH0636006B2 JP H0636006 B2 JPH0636006 B2 JP H0636006B2 JP 61076693 A JP61076693 A JP 61076693A JP 7669386 A JP7669386 A JP 7669386A JP H0636006 B2 JPH0636006 B2 JP H0636006B2
Authority
JP
Japan
Prior art keywords
substrate
electrodes
electrode
disconnection
inspection method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61076693A
Other languages
Japanese (ja)
Other versions
JPS62233777A (en
Inventor
正彦 江成
哲也 清水
浩文 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP61076693A priority Critical patent/JPH0636006B2/en
Publication of JPS62233777A publication Critical patent/JPS62233777A/en
Publication of JPH0636006B2 publication Critical patent/JPH0636006B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、ストライプ状に形成された多数の電極を有す
る基板の断線検査法に関するものである。
TECHNICAL FIELD The present invention relates to a disconnection inspection method for a substrate having a large number of electrodes formed in stripes.

[開示の概要] 本明細書及び図面は、ストライプ状に形成された多数の
電極を有する基板において、この基板をメッキ液中に浸
漬して通電し、析出するメッキ層の形成状態から断線ま
たは短絡の有無を判定することにより、電極構成に制約
を受けず、且つ検査時間を短縮できるようにしたもので
ある。
[Summary of Disclosure] This specification and the drawings show a substrate having a large number of electrodes formed in stripes, which is immersed in a plating solution and energized to cause a disconnection or a short circuit depending on the state of the plated layer deposited. By determining the presence or absence of the above, it is possible to shorten the inspection time without being restricted by the electrode configuration.

[従来の技術] 従来、この種の断線検査法としては、プロービングマシ
ーンを用いる方法がある。この方法は、ストライプ状電
極の一端を全て共通に接続し、他端をプロ・バーにより
順次接続しながら、各電極の電気的な導通を確認する方
法である。
[Prior Art] Conventionally, as a disconnection inspection method of this type, there is a method using a probing machine. In this method, one end of each of the striped electrodes is commonly connected, and the other end is sequentially connected by a probe bar to check the electrical continuity of each electrode.

[発明が解決しようとする問題点] A4サイズ(210mm×300mm}の有効部を持つガラス基板の
短辺に対して、16/mm(ライン50μm、スペース12.5μ
m)のストライプ電極を形成すると、電極本数は336
0本となる。一方、現在の汎用プロービングマシーンの
スキャンスピードは1本/sec程度であり、前述した基
板の検査には約1時間を要し、検査終了後には基板上の
断線位置を測定テスター等で確認しなければならなかっ
た。また、プロービングマシーンの可動性能、ステージ
寸法等により、被測定基板の構成が制約を受けるという
欠点があった。
[Problems to be solved by the invention] 16 / mm (line 50μm, space 12.5μ for the short side of a glass substrate with an effective part of A4 size (210mm x 300mm)
When the stripe electrode of m) is formed, the number of electrodes is 336.
It becomes 0. On the other hand, the scanning speed of a general-purpose probing machine at present is about 1 line / sec, and it takes about 1 hour to inspect the above-mentioned board. After the inspection, the disconnection position on the board must be confirmed with a measurement tester. I had to do it. Further, there is a drawback that the structure of the substrate to be measured is restricted by the moving performance of the probing machine, the stage size, and the like.

本発明、上記従来例の欠点を除去し、測定基板の電極構
成に制約を受けず、且つ、検査時間を短縮した多数配線
検査法を提供することを目的とするものである。
SUMMARY OF THE INVENTION It is an object of the present invention to eliminate the drawbacks of the above-mentioned conventional example, to provide a multi-wiring inspection method that is not restricted by the electrode configuration of the measurement substrate and has a reduced inspection time.

[問題点を解決するための手段] 本発明は、多数のストライプ状電極を設けた基板と、こ
の基板と対向する電極基板をメッキ液中に浸し、両電極
間を通電することによりストライプ電極上にメッキ層を
析出させ、このメッキ層の形成状態からストライプ電極
の断線または短絡の有無を判断するものである。
[Means for Solving the Problems] In the present invention, a substrate provided with a large number of stripe-shaped electrodes and an electrode substrate facing the substrate are immersed in a plating solution, and a current is applied between the electrodes to form a stripe electrode. A plating layer is deposited on the substrate, and the presence or absence of disconnection or short circuit of the stripe electrode is determined from the state of formation of this plating layer.

