JPS59216142A - リソグラフイ用マスクの製造方法 - Google Patents
リソグラフイ用マスクの製造方法Info
- Publication number
- JPS59216142A JPS59216142A JP59020141A JP2014184A JPS59216142A JP S59216142 A JPS59216142 A JP S59216142A JP 59020141 A JP59020141 A JP 59020141A JP 2014184 A JP2014184 A JP 2014184A JP S59216142 A JPS59216142 A JP S59216142A
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- layer
- opaque layer
- mask
- polyphthalaldehyde
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 3
- 238000001459 lithography Methods 0.000 title claims 2
- 150000003839 salts Chemical class 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 8
- 230000005855 radiation Effects 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 description 7
- XMPZTFVPEKAKFH-UHFFFAOYSA-P ceric ammonium nitrate Chemical compound [NH4+].[NH4+].[Ce+4].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O XMPZTFVPEKAKFH-UHFFFAOYSA-P 0.000 description 3
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 2
- OZLBDYMWFAHSOQ-UHFFFAOYSA-N diphenyliodanium Chemical compound C=1C=CC=CC=1[I+]C1=CC=CC=C1 OZLBDYMWFAHSOQ-UHFFFAOYSA-N 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 230000021736 acetylation Effects 0.000 description 1
- 238000006640 acetylation reaction Methods 0.000 description 1
- 230000029936 alkylation Effects 0.000 description 1
- 238000005804 alkylation reaction Methods 0.000 description 1
- 235000019270 ammonium chloride Nutrition 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910000423 chromium oxide Inorganic materials 0.000 description 1
- 239000000039 congener Chemical class 0.000 description 1
- -1 hexafluoroantimonate Chemical compound 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- WLOQLWBIJZDHET-UHFFFAOYSA-N triphenylsulfonium Chemical compound C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 WLOQLWBIJZDHET-UHFFFAOYSA-N 0.000 description 1
- 239000012953 triphenylsulfonium Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US49519983A | 1983-05-16 | 1983-05-16 | |
| US495199 | 1990-03-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59216142A true JPS59216142A (ja) | 1984-12-06 |
| JPH0354335B2 JPH0354335B2 (https=) | 1991-08-19 |
Family
ID=23967673
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59020141A Granted JPS59216142A (ja) | 1983-05-16 | 1984-02-08 | リソグラフイ用マスクの製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP0126214A3 (https=) |
| JP (1) | JPS59216142A (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0295344A1 (en) * | 1985-11-20 | 1988-12-21 | The Mead Corporation | Imaging material and an image-forming process |
| US4820829A (en) * | 1986-01-16 | 1989-04-11 | Ciba-Geigy Corporation | Substituted o-phthalaldehydes |
| US4734481A (en) * | 1986-01-16 | 1988-03-29 | Ciba-Geigy Corporation | Novel organometallic polymers |
| US4897336A (en) * | 1986-04-11 | 1990-01-30 | Chien James C W | Self-developing radiation sensitive resist with amorphous polymer having haloalkyl substitution derived from cycic ether |
| US6171765B1 (en) | 1998-05-26 | 2001-01-09 | Agilent Technologies, Inc. | Photolithographic processing for polymer LEDs with reactive metal cathodes |
| GB2501681A (en) * | 2012-04-30 | 2013-11-06 | Ibm | Nanoimprint lithographic methods |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2892712A (en) * | 1954-04-23 | 1959-06-30 | Du Pont | Process for preparing relief images |
| GB1246207A (en) * | 1968-05-22 | 1971-09-15 | Gen Electric | Selective depolymerization of thin polymer films |
| JPS5992532A (ja) * | 1982-11-18 | 1984-05-28 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | ポジテイブ型レジストの製造方法 |
-
1984
- 1984-02-08 JP JP59020141A patent/JPS59216142A/ja active Granted
- 1984-02-14 EP EP84101445A patent/EP0126214A3/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0354335B2 (https=) | 1991-08-19 |
| EP0126214A3 (en) | 1986-02-05 |
| EP0126214A2 (en) | 1984-11-28 |
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