JPH0784278A - Liquid crystal display panel - Google Patents

Liquid crystal display panel

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Publication number
JPH0784278A
JPH0784278A JP23274893A JP23274893A JPH0784278A JP H0784278 A JPH0784278 A JP H0784278A JP 23274893 A JP23274893 A JP 23274893A JP 23274893 A JP23274893 A JP 23274893A JP H0784278 A JPH0784278 A JP H0784278A
Authority
JP
Japan
Prior art keywords
chip
liquid crystal
wiring
pair
display panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP23274893A
Other languages
Japanese (ja)
Inventor
Masashi Irie
正志 入江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP23274893A priority Critical patent/JPH0784278A/en
Publication of JPH0784278A publication Critical patent/JPH0784278A/en
Withdrawn legal-status Critical Current

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Abstract

PURPOSE:To facilitate inspection for wirings and more particularly short circuit inspection with the liquid crystal display panel formed by packing a liquid crystal into the opposite spacing of a pair of transparent substrates, regularly forming many pieces of wirings for driving pixels on at least either of a pair of the transparent substrates and mounting IC chips for outputting pixel driving signals to the wirings. CONSTITUTION:Many pieces of conductor patterns 8-1', 8-2' extending from one side end of the wirings 7 for pixel driving and having junctures 8-1', 8-2' to the IC chips 6 and terminals 12 for inspection extending from the IC chip junctures 8-2' of the conductor patterns 8-2 of the even numbered places (or the conductor patterns 8-1 of the odd numbered places) are formed on the transparent substrate 2 formed with the wirings 7 for pixel driving. The terminals 12 for inspection are positioned within the IC chip mounting region B outside the opposite regions of a pair of the transparent substrates 2, 3. Further, the terminals for inspection extending outside the opposite regions of a pair of the transparent substrates, 2, 3 from the other ends of the conductor patterns 8-1 are formed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、画素駆動用ICチップ
を搭載した液晶表示パネル、特に、画素駆動用配線の検
査を容易ならしめる構成に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display panel having an IC chip for driving pixels, and more particularly to a structure for facilitating inspection of wirings for driving pixels.

【0002】[0002]

【従来の技術】一対の透明基板の対向間隙に液晶を充填
した液晶表示パネル(LCD)、例えば能動素子 (TF
T;Thin Film Transistor)を動作させて表示電極に所定
の電圧(駆動信号)を印加するTFT−LCDにおい
て、多数のTFTが接続する多数本のバスライン(配
線)は、その一端が画素駆動用ICチップに接続され
る。
2. Description of the Related Art A liquid crystal display panel (LCD), such as an active element (TF), in which liquid crystal is filled in a gap between a pair of transparent substrates.
In a TFT-LCD in which a thin film transistor (T) is operated to apply a predetermined voltage (drive signal) to the display electrodes, one end of a large number of bus lines (wiring) connected to a large number of TFTs is for pixel drive It is connected to the IC chip.

【0003】従って、画素駆動用ICチップを搭載した
表示パネル用透明基板の表面には、一端がバスラインに
接続し,他端がICチップの出力電極に接続される導体
パターンが形成される。
Therefore, a conductor pattern whose one end is connected to the bus line and the other end is connected to the output electrode of the IC chip is formed on the surface of the display panel transparent substrate on which the pixel driving IC chip is mounted.

【0004】かかる導体パターンは、一方の端部がバス
ラインと同一ピッチ(例えば約 100μm)、他方の端部が
ICチップの出力電極と同一ピッチ(例えば50〜70μm)
であり、バスラインの断線検査および隣接するバスライ
ンの短絡検査は、一対の表示パネル用透明基板を重ねそ
の間隙に液晶を充填したのち、該導体パターンに検査用
プローブ等を当接して行うことになる。
In such a conductor pattern, one end has the same pitch as the bus line (for example, about 100 μm), and the other end has the same pitch as the output electrode of the IC chip (for example, 50 to 70 μm).
The bus line disconnection inspection and the adjacent bus line short circuit inspection should be performed by stacking a pair of transparent substrates for display panels and filling the gaps with liquid crystal, and then contacting the conductor pattern with an inspection probe or the like. become.

