JPS5920840A - 欠陥検査装置 - Google Patents

欠陥検査装置

Info

Publication number
JPS5920840A
JPS5920840A JP13179882A JP13179882A JPS5920840A JP S5920840 A JPS5920840 A JP S5920840A JP 13179882 A JP13179882 A JP 13179882A JP 13179882 A JP13179882 A JP 13179882A JP S5920840 A JPS5920840 A JP S5920840A
Authority
JP
Japan
Prior art keywords
inspected
photodetector
light
sample
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13179882A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0447782B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Kikuo Mita
三田 喜久夫
Moritoshi Ando
護俊 安藤
Giichi Kakigi
柿木 義一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP13179882A priority Critical patent/JPS5920840A/ja
Publication of JPS5920840A publication Critical patent/JPS5920840A/ja
Publication of JPH0447782B2 publication Critical patent/JPH0447782B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95692Patterns showing hole parts, e.g. honeycomb filtering structures

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
JP13179882A 1982-07-28 1982-07-28 欠陥検査装置 Granted JPS5920840A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13179882A JPS5920840A (ja) 1982-07-28 1982-07-28 欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13179882A JPS5920840A (ja) 1982-07-28 1982-07-28 欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS5920840A true JPS5920840A (ja) 1984-02-02
JPH0447782B2 JPH0447782B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-08-04

Family

ID=15066359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13179882A Granted JPS5920840A (ja) 1982-07-28 1982-07-28 欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS5920840A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999364A (ja) * 1982-11-30 1984-06-08 Fujitsu Ltd スル−ホ−ル検査装置
JPS59150329A (ja) * 1983-01-28 1984-08-28 Fujitsu Ltd スル−ホ−ル検査装置
JPS62297750A (ja) * 1986-06-17 1987-12-24 Matsushita Electric Ind Co Ltd ハンダ付け検査装置
JPS62299747A (ja) * 1986-06-19 1987-12-26 Fujitsu Ltd スル−ホ−ル検査装置
JPH0455991U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1990-09-19 1992-05-13
US5548400A (en) * 1994-02-16 1996-08-20 Sochata Method and apparatus for inspecting honeycomb structures using optical fibres
EP0997722A1 (fr) * 1998-10-29 2000-05-03 Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" Procédé et instrument de contrôle de la liaison de l'âme alvéolée d'un nid d'abeilles sur une peau

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53143384A (en) * 1977-05-20 1978-12-13 Yaskawa Denki Seisakusho Kk Pinhole detector
JPS5444769A (en) * 1977-09-14 1979-04-09 Matsushita Electric Ind Co Ltd Device for inspecting displacement of chipplike parts
JPS54141661A (en) * 1978-04-27 1979-11-05 Fujitsu Ltd Assignment system of inspection area

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53143384A (en) * 1977-05-20 1978-12-13 Yaskawa Denki Seisakusho Kk Pinhole detector
JPS5444769A (en) * 1977-09-14 1979-04-09 Matsushita Electric Ind Co Ltd Device for inspecting displacement of chipplike parts
JPS54141661A (en) * 1978-04-27 1979-11-05 Fujitsu Ltd Assignment system of inspection area

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999364A (ja) * 1982-11-30 1984-06-08 Fujitsu Ltd スル−ホ−ル検査装置
JPS59150329A (ja) * 1983-01-28 1984-08-28 Fujitsu Ltd スル−ホ−ル検査装置
JPS62297750A (ja) * 1986-06-17 1987-12-24 Matsushita Electric Ind Co Ltd ハンダ付け検査装置
JPS62299747A (ja) * 1986-06-19 1987-12-26 Fujitsu Ltd スル−ホ−ル検査装置
JPH0455991U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1990-09-19 1992-05-13
US5548400A (en) * 1994-02-16 1996-08-20 Sochata Method and apparatus for inspecting honeycomb structures using optical fibres
EP0997722A1 (fr) * 1998-10-29 2000-05-03 Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" Procédé et instrument de contrôle de la liaison de l'âme alvéolée d'un nid d'abeilles sur une peau
FR2785388A1 (fr) * 1998-10-29 2000-05-05 Snecma Procede et instrument de controle de la liaison de l'ame alveolee d'un nid d'abeilles sur une peau

Also Published As

Publication number Publication date
JPH0447782B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-08-04

Similar Documents

Publication Publication Date Title
JPS5920840A (ja) 欠陥検査装置
KR101794134B1 (ko) 반도체 검사용 테스트헤드
US11567104B2 (en) High speed signal transmitting and receiving detection device
JPH1164428A (ja) 部品検査装置
CN104316856B (zh) 背面探测式光子辐射显微镜装置及测试方法
US4734980A (en) Printed circuit board wiring method
GB2390436A (en) Method of locating a disconnection in a circuit using time domain reflectometry
JPH10142271A (ja) 回路基板のパターン静電容量測定方法
JPS6262254A (ja) プリント板検査装置
JPH0359448A (ja) 漏光検査法におけるスルーホールマスク装置
RU91767U1 (ru) Аппаратура для тестирования печатных плат с обнаружением скрытых дефектов
CN208443336U (zh) 用于oled电子屏的定位装置
Ando et al. Automatic opitcal through hole inspection method for printed wiring boards using leakage light detection
JPH04296956A (ja) ケーブル断線検出装置
JPS59125695A (ja) プリント板のスル−ホ−ル検査装置
KR100868748B1 (ko) 회로기판 검사장치 및 그 검사 방법
JPH0563327A (ja) 検査用ランド付き印刷配線板およびその検査方法
JPH04355378A (ja) コンタクトプローブ接触確認法
JPS6375544A (ja) スル−ホ−ル検査装置
JPS6122268A (ja) プリント基板検査機
JPS59214779A (ja) プリント配線板の短絡箇所検出方法
CN107564827A (zh) 板的布线图案检查装置及布线图案检查方法
JPH0442943A (ja) 半導体装置の検査装置
JPS59178371A (ja) 電気回路の検査方法
JPS6085308A (ja) スル−ホ−ル欠陥検査法