JPS59201464A - 半導体記憶装置 - Google Patents
半導体記憶装置Info
- Publication number
- JPS59201464A JPS59201464A JP58076460A JP7646083A JPS59201464A JP S59201464 A JPS59201464 A JP S59201464A JP 58076460 A JP58076460 A JP 58076460A JP 7646083 A JP7646083 A JP 7646083A JP S59201464 A JPS59201464 A JP S59201464A
- Authority
- JP
- Japan
- Prior art keywords
- potential
- region
- substrate
- word line
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 23
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 239000011159 matrix material Substances 0.000 claims 1
- 239000003990 capacitor Substances 0.000 abstract description 7
- 239000002784 hot electron Substances 0.000 abstract description 6
- 239000012535 impurity Substances 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 4
- 238000009413 insulation Methods 0.000 abstract 1
- 230000007423 decrease Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58076460A JPS59201464A (ja) | 1983-04-30 | 1983-04-30 | 半導体記憶装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58076460A JPS59201464A (ja) | 1983-04-30 | 1983-04-30 | 半導体記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59201464A true JPS59201464A (ja) | 1984-11-15 |
JPS6146978B2 JPS6146978B2 (enrdf_load_stackoverflow) | 1986-10-16 |
Family
ID=13605767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58076460A Granted JPS59201464A (ja) | 1983-04-30 | 1983-04-30 | 半導体記憶装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59201464A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6179935A (ja) * | 1984-09-28 | 1986-04-23 | Yamatake Honeywell Co Ltd | 放射熱遮断ダクト |
JPS61265792A (ja) * | 1985-05-20 | 1986-11-25 | Fujitsu Ltd | 半導体記憶回路 |
JPS6364359A (ja) * | 1986-09-04 | 1988-03-22 | Sony Corp | 半導体記憶装置 |
US5822267A (en) * | 1986-07-18 | 1998-10-13 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
-
1983
- 1983-04-30 JP JP58076460A patent/JPS59201464A/ja active Granted
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6179935A (ja) * | 1984-09-28 | 1986-04-23 | Yamatake Honeywell Co Ltd | 放射熱遮断ダクト |
JPS61265792A (ja) * | 1985-05-20 | 1986-11-25 | Fujitsu Ltd | 半導体記憶回路 |
US6125075A (en) * | 1985-07-22 | 2000-09-26 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US6363029B1 (en) | 1985-07-22 | 2002-03-26 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US6970391B2 (en) | 1985-07-22 | 2005-11-29 | Renesas Technology Corporation | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US5822267A (en) * | 1986-07-18 | 1998-10-13 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US7002856B2 (en) | 1986-07-18 | 2006-02-21 | Renesas Technology Corporation | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
JPS6364359A (ja) * | 1986-09-04 | 1988-03-22 | Sony Corp | 半導体記憶装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS6146978B2 (enrdf_load_stackoverflow) | 1986-10-16 |
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