【0005】図6は従来の液晶表示パネルの概略構成の
説明図であり、(イ) は一部を破断した平面図、(ロ) は
(イ) におけるA部の拡大詳細図である。図6において、
液晶表示パネル1は、一対の透明(ガラス)基板2と3
が所定間隙で対向し、周囲をシール材4でシールした該
間隙には液晶5を充填し、ICチップ6は、一般に、C
OG(Chip on Glass)と呼ばれる技術によって基板2に
搭載する。
FIG. 6 is an explanatory view of a schematic structure of a conventional liquid crystal display panel. (A) is a partially cutaway plan view and (b) is a plan view.
It is an enlarged detailed view of the A section in (a). In FIG.
The liquid crystal display panel 1 includes a pair of transparent (glass) substrates 2 and 3
Are opposed to each other with a predetermined gap, and the liquid crystal 5 is filled in the gap whose periphery is sealed by the sealing material 4, and the IC chip 6 is generally C
It is mounted on the substrate 2 by a technique called OG (Chip on Glass).

【0006】二方の端部近傍にそれぞれ複数個の駆動用
ICチップ6を搭載したガラス基板2の表面には、図6
(ロ) に示すように、基板2に形成された画素駆動用の複
数本の配線7とICチップ6とを接続する導体パターン
8と、ICチップ6を外部回路に接続する導体端子9と
が形成され、ICチップ6に接続する導体パターン8の
接続部8′と導体端子9の先端部とは、一点鎖線で示す
ICチップ搭載領域B内に形成させる。
On the surface of the glass substrate 2 on which a plurality of driving IC chips 6 are mounted in the vicinity of the two ends, the glass substrate 2 shown in FIG.
As shown in (b), a conductor pattern 8 for connecting the plurality of wiring lines 7 for driving pixels formed on the substrate 2 and the IC chip 6 and a conductor terminal 9 for connecting the IC chip 6 to an external circuit are provided. The connecting portion 8'of the conductor pattern 8 formed and connected to the IC chip 6 and the tip portion of the conductor terminal 9 are formed within the IC chip mounting area B shown by a chain line.

【0007】このような液晶表示パネル1は、表示品質
確認のためICチップ6の搭載に先立って、配線7の断
線と短絡を検査する必要がある。配線7の断線検査は、
多数本の配線7の一端を短絡状に接続した状態で全配線
7を同時に検査するようになるが、配線7の短絡検査
は、電気的に特立したプローブを各導体パターン8に、
好ましくは多少の傷が無視できる接続部8′に当接して
行う必要がある。
In such a liquid crystal display panel 1, it is necessary to inspect the wiring 7 for disconnection and short circuit before mounting the IC chip 6 in order to confirm the display quality. The disconnection inspection of the wiring 7
All the wirings 7 are inspected at the same time with one end of a large number of the wirings 7 connected in a short-circuited manner. For the short-circuiting inspection of the wirings 7, an electrically specialized probe is attached to each conductor pattern 8.
It is preferable to make contact with the connecting portion 8 ', where some scratches can be ignored.

【0008】しかし、画素の精細化に伴って配線7がピ
ッチ 100μm 程度以上に高密度化し、ICチップ6の高
性能,小型化によってその出力電極のピッチが50μm 程
度の高密度になると、導体パターン8に検査用プローブ
を当接させることが極めて難しくなる。
However, as the pitch of the wiring 7 becomes higher than about 100 μm as the pixel becomes finer and the pitch of the output electrodes becomes high at about 50 μm due to the high performance and miniaturization of the IC chip 6, the conductor pattern becomes It becomes extremely difficult to bring the probe for inspection into contact with 8.

【0009】[0009]

【発明が解決しようとする課題】以上説明したように従
来構成の液晶表示パネルは、液晶表示パネル, 駆動用I
Cチップの高性能化に伴って、導体パターン8,接続部
8′が高密度化すると、ばね弾性を有する検査用プロー
ブも高密度となり、表示用配線7の短絡検査が非常に難
しくなって生産性が低下するという問題点があった。
As described above, the conventional liquid crystal display panel is a liquid crystal display panel, a driving I
When the conductor pattern 8 and the connecting portion 8'become higher in density as the performance of the C chip becomes higher, the inspection probe having spring elasticity also becomes higher in density, and the short-circuit inspection of the display wiring 7 becomes very difficult. However, there is a problem in that

【0010】[0010]