[作用] ストライプ電極に異常がない場合、メッキ層は電極表面
に一様に形成される。一方、電極が何らかの原因により
断線している場合は、その部分だけメッキ層が形成され
ないため、すべての電極における断線の有無を一度に判
定することができる。しかも、この検査と同時に断線箇
所が直接メッキ層の有無によって目印されるため、断線
した位置を容易に確認することができる。
[Operation] When there is no abnormality in the stripe electrode, the plating layer is uniformly formed on the electrode surface. On the other hand, when the electrodes are disconnected for some reason, the plating layer is not formed only in that portion, and therefore the presence or absence of disconnection in all the electrodes can be determined at once. Moreover, since the disconnection location is directly marked by the presence or absence of the plating layer simultaneously with this inspection, the disconnection location can be easily confirmed.

[実施例] 第1図は本発明の検査法に使用する装置の一例を示す概
略構成図である。第1図において、1はストライプ電極
の形成された基板であり、前述したA4サイズの有効面積
を持つ基板上に、 ITO(Indium-Tin-Oxide)より成る透明
電極が、基板の短辺に対して16本/mm(ライン50μm、
スペース12.5μm)のストライプ状に形成されている。
2はメッキ時に陽極となる金属板、3は基板1と金属板
2の間に電流を流すための直流電源であり、基板1が陰
極、金属板2が陽極となるように接続されている。この
極性は、互いに反対であってもよい。4はメッキ液5を
満たしたメッキ槽である。一般的な銅メッキの場合にお
ける硫酸銅浴の条件を以下に示す。
[Examples] FIG. 1 is a schematic configuration diagram showing an example of an apparatus used for the inspection method of the present invention. In FIG. 1, reference numeral 1 denotes a substrate on which a stripe electrode is formed, and a transparent electrode made of ITO (Indium-Tin-Oxide) is provided on the substrate having an effective area of A4 size described above with respect to the short side of the substrate. 16 lines / mm (line 50 μm,
It is formed in stripes with a space of 12.5 μm.
Reference numeral 2 is a metal plate that serves as an anode during plating, and 3 is a direct current power source for flowing an electric current between the substrate 1 and the metal plate 2, which are connected so that the substrate 1 serves as a cathode and the metal plate 2 serves as an anode. The polarities may be opposite to each other. A plating tank 4 is filled with a plating solution 5. The conditions of the copper sulfate bath in the case of general copper plating are shown below.

組 成:硫酸銅 200 〜250 (g/) 硫 酸 40 〜 60 (g/) 温 度:20〜50℃ 電流密度:2〜8(A/m2) 上記構成において、まず、基板1の電極の一端に導電性
テープ6を貼り付け、すべての電極を共通に接続する。
次に、導電性テープ6を貼り付けた部分を残して基板1
を金属板2と共にメッキ液5に漬け、上記の条件により
直流電圧を印加する。この時、基板1のストライプ電極
に異常がない場合、メッキ液に漬けた部分の電極には正
常な電位が発生し、金属板2との間に電流が流れ、電極
表面には一様に銅がメッキされる。これに対し、ストラ
イプ電極の一部にエッチング不良、キズなどの原因によ
り断線がある場合、その部分はメッキされない。したが
って、断線の有無はこのメッキの形成状態により判定す
ることができる。また、断線箇所もこのメッキの有無に
よって目印されるため、特別な装置を用いることなく容
易にその位置を確認することができる。
Composition: Copper sulfate 200 to 250 (g /) Sulfuric acid 40 to 60 (g /) Temperature: 20 to 50 ° C Current density: 2 to 8 (A / m 2 ) In the above configuration, first, the electrode of the substrate 1 A conductive tape 6 is attached to one end of each of the electrodes to connect all the electrodes in common.
Next, the substrate 1 is left with the portion to which the conductive tape 6 is attached remaining.
Is immersed in the plating solution 5 together with the metal plate 2, and a DC voltage is applied under the above conditions. At this time, if there is no abnormality in the stripe electrode of the substrate 1, a normal potential is generated in the electrode immersed in the plating solution, a current flows between the electrode and the metal plate 2, and the copper surface is evenly coated with copper. Is plated. On the other hand, if a part of the stripe electrode has a disconnection due to defective etching, scratches, etc., that part is not plated. Therefore, the presence or absence of disconnection can be determined by the plating formation state. In addition, since the broken portion is also marked by the presence or absence of this plating, the position can be easily confirmed without using a special device.

