JPS59195728A - デ−タ処理装置 - Google Patents

デ−タ処理装置

Info

Publication number
JPS59195728A
JPS59195728A JP7108683A JP7108683A JPS59195728A JP S59195728 A JPS59195728 A JP S59195728A JP 7108683 A JP7108683 A JP 7108683A JP 7108683 A JP7108683 A JP 7108683A JP S59195728 A JPS59195728 A JP S59195728A
Authority
JP
Japan
Prior art keywords
signal
bus
data processing
operations
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7108683A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6367702B2 (enrdf_load_stackoverflow
Inventor
Nobuteru Morita
森田　信輝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7108683A priority Critical patent/JPS59195728A/ja
Publication of JPS59195728A publication Critical patent/JPS59195728A/ja
Publication of JPS6367702B2 publication Critical patent/JPS6367702B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Multi Processors (AREA)
  • Bus Control (AREA)
JP7108683A 1983-04-22 1983-04-22 デ−タ処理装置 Granted JPS59195728A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7108683A JPS59195728A (ja) 1983-04-22 1983-04-22 デ−タ処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7108683A JPS59195728A (ja) 1983-04-22 1983-04-22 デ−タ処理装置

Publications (2)

Publication Number Publication Date
JPS59195728A true JPS59195728A (ja) 1984-11-06
JPS6367702B2 JPS6367702B2 (enrdf_load_stackoverflow) 1988-12-27

Family

ID=13450362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7108683A Granted JPS59195728A (ja) 1983-04-22 1983-04-22 デ−タ処理装置

Country Status (1)

Country Link
JP (1) JPS59195728A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61198355A (ja) * 1985-02-28 1986-09-02 Toshiba Corp マルチプロセツサシステム
JPH04310165A (ja) * 1991-04-09 1992-11-02 Nec Corp バスロック制御機構
JPH06314232A (ja) * 1993-05-06 1994-11-08 Mitsubishi Electric Corp メモリ切替制御回路
US6333510B1 (en) 1997-08-11 2001-12-25 Hitachi, Ltd. Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4941044A (enrdf_load_stackoverflow) * 1972-08-26 1974-04-17

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4941044A (enrdf_load_stackoverflow) * 1972-08-26 1974-04-17

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61198355A (ja) * 1985-02-28 1986-09-02 Toshiba Corp マルチプロセツサシステム
JPH04310165A (ja) * 1991-04-09 1992-11-02 Nec Corp バスロック制御機構
JPH06314232A (ja) * 1993-05-06 1994-11-08 Mitsubishi Electric Corp メモリ切替制御回路
US6333510B1 (en) 1997-08-11 2001-12-25 Hitachi, Ltd. Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatus
US6753518B2 (en) 1997-08-11 2004-06-22 Hitachi, Ltd. Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US6919577B2 (en) 1997-08-11 2005-07-19 Hitachi, Ltd. Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US7329889B2 (en) 1997-08-11 2008-02-12 Hitachi, Ltd. Electron beam apparatus and method with surface height calculator and a dual projection optical unit
US7692144B2 (en) 1997-08-11 2010-04-06 Hitachi, Ltd. Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US8212227B2 (en) 1997-08-11 2012-07-03 Hitachi, Ltd. Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus

Also Published As

Publication number Publication date
JPS6367702B2 (enrdf_load_stackoverflow) 1988-12-27

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