JPS59203792A - Process for growing single crystal - Google Patents

Process for growing single crystal

Info

Publication number
JPS59203792A
JPS59203792A JP7654183A JP7654183A JPS59203792A JP S59203792 A JPS59203792 A JP S59203792A JP 7654183 A JP7654183 A JP 7654183A JP 7654183 A JP7654183 A JP 7654183A JP S59203792 A JPS59203792 A JP S59203792A
Authority
JP
Japan
Prior art keywords
single crystal
growing
growth
temperature gradient
shoulder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7654183A
Other languages
Japanese (ja)
Inventor
Shinji Esashi
江刺 信二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7654183A priority Critical patent/JPS59203792A/en
Publication of JPS59203792A publication Critical patent/JPS59203792A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To reduce crack generation in the slow cooling stage due to introduction of failure part into the shoulder or barrel part of a single crystal in the pulling method for growing a single crystal by changing the temp. gradient in the pulling direction at immediately above the melt surface for the growing stage of the shoulder part and for the growing stage of the barrel part. CONSTITUTION:A switch 10 which can be turned on/off so as to control the quantity of heat rays passing through a peeping hole 7 of a single crystal growing apparatus is provided to the outside of the peeping hole 7. For example, a seed crystal 5 is pulled up while rotating a single crystal 6 around a Z axis of LiTaO3 to open the switch 10 during the growing stage of the single crystal 6, but it is closed during the stage for growing the barrel part of the crystal. In this way, a temp. gradient in the pulling direction just above the melt 4 is controlled.

Description

【発明の詳細な説明】 (a)  発明の技術分野 本発明は単結晶育成方法に係り特に育成時の温度制御に
関す。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a single crystal growth method, and particularly to temperature control during growth.

[b)  技術の背景 単結晶ウェハは半導体素子に多く使用されているが、一
方、近年ウェハを基板にしその表面に膜パターンを形成
して単結晶の物理特性を利用した電子部品が実用化され
てきている。
[b) Background of the technology Single-crystal wafers are often used for semiconductor devices, but in recent years, electronic components that utilize the physical properties of single crystals by using wafers as substrates and forming film patterns on their surfaces have been put into practical use. It's coming.

タンタル酸すチューム(LiTaOJ)  ・ニオブ酸
すチューム(LiNbO3)などの単結晶ウェハば表面
弾性波フィルタ・振動子などの基板として使用されるの
がその例であるが、これらの単結晶は価格が高く前記部
品の生産コストの中の比率が大きいため、その育成にお
ける歩留りを向上さセることか望まれている。
An example of this is the use of single crystal wafers such as tantalum oxide (LiTaOJ) and niobium oxide (LiNbO3) as substrates for surface acoustic wave filters and resonators, but these single crystals are expensive. Since these components account for a large proportion of the production cost, it is desired to improve the yield in growing them.

(C)  従来技術と問題点 第1図(al・第1図(blは育成装置の構成とその温
度勾配を示した図、第2図は育成された単結晶の側面図
で、■は容器、2はるつは、3は高周波コイル、4は融
液、5は種単結晶、6は単結晶、7・7aは覗き窓、8
は肩部、9は胴体部をそれぞれ示す。
(C) Prior art and problems Figure 1 (al) Figure 1 (bl is a diagram showing the configuration of the growth apparatus and its temperature gradient, Figure 2 is a side view of the grown single crystal, ■ is a container , 2 Haruha, 3 is a high frequency coil, 4 is a melt, 5 is a seed single crystal, 6 is a single crystal, 7 and 7a are viewing windows, 8
9 indicates the shoulder portion, and 9 indicates the torso portion.

第1図(alにおいて、容器1の内部にるつは2が、ま
たそのるつぼ2を囲むように容器1の外部に高周波コイ
ル3が配置されていて、るつぼ2の中にある単結晶の原
料は高周波コイル3によるるつは2の加熱により融液4
となっている。融液4に種単結晶5を浸し回転させなが
ら引」二げて単結晶を育成するが、図では育成中の単結
晶6を示している。この育成状態を監視出来るように融
液4と単結晶6との境界近傍を覗げる覗き窓7が容器1
の側面に設けである。
In Fig. 1 (al), a crucible 2 is placed inside a container 1, and a high-frequency coil 3 is placed outside the container 1 so as to surround the crucible 2. The melt 4 is heated by the high frequency coil 3.
It becomes. A seed single crystal 5 is immersed in the melt 4 and pulled while rotating to grow a single crystal, and the figure shows the single crystal 6 during growth. In order to monitor this growth state, a viewing window 7 is provided in the container 1 through which the vicinity of the boundary between the melt 4 and the single crystal 6 can be seen.
It is provided on the side.