なお、基板上に形成された銅メッキは、塩化第二銅など
の銅のエッチング液により、簡単に剥離することができ
る。
The copper plating formed on the substrate can be easily peeled off with an etching solution of copper such as cupric chloride.

本発明による検査法は、このようなストライプ電極の断
線検査以外にも、例えば第2図に示すような千鳥状電極
の取り出し部における隣接する電極との短絡検査や、第
3図に示すような、わずかな間隔をもって組合わされた
上下電極間の短絡検査にも使用することができる。
The inspection method according to the present invention is not limited to such a disconnection inspection of the striped electrodes, and is, for example, a short-circuit inspection with adjacent electrodes in the lead-out portion of the staggered electrode as shown in FIG. 2 or as shown in FIG. It can also be used for short circuit inspection between upper and lower electrodes combined with a slight distance.

また、本発明による検査法は、電極材に合わせてメッキ
液の成分を変えることにより、電極材の種類に制限され
ることなく使用することができる。さらには、ストライ
プ電極の一端に発生する電位によって任意の電流電界を
発生させ、これらの作用により形状変化する物質、例え
ば液晶、感熱材などを用いても、前記実施例と同様の効
果を得ることができる。
In addition, the inspection method according to the present invention can be used without being limited by the type of electrode material by changing the components of the plating solution according to the electrode material. Furthermore, the same effect as in the above embodiment can be obtained by using a substance that changes its shape by the action of generating an arbitrary current electric field by the potential generated at one end of the stripe electrode, such as liquid crystal or heat sensitive material. You can

[発明の効果] 以上説明したように、本発明によれば、ストライプ電極
の断線の有無及びその位置の確認を同時に行うことがで
き、検査工程及び検査時間を大幅に短縮することができ
る。また、従来の方法に比べ、被測定基板の構成(サイ
ズ、電極本数、電極ピッチ等)に制約されずに、同時に
多数の電極を検査することができる。さらには、高精度
の装置を必要としないため、簡単で安価な設備で検査を
行うことが可能となる。
[Effects of the Invention] As described above, according to the present invention, the presence or absence of disconnection of the stripe electrode and the position thereof can be checked at the same time, and the inspection process and inspection time can be significantly shortened. Further, compared with the conventional method, a large number of electrodes can be inspected at the same time without being restricted by the configuration (size, number of electrodes, electrode pitch, etc.) of the substrate to be measured. Furthermore, since a highly accurate device is not required, the inspection can be performed with simple and inexpensive equipment.

【図面の簡単な説明】[Brief description of drawings]

第1図は装置の一例を示す概略構成図、第2図及び第3
図は電極の構成例を示す図である。 1……基板、2……金属板、3……直流電源、 4……メッキ槽、5……メッキ液、 6……導電性テープ。
FIG. 1 is a schematic configuration diagram showing an example of an apparatus, FIG. 2 and FIG.
The figure is a diagram showing a configuration example of an electrode. 1 ... Substrate, 2 ... Metal plate, 3 ... DC power supply, 4 ... Plating tank, 5 ... Plating liquid, 6 ... Conductive tape.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】多数のストライプ状電極を設けた基板と、
対向する電極基板をメッキ液中に浸漬した後、両電極間
を通電し、析出するメッキ層の形成状態により前記スト
ライプ状電極の断線または短絡の有無を判定することを
特徴とする多数配線検査法。
1. A substrate having a large number of stripe electrodes,
A multi-wiring inspection method characterized in that after the opposing electrode substrates are immersed in a plating solution, the electrodes are energized to determine the presence or absence of disconnection or short circuit of the striped electrodes depending on the formation state of the deposited plating layer. .
JP61076693A 1986-04-04 1986-04-04 Multiple wiring inspection method Expired - Lifetime JPH0636006B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61076693A JPH0636006B2 (en) 1986-04-04 1986-04-04 Multiple wiring inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61076693A JPH0636006B2 (en) 1986-04-04 1986-04-04 Multiple wiring inspection method

Publications (2)

Publication Number Publication Date
JPS62233777A JPS62233777A (en) 1987-10-14
JPH0636006B2 true JPH0636006B2 (en) 1994-05-11

Family

ID=13612556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61076693A Expired - Lifetime JPH0636006B2 (en) 1986-04-04 1986-04-04 Multiple wiring inspection method

Country Status (1)

Country Link
JP (1) JPH0636006B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0619404B2 (en) * 1988-06-17 1994-03-16 共栄制御機器株式会社 Liquid crystal electrode substrate energization detection device

Also Published As

Publication number Publication date
JPS62233777A (en) 1987-10-14

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