【課題を解決するための手段】駆動用ICチップを搭載
した液晶表示パネルにおいて、画素駆動用配線および駆
動用ICチップの出力電極の高密度化に対処し、配線の
切断検査および短絡検査を容易ならしめることを目的と
した本発明は、図1によれば、一対の透明基板2と3の
対向間隙に液晶5を充填し、一対の透明基板2と3の少
なくとも一方2には、多数本の画素駆動用配線7が規則
的に形成され、かつ、配線7に画素駆動信号を出力する
ICチップ6が搭載された液晶表示パネル11において、
配線7が形成された透明基板2には、配線7より延在し
ICチップ6との接続部8-1′,8-2′を有する多数本
の導体パターン8-1,8-2と、偶数番目(または奇数番
目)の導体パターン8-2のICチップ接続部8-1′より
延在する検査用端子12とが形成され、検査用端子12が一
対の透明基板2,3の対向領域外のICチップ搭載領域
B内に配設されてなることを特徴とする。
In a liquid crystal display panel having a driving IC chip mounted thereon, it is possible to cope with high density of a pixel driving wiring and an output electrode of the driving IC chip, and to easily perform wiring disconnection inspection and short circuit inspection. According to the present invention for smoothing, according to FIG. 1, a liquid crystal 5 is filled in a facing gap between a pair of transparent substrates 2 and 3, and at least one of the pair of transparent substrates 2 and 3 has a large number of liquid crystals. In the liquid crystal display panel 11 in which the pixel driving wiring 7 is regularly formed, and the IC chip 6 for outputting the pixel driving signal is mounted on the wiring 7.
On the transparent substrate 2 on which the wiring 7 is formed, a large number of conductor patterns 8 -1 , 8 -2 extending from the wiring 7 and having connection portions 8 -1 ′, 8 -2 ′ with the IC chip 6, The even-numbered (or odd-numbered) conductor pattern 8 -2 is formed with an inspection terminal 12 extending from the IC chip connection portion 8 -1 ′, and the inspection terminal 12 is a region where the pair of transparent substrates 2 and 3 face each other. It is characterized in that it is arranged in the outer IC chip mounting area B.

【0011】[0011]

【作用】本発明の液晶表示パネルでは、少なくとも、偶
数番目(または奇数番目)の導体パターンのICチップ
接続端から、ICチップ搭載領域内に検査用端子が延在
する。従って、導体パターンを介して行う画素駆動用配
線の短絡検査には、多数本のプローブを千鳥状に配設、
即ち、検査用端子に当接するプローブとICチップ接続
端に当接するプローブとが千鳥状に配設可能となり、高
密度の導体パターンに対し検査用プローブの当接が容易
になる。
In the liquid crystal display panel of the present invention, the inspection terminal extends at least from the IC chip connection end of the even-numbered (or odd-numbered) conductor pattern into the IC chip mounting area. Therefore, in the short circuit inspection of the pixel drive wiring performed through the conductor pattern, a large number of probes are arranged in a staggered pattern,
That is, the probes contacting the inspection terminals and the probes contacting the IC chip connection ends can be arranged in a staggered manner, and the inspection probes can be easily contacted with the high-density conductor pattern.

【0012】[0012]

【実施例】図1は本発明の実施例になる液晶表示パネル
の概略構成の説明図、図2は図1に示す液晶表示パネル
の配線検査方法の説明図、図3は本発明の他の実施例に
なる液晶表示パネルの概略構成を示す平面図、図4は図
3に示す画素表示配線検査用端子の詳細な説明図、図5
は本発明になる液晶表示パネルのICチップ搭載例の説
明図である。
1 is an explanatory view of a schematic structure of a liquid crystal display panel according to an embodiment of the present invention, FIG. 2 is an explanatory view of a wiring inspection method of the liquid crystal display panel shown in FIG. 1, and FIG. 3 is another embodiment of the present invention. FIG. 5 is a plan view showing a schematic configuration of a liquid crystal display panel according to an embodiment, FIG. 4 is a detailed explanatory view of a pixel display wiring inspection terminal shown in FIG.
FIG. 3 is an explanatory diagram of an example of mounting an IC chip on a liquid crystal display panel according to the present invention.

【0013】図6と共通部分に同一符号を使用した図1
において、(イ) は一部を破断した平面図、(ロ) は(イ) に
おけるA部の拡大詳細図であり、液晶表示パネル11は、
一対の透明(ガラス)基板2と3が所定間隙で対向し、
周囲をシール材4でシールしたその間隙には液晶5を充
填する。
FIG. 1 using the same reference numerals as those in FIG.
In (a), a partially broken plan view, (b) is an enlarged detailed view of a portion A in (a), and the liquid crystal display panel 11 is
A pair of transparent (glass) substrates 2 and 3 face each other with a predetermined gap,
The liquid crystal 5 is filled in the gap whose periphery is sealed with the sealing material 4.