この構成による単結晶育成装置の単結晶6育成中の装置
内部における引」二げの方向に対する温度勾配は第1図
(al右側のグラフの通りで、縦軸は装置の高さ方向の
位置を横軸は温度を示している。
The temperature gradient in the pull direction inside the single crystal growth apparatus with this configuration during single crystal 6 growth is shown in the graph on the right side of Figure 1 (al), where the vertical axis indicates the position in the height direction of the apparatus. The horizontal axis shows temperature.

上部から下方に行くに従い温度が上昇し且つ温度勾配も
大きくなっているが融液4面の上方で一旦温度が下がり
再び上昇しているため温度勾配は二度逆転し融液4面の
直上では図示のように温度勾配が最も大きくなっている
The temperature rises and the temperature gradient becomes larger as we move downward from the top, but the temperature drops above the 4th surface of the melt and rises again, so the temperature gradient reverses twice and immediately above the 4th surface of the melt As shown in the figure, the temperature gradient is the largest.

第1図(blは覗き窓7が無く、代わりに容器1の上部
に覗き窓7aが設けられた単結晶育成装置であり、此の
場合の温度勾配は前記逆転が無く下方に行くに従って単
純に」二昇している。
Figure 1 (bl is a single crystal growth apparatus without a viewing window 7, but instead provided with a viewing window 7a at the top of the container 1; the temperature gradient in this case is simple as it goes downward without the above-mentioned reversal. 'I'm rising two times.

第2図は育成された単結晶を示し、種単結晶5から育成
される該単結晶が所定の太さまで成長する肩部8とその
太さを維持している胴体部9からなっているが、タンタ
ル酸すチューム(LiTaOa)・ニオブ酸すチューム
(LiNb03)などの単結晶の育成を第1図(al・
第1図(blに示す従来の装置で行うと、温度制御を最
適と判断される状態にしても育成中における肩部8また
ば胴体部9の欠陥導入によって徐冷中に割れを発生する
ことが少なくない問題がある。
FIG. 2 shows a grown single crystal, which is grown from a seed single crystal 5 and consists of a shoulder part 8 where it grows to a predetermined thickness and a body part 9 which maintains that thickness. Figure 1 (al.
When the conventional equipment shown in Figure 1 (bl) is used, even if the temperature control is set to the optimal state, cracks are less likely to occur during slow cooling due to defects introduced in the shoulder 8 or body 9 during growth. There is no problem.

(dl  発明の目的 本発明の目的は上記従来の問題に鑑み、前記育成中にお
ける肩部または胴体部の欠陥導入による徐冷中の割れ発
生を低減させる単結晶育成方法を提供するにある。
(dl) Purpose of the Invention In view of the above-mentioned conventional problems, it is an object of the present invention to provide a single crystal growth method that reduces the occurrence of cracking during slow cooling due to the introduction of defects in the shoulder or body portion during the growth.

(el  発明の構成 上記目的は単結晶原料融液面の直」二における引上げの
方向に対する温度勾配を該単結晶の肩部育成時と胴体部
育成時とで異ならせることによって達成される。
(el) Structure of the Invention The above object is achieved by making the temperature gradient in the pulling direction at a point directly above the single crystal raw material melt surface different between when growing the shoulder portion and when growing the body portion of the single crystal.

発明者はタンタル酸すチューム(LiTaO3)  ・
ニオブ酸すチューム(LiNb03)などの単結晶の育
成の経験を通し、単結晶の育成に関し肩部の育成時と胴
体部の育成時における前記温度勾配を別にすることによ
り肩部および胴体部の欠陥導入を個別に低減させ徐冷中
の割れ発生を低減し得ること、更にタンタル酸すチュー
ム(LiTaOs)およびニオブ酸すチューム(LiN
bO3)単結晶の場合は肩部育成時の前記温度勾配を胴
体部育成時より大き(すれば有効で有ることを見いだし
た。
The inventor is tantalate tume (LiTaO3) ・
Through our experience in growing single crystals such as niobium oxide (LiNb03), we have learned that by separating the temperature gradients during the growth of the shoulder and the body during single crystal growth, defects in the shoulder and body can be eliminated. In addition, tantalum oxide (LiTaOs) and niobium oxide (LiN) can be individually reduced to reduce the occurrence of cracking during slow cooling.
In the case of a bO3) single crystal, it has been found that it is effective if the temperature gradient during shoulder growth is larger than that during body growth.