【0014】二方の端部近傍にそれぞれ複数個の駆動用
ICチップ6を搭載したガラス基板2の表面には、複数
本の画素駆動用配線(バスライン)7と、ICチップ6
と配線7とを接続する導体パターン8-1および8-2と、
ICチップ6を外部回路に接続する導体端子9が形成さ
れている。
A plurality of pixel driving wirings (bus lines) 7 and IC chips 6 are provided on the surface of the glass substrate 2 on which a plurality of driving IC chips 6 are mounted near the two ends.
And the conductor patterns 8 -1 and 8 -2 that connect the wiring 7 to the wiring 7,
Conductor terminals 9 for connecting the IC chip 6 to an external circuit are formed.

【0015】共通のICチップ6に対応し全体で扇状と
なる各複数本の導体パターン8-1と8-2は、整列方向に
交互に配設されており、整列方向に奇数番目(または偶
数番目)の導体パターン8-1の先端部8-1′は、従来の
導体パターン8と同じくICチップ搭載領域B内で終端
する反面、偶数番目(導体パターン8-1が偶数番目のと
きには奇数番目)の導体パターン8-2の先端部8-2′に
は、ICチップ搭載領域B内に延在する検査用端子12が
形成されている。
The plurality of conductor patterns 8 -1 and 8 -2 corresponding to the common IC chip 6 and having a fan shape as a whole are alternately arranged in the alignment direction, and odd-numbered (or even-numbered) in the alignment direction. conductor patterns 28-1 of the front end portion 28-1 'of th), odd when although terminating, the even-numbered (conductive pattern 8 -1 of the even-numbered in the conventional conductive pattern 8 and also the IC chip mounting area B ) In the tip portion 8 -2 ′ of the conductor pattern 8 -2 ), an inspection terminal 12 extending in the IC chip mounting area B is formed.

【0016】このような基板2に形成した配線7の断線
検査は従来方法と同じ方法、例えば図2に示す如く、同
一ICチップ6に接続する全導体パターン8-1と8-2
1本の導電性ゴム13を重ね、配線7および導電性ゴム13
を介して全画素に所定の駆動電圧を印加し、途中で断線
した配線7はその断線部から先が点灯しないことで判定
する。
The disconnection inspection of the wiring 7 formed on the substrate 2 as described above is performed by the same method as the conventional method, for example, as shown in FIG. 2, one for all the conductor patterns 8 -1 and 8 -2 connected to the same IC chip 6. The conductive rubber 13 of
A predetermined drive voltage is applied to all the pixels via, and the wiring 7 that is broken in the middle is determined by not lighting up from the broken portion.

【0017】導体パターン8-1および8-2が接続する配
線7の短絡検査は、例えばプローブを千鳥状に配設した
プローブカード、即ち導体パターン8-1の先端部8-1
に当接するプローブと検査用端子12に当接するプローブ
を交互に配設したプローブカードを使用し、各配線7に
所定の電圧を選択的に印加し、電圧を印加しないのに点
灯する配線7の有無によって判定する。
The short-circuit inspection of the wiring 7 to which the conductor patterns 8 -1 and 8 -2 are connected is performed by, for example, a probe card in which the probes are arranged in a staggered pattern, that is, the tip portion 8 -1 'of the conductor pattern 8 -1.
The probe card in which the probe contacting with the probe and the probe contacting with the inspection terminal 12 are alternately arranged is used, and a predetermined voltage is selectively applied to each wiring 7, and the wiring 7 is turned on when no voltage is applied. Determined by the presence or absence.

【0018】図1と共通部分に同一符号を使用した図3
において、液晶表示パネル16は、一対の透明(ガラス)
基板2と3が所定間隙で対向し、周囲をシール材4でシ
ールした該間隙には液晶5を充填する。
FIG. 3 using the same symbols as those in FIG.
In, the liquid crystal display panel 16 is a pair of transparent (glass)
The substrates 2 and 3 are opposed to each other with a predetermined gap, and the liquid crystal 5 is filled in the gap whose periphery is sealed with the sealing material 4.

【0019】ただし、パネル16の透明基板2は前記実施
例の基板2より少し大型であり、表面の二方には駆動用
ICチップ6を搭載するスペースが露呈し、他の二方に
は後述する端子17の形成スペースが露呈する。
However, the transparent substrate 2 of the panel 16 is slightly larger than the substrate 2 of the above-mentioned embodiment, the space for mounting the driving IC chip 6 is exposed on two sides of the surface, and the other two sides will be described later. The space for forming the terminal 17 to be exposed is exposed.

【0020】図3に一点鎖線で囲った横断領域Cを示す
図4において、基板2の一方の端部近傍には、配線7と
ICチップ6とを接続する導体パターン8-1と8-2およ
び、ICチップ6を外部回路に接続する導体端子9が形
成され、基板2の他方の端部近傍には、導体パターン8
-1が形成された配線7より延在する検査用端子17が形成
されている。
In FIG. 4 showing the cross-sectional area C surrounded by the one-dot chain line in FIG. 3, conductor patterns 8 -1 and 8 -2 for connecting the wiring 7 and the IC chip 6 are provided near one end of the substrate 2. Also, a conductor terminal 9 for connecting the IC chip 6 to an external circuit is formed, and a conductor pattern 8 is formed near the other end of the substrate 2.
An inspection terminal 17 extending from the wiring 7 on which -1 is formed is formed.

【0021】共通のICチップ6に対応し全体で扇状と
なる各複数本の導体パターン8-1と8-2は、整列方向に
交互に配設されており、整列方向に奇数番目(または偶
数番目)の導体パターン8-1の接続部8-1′は、従来の
導体パターン8と同じくICチップ搭載領域B内で終端
する反面、偶数番目の導体パターン8-2の接続部8-2
には、ICチップ搭載領域B内に延在する検査用端子12
が形成されている。
The plurality of conductor patterns 8 -1 and 8 -2 , which correspond to the common IC chip 6 and have a fan shape as a whole, are arranged alternately in the alignment direction, and are arranged in odd numbers (or even numbers) in the alignment direction. connection 8 of the conductive pattern 8 -1 th) -1 ', like the conventional conductive pattern 8 although terminating in IC chip mounting region B, the connection portion 8 of the even-numbered conductor pattern 8-2 2'
The inspection terminals 12 extending into the IC chip mounting area B.
Are formed.

【0022】このような液晶表示パネル16において、配
線7の断線検査は従来方法と同じ方法、例えば図2に示
す如く、同一ICチップ6に接続する全導体パターン8
-1と8-2に1本の導電性ゴム13を重ね、配線7および導
電性ゴム13を介して全画素に所定の駆動電圧を印加して
判定し、配線7の短絡検査は、検査用端子12と17にそれ
ぞれ検査用プローブを当接して各配線7に所定の電圧を
選択的に印加し、電圧を印加しないのに点灯する配線7
の有無によって判定する。
In such a liquid crystal display panel 16, the disconnection inspection of the wiring 7 is performed by the same method as the conventional method, for example, all conductor patterns 8 connected to the same IC chip 6 as shown in FIG.
-1 and 8 -2 , one conductive rubber 13 is overlaid, and a predetermined drive voltage is applied to all pixels through the wiring 7 and the conductive rubber 13 to make a determination. Wiring 7 that is in contact with terminals 12 and 17 by inspecting probes and selectively applies a predetermined voltage to each wiring 7, and that lights up even when no voltage is applied.
Determined by the presence or absence of.

【0023】図5において、(イ) は異方導電性樹脂を使
用してICチップ6を基板2に搭載したときの側面図、
(ロ) 金属バンプを使用してICチップ6を基板2に搭載
したときの側面図である。
In FIG. 5, (a) is a side view of the IC chip 6 mounted on the substrate 2 using an anisotropic conductive resin,
(B) It is a side view when the IC chip 6 is mounted on the substrate 2 using a metal bump.