然しながら、第1図(al・第1図(blに示す従来の
装置では、何れの場合も温度の大小制御は可能であるが
前記温度勾配の傾向は装置固有のものであるため、前記
温度勾配を別にするためには装置の構成を変える必要が
ある。
However, in the conventional devices shown in FIG. 1 (al) and FIG. 1 (bl), although it is possible to control the temperature in either case, the temperature gradient tends to be In order to separate them, it is necessary to change the configuration of the device.

(fl  発明の実施例 以下本発明の一実施例を図により説明する。(fl Embodiments of the invention An embodiment of the present invention will be described below with reference to the drawings.

全図を通じ同一符号は同一対象物を示す。The same reference numerals indicate the same objects throughout the figures.

第3図fatは本発明による方法を実施するための単結
晶育成装置の部分構成図、第3図(bl・第3図(C1
はその装置において開閉器を開・閉した場合の温度勾配
をそれぞれ示した図で、10は開閉器を示す。
Figure 3 fat is a partial configuration diagram of a single crystal growth apparatus for carrying out the method according to the present invention, Figure 3 (bl, Figure 3 (C1
1 is a diagram showing the temperature gradient when the switch is opened and closed in the device, and 10 indicates the switch.

本発明による方法を実施するため、前記第1図(alの
単結晶育成装置の覗き窓7を通過する熱線の量を調節出
来るように第3図(a)に示す如く開閉可能な開閉器1
0を覗き窓7の外側に付加した。
In order to carry out the method according to the present invention, a switch 1 which can be opened and closed as shown in FIG.
0 was added to the outside of the viewing window 7.

第3図fblは第3図(alに示す装置において開閉器
10を開いた状態での温度勾配を第1図(alの表現に
準じて示しており、その温度勾配は第1図(alの場合
と変わらない。第3図(C1は同しく開閉器IOを閉じ
た場合であり、第1図fblに似ており融液4而の直上
における温度勾配は図示のように第3図(blの場合よ
り小さい。従って開閉器10の開閉調節によりこの部分
の温度勾配を第3図(blの場合から第3図(C1の場
合の範囲で調節することが出来る。
Figure 3 fbl shows the temperature gradient in the device shown in Figure 3 (al) when the switch 10 is open, according to the expression in Figure 1 (al); Figure 3 (C1 is the same case when the switch IO is closed, and it is similar to Figure 1 fbl, and the temperature gradient directly above the melt 4 is as shown in Figure 3 (bl). Therefore, by adjusting the opening and closing of the switch 10, the temperature gradient in this part can be adjusted within the range from the case shown in FIG. 3 (bl) to the case shown in FIG. 3 (C1).

以−にに説明した装置を使用してタンタル酸すチューム
(LiTaO3)のZ軸での単結晶育成を行ない、第2
図の肩部8の育成中は開閉器10を開き胴体部9の育成
中は開閉器10を閉しるごとによって、前記の割れ発生
は従来の約2/3に低減した。またニオブ酸すチューム
(LiNb03)のZ軸での育成でも略同様な結果を得
た。
Using the apparatus described above, a single crystal of tantalate (LiTaO3) was grown along the Z axis.
By opening the switch 10 during the growth of the shoulder portion 8 shown in the figure and closing the switch 10 during the growth of the body portion 9, the occurrence of cracks was reduced to about two-thirds of the conventional level. Furthermore, substantially similar results were obtained when growing niobium oxide (LiNb03) along the Z axis.