【0024】図5(イ) において、21は電気的絶縁を有す
る接着材、22は接着材21に混在させた導電性粒子であ
り、導体パターン8-1, 8-2の接続部8-1′, 8-2′と
ICチップ6の出力電極25および、導体端子9とICチ
ップ6の入力電極26は、導電性粒子22をその間に挟むこ
とによって電気的に接続されるようになる反面、ICチ
ップ6に接続相手が存在しない検査用端子12は、電気的
に浮いた(接続されない)状態になる。
In FIG. 5 (a), 21 is an electrically insulating adhesive material, 22 is a conductive particle mixed in the adhesive material 21, and is a connecting portion 8 -1 of the conductor patterns 8 -1 , 8 -2. ′, 8 −2 ′ and the output electrode 25 of the IC chip 6, and the conductor terminal 9 and the input electrode 26 of the IC chip 6 are electrically connected by sandwiching the conductive particles 22, but The inspection terminal 12 having no connection partner on the IC chip 6 is electrically floated (not connected).

【0025】図5(イ) と共通部分に同一符号を使用した
図5(ロ) において、23は金属バンプ、24は電気的絶縁を
有する接着材であり、導体パターン8-1, 8-2の接続部
-1′, 8-2′とICチップ6の出力電極25および、導
体端子9とICチップ6の入力電極26は、金属バンプ23
によって電気的に接続されるようになるが、検査用端子
12は図5(イ) のそれと同じく電気的に浮いた状態にな
る。
In FIG. 5 (b), in which the same reference numerals are used for the same parts as in FIG. 5 (a), 23 is a metal bump, 24 is an electrically insulating adhesive material, and the conductor patterns 8 -1 , 8 -2 The connection parts 8 -1 ′ and 8 -2 ′ of the IC chip 6 and the output electrode 25 of the IC chip 6, and the conductor terminal 9 and the input electrode 26 of the IC chip 6 are the metal bumps 23.
Will be electrically connected by the
12 is in an electrically floating state like that of Fig. 5 (a).

【0026】[0026]

【発明の効果】以上説明したように本発明によれば、高
密度化された配線の検査に際し、その配線に当接させる
プローブは千鳥状に配設可能とし、検査作業を容易なら
しめ液晶表示パネルの生産性向上に寄与した効果があ
る。
As described above, according to the present invention, when inspecting a wiring having a high density, the probes to be brought into contact with the wiring can be arranged in a staggered manner, which facilitates the inspection work and a liquid crystal display. It has the effect of contributing to the improvement of panel productivity.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の実施例になる液晶表示パネルの概略
構成の説明図
FIG. 1 is an explanatory diagram of a schematic configuration of a liquid crystal display panel according to an embodiment of the present invention.

【図2】 図1に示す液晶表示パネルの配線検査方法の
説明図
FIG. 2 is an explanatory diagram of a wiring inspection method for the liquid crystal display panel shown in FIG.

【図3】 本発明の他の実施例になる液晶表示パネルの
概略構成を示す平面図
FIG. 3 is a plan view showing a schematic configuration of a liquid crystal display panel according to another embodiment of the present invention.

【図4】 図3に示す画素表示用配線検査用端子の詳細
な説明図
FIG. 4 is a detailed explanatory view of a pixel display wiring inspection terminal shown in FIG.

【図5】 本発明になる液晶表示パネルのICチップ搭
載例の説明図
FIG. 5 is an explanatory diagram of an example of mounting an IC chip on a liquid crystal display panel according to the present invention.

【図6】 従来の液晶表示パネルの概略構成の説明図FIG. 6 is an explanatory diagram of a schematic configuration of a conventional liquid crystal display panel.

【符号の説明】[Explanation of symbols]

2,3 透明基板 5 液晶 6 ICチップ 7 画素駆動用の配線 8-1,8-2 導体パターン、奇数 8-1′,8-2′ 導体パターンのICチップ接続部 11,16 液晶表示パネル 12,17 配線検査用端子 B ICチップ搭載領域2, 3 Transparent substrate 5 Liquid crystal 6 IC chip 7 Wiring for driving pixels 8 -1 , 8 -2 Conductor pattern, odd number 8 -1 ', 8 -2 ' Conductor pattern IC chip connection part 11,16 Liquid crystal display panel 12 , 17 Wiring inspection terminal B IC chip mounting area

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 一対の透明基板(2,3) の対向間隙に液晶
(5) を充填し、該一対の透明基板の少なくとも一方(2)
には、多数本の画素駆動用配線(7) が規則的に形成さ
れ、かつ、該配線(7) に画素駆動信号を出力するICチ
ップ(6) が搭載される液晶表示パネルにおいて、 該配線(7) が形成された透明基板(2) には、該配線(7)
より延在し該ICチップ(6) との接続部(8-1′,8-2′)
を有する多数本の導体パターン(8-1,8-2) と、奇数番目
または偶数番目の該導体パターンのICチップ接続部よ
り延在する検査用端子(12)が形成され、 該検査用端子(12)が該一対の透明基板の対向領域外のI
Cチップ搭載領域(B)内に位置すること、 を特徴とする液晶表示パネル。
1. A liquid crystal in a gap between a pair of transparent substrates (2, 3) facing each other.
(5) is filled with at least one of the pair of transparent substrates (2)
In the liquid crystal display panel, a large number of pixel driving wirings (7) are regularly formed, and an IC chip (6) for outputting a pixel driving signal is mounted on the wirings (7). On the transparent substrate (2) on which (7) is formed, the wiring (7)
Connection parts (8 -1 ′, 8 -2 ′) extending further and connecting to the IC chip (6)
A plurality of conductor patterns (8 -1 , 8 -2 ), and an inspection terminal (12) extending from the IC chip connection portion of the odd-numbered or even-numbered conductor pattern are formed. (12) is I outside the facing region of the pair of transparent substrates
A liquid crystal display panel characterized by being located in the C chip mounting area (B).
【請求項2】 一対の透明基板(2,3) の対向間隙に液晶
(5) を充填し、該一対の透明基板の少なくとも一方(2)
には、多数本の画素駆動用配線(7) が規則的に形成さ
れ、かつ、該配線(7) に画素駆動信号を出力するICチ
ップ(6) が搭載される液晶表示パネルにおいて、 該配線(7) が形成された透明基板(2) には、該配線(7)
の一側端より延在し該ICチップ(6) との接続部
(8-1′,8-2′) を有する多数本の導体パターン(8-1,
8 -2) と、奇数番目または偶数番目の該導体パターンの
ICチップ接続部より延在する第1の検査用端子(12)
と、該第1の検査用端子が延在しない該配線(7) の他側
端より延在する第2の検査用端子(17)とが形成され、 該第1の検査用端子(12)が該一対の透明基板の対向領域
外のICチップ搭載領域(B) 内に位置し、該第2の検査
用端子(17)が該一対の透明基板の対向領域外に位置する
こと、 を特徴とする液晶表示パネル。
2. A liquid crystal in a gap between a pair of transparent substrates (2, 3) facing each other.
(5) is filled with at least one of the pair of transparent substrates (2)
A large number of pixel drive wires (7) are regularly formed on the
And an IC chip that outputs a pixel drive signal to the wiring (7).
In a liquid crystal display panel on which the wiring (7) is mounted, the wiring (7) is formed on the transparent substrate (2) on which the wiring (7) is formed.
Connecting part extending from one side end to the IC chip (6)
(8-1′, 8-2′) Multiple conductor patterns (8-1,
8 -2) Of the odd or even conductor pattern
First inspection terminal (12) extending from the IC chip connection part
And the other side of the wiring (7) where the first inspection terminal does not extend
A second inspection terminal (17) extending from the end is formed, and the first inspection terminal (12) is located in the opposing region of the pair of transparent substrates.
Located in the outside IC chip mounting area (B),
Terminals (17) are located outside the opposing regions of the pair of transparent substrates
A liquid crystal display panel characterized by:
JP23274893A 1993-09-20 1993-09-20 Liquid crystal display panel Withdrawn JPH0784278A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23274893A JPH0784278A (en) 1993-09-20 1993-09-20 Liquid crystal display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23274893A JPH0784278A (en) 1993-09-20 1993-09-20 Liquid crystal display panel

Publications (1)

Publication Number Publication Date
JPH0784278A true JPH0784278A (en) 1995-03-31

Family

ID=16944144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23274893A Withdrawn JPH0784278A (en) 1993-09-20 1993-09-20 Liquid crystal display panel

Country Status (1)

Country Link
JP (1) JPH0784278A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100634826B1 (en) * 1998-11-11 2006-12-19 엘지.필립스 엘시디 주식회사 Pad for Auto-Probe of Liquid Crystal Display
KR100662989B1 (en) * 2004-08-20 2006-12-28 삼성에스디아이 주식회사 Display device having test circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100634826B1 (en) * 1998-11-11 2006-12-19 엘지.필립스 엘시디 주식회사 Pad for Auto-Probe of Liquid Crystal Display
KR100662989B1 (en) * 2004-08-20 2006-12-28 삼성에스디아이 주식회사 Display device having test circuit

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