(g)  発明の効果 以」−に説明したように、本発明による構成によれば単
結晶育成中における肩部または胴体部の欠陥導入による
徐冷中の割れ発生を低減させて歩留りを向上させること
か出来、高価な単結晶基板を使用する電子部品の生産コ
ス1へ低減を可能にさせる効果がある。
(g) Effects of the Invention As explained in ``Effects of the Invention'', the configuration according to the present invention can reduce the occurrence of cracks during slow cooling due to the introduction of defects in the shoulder or body portion during single crystal growth, thereby improving the yield. This has the effect of making it possible to reduce the production cost of electronic components using expensive single-crystal substrates to 1.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(81・第1図fblは育成装置の構成とその温
度勾配を示した図、第2図は育成された単結晶の側面図
、第3図(alは本発明による方法を実施するための単
結晶育成装置の部分構成図、第3図(bl・第3図(C
1はその装置において開閉器を開・閉した場合の温度勾
配をそれぞれ示した図である。 図面において、1は容器、2はるっは、3は高周波コイ
ル、4ば融液、5ば種単結晶、6は単結晶、7・7aば
覗き窓、8は肩部、9ば胴体部、1゜は開閉器をそれぞ
れ示す。 567
Figure 1 (81/Figure 1 fbl is a diagram showing the structure of the growth apparatus and its temperature gradient, Figure 2 is a side view of the grown single crystal, Figure 3 (al is a diagram showing the structure of the growth apparatus) Partial configuration diagram of the single crystal growth apparatus for
1 is a diagram showing the temperature gradient when the switch is opened and closed in the device. In the drawings, 1 is a container, 2 is a high-frequency coil, 4 is a melt, 5 is a seed single crystal, 6 is a single crystal, 7 and 7a are viewing windows, 8 is a shoulder part, and 9 is a body part , 1° indicate the switch, respectively. 567

Claims (3)

【特許請求の範囲】[Claims] (1)種単結晶を単結晶原料の融液に浸し回転させなが
ら引上げて、最初に単結晶を所定の太さに成長させる肩
部の育成を行い、続いて該所定の太さを維持させた胴体
部の育成を行う引上法による単結晶の育成において、前
記融液面の直上における前記引上げの方向に対する温度
勾配を該単結晶の前記肩部育成時と前記胴体部育成時と
で異ならせることを特徴とする単結晶育成方法。
(1) A seed single crystal is immersed in a melt of a single crystal raw material and pulled up while being rotated to grow a shoulder portion that grows the single crystal to a predetermined thickness, and then to maintain the predetermined thickness. In growing a single crystal by a pulling method for growing a body part of the single crystal, if the temperature gradient in the pulling direction immediately above the melt surface is different between when growing the shoulder part and when growing the body part of the single crystal. A single crystal growth method characterized by
(2)前記温度勾配を異ならせることを、前記育成に使
用する単結晶育成装置の側面に備えられた覗き窓を開閉
することにより実施することを特徴とする特許請求の範
囲第(1)項記載の単結晶育成方法。
(2) Claim (1) characterized in that the temperature gradient is varied by opening and closing a viewing window provided on the side of the single crystal growth apparatus used for the growth. Single crystal growth method described.
(3)前記温度勾配を異ならせることにおいて、クンタ
ル酸リチューム(LiTaOi )およびニオブ酸すチ
ューム(LiNb03)の単結晶育成に際して前記肩部
育成時の温度勾配を前記胴体部育成時の温度勾配より大
きくすることを特徴とする特許請求の範囲第(1)項記
載の単結晶育成方法。
(3) In making the temperature gradient different, when growing single crystals of lithium cuntarate (LiTaOi) and lithium niobate (LiNb03), the temperature gradient during the shoulder growth is made larger than the temperature gradient during the body growth. A method for growing a single crystal according to claim (1).
JP7654183A 1983-04-30 1983-04-30 Process for growing single crystal Pending JPS59203792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7654183A JPS59203792A (en) 1983-04-30 1983-04-30 Process for growing single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7654183A JPS59203792A (en) 1983-04-30 1983-04-30 Process for growing single crystal

Publications (1)

Publication Number Publication Date
JPS59203792A true JPS59203792A (en) 1984-11-17

Family

ID=13608125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7654183A Pending JPS59203792A (en) 1983-04-30 1983-04-30 Process for growing single crystal

Country Status (1)

Country Link
JP (1) JPS59203792A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS549174A (en) * 1977-06-24 1979-01-23 Toshiba Corp Method of producing seingle crystal
JPS55126596A (en) * 1979-03-20 1980-09-30 Toshiba Corp Production of single crystal

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS549174A (en) * 1977-06-24 1979-01-23 Toshiba Corp Method of producing seingle crystal
JPS55126596A (en) * 1979-03-20 1980-09-30 Toshiba Corp Production of single crystal

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