JPS59147278A - 電子部品の負荷試験装置 - Google Patents

電子部品の負荷試験装置

Info

Publication number
JPS59147278A
JPS59147278A JP58021612A JP2161283A JPS59147278A JP S59147278 A JPS59147278 A JP S59147278A JP 58021612 A JP58021612 A JP 58021612A JP 2161283 A JP2161283 A JP 2161283A JP S59147278 A JPS59147278 A JP S59147278A
Authority
JP
Japan
Prior art keywords
high temperature
temperature tank
shelf
electronic components
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58021612A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0129426B2 (enExample
Inventor
Satoru Yokoi
横井 哲
Hirokazu Kondo
近藤 博量
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsubakimoto Chain Co
Original Assignee
Tsubakimoto Chain Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsubakimoto Chain Co filed Critical Tsubakimoto Chain Co
Priority to JP58021612A priority Critical patent/JPS59147278A/ja
Publication of JPS59147278A publication Critical patent/JPS59147278A/ja
Publication of JPH0129426B2 publication Critical patent/JPH0129426B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58021612A 1983-02-14 1983-02-14 電子部品の負荷試験装置 Granted JPS59147278A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58021612A JPS59147278A (ja) 1983-02-14 1983-02-14 電子部品の負荷試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58021612A JPS59147278A (ja) 1983-02-14 1983-02-14 電子部品の負荷試験装置

Publications (2)

Publication Number Publication Date
JPS59147278A true JPS59147278A (ja) 1984-08-23
JPH0129426B2 JPH0129426B2 (enExample) 1989-06-09

Family

ID=12059861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58021612A Granted JPS59147278A (ja) 1983-02-14 1983-02-14 電子部品の負荷試験装置

Country Status (1)

Country Link
JP (1) JPS59147278A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61203372U (enExample) * 1985-06-12 1986-12-20
JPS62199682U (enExample) * 1986-06-09 1987-12-19
CN109444593A (zh) * 2018-11-21 2019-03-08 科大智能电气技术有限公司 一种配电终端带载性能的自动化测试系统和方法
CN114740391A (zh) * 2022-03-18 2022-07-12 成都飞机工业(集团)有限责任公司 一种飞机电源瞬变信号测试装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55101062A (en) * 1979-01-29 1980-08-01 Toshiba Corp Method and device for testing environment of electronic equipment

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55101062A (en) * 1979-01-29 1980-08-01 Toshiba Corp Method and device for testing environment of electronic equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61203372U (enExample) * 1985-06-12 1986-12-20
JPS62199682U (enExample) * 1986-06-09 1987-12-19
CN109444593A (zh) * 2018-11-21 2019-03-08 科大智能电气技术有限公司 一种配电终端带载性能的自动化测试系统和方法
CN109444593B (zh) * 2018-11-21 2021-04-06 科大智能电气技术有限公司 一种配电终端带载性能的自动化测试系统和方法
CN114740391A (zh) * 2022-03-18 2022-07-12 成都飞机工业(集团)有限责任公司 一种飞机电源瞬变信号测试装置

Also Published As

Publication number Publication date
JPH0129426B2 (enExample) 1989-06-09

Similar Documents

Publication Publication Date Title
CN104678285B (zh) 搬送载体及器件搬送装置
JP2013137286A (ja) 電子部品試験装置
US5397998A (en) Burn-in apparatus
JPH0249574Y2 (enExample)
KR20160129540A (ko) 반도체소자 테스트용 핸들러
JP5967508B1 (ja) 搬送ユニット及びプローバ
JP6681572B2 (ja) 搬送ユニット及びプローバ
JPS59147278A (ja) 電子部品の負荷試験装置
TW513549B (en) Highly effective cooling type thermal treatment unit
JP2013137285A (ja) ピッチ変更装置、電子部品ハンドリング装置、及び電子部品試験装置
JP5961286B2 (ja) 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置
CN113960386B (zh) 电子部件处理装置以及电子部件试验装置
KR100926048B1 (ko) 엘시디 인버터 기판 자동 에이징 시험장치
JPS59184871A (ja) 電子部品の負荷試験装置
JPH04230B2 (enExample)
CN114035009B (zh) 电子部件处理装置及电子部件试验装置
JP3356009B2 (ja) Icデバイスの試験装置
JP3254775B2 (ja) Icデバイスの恒温試験装置
JP6011900B1 (ja) プローバ
TWM346024U (en) Carrier and aging test apparatus having same
CN219607752U (zh) 一种基于老炼炉电压恒定自行检测与稳定的调节系统
JP2004286499A (ja) バーンイン装置
CN117129721B (zh) 一种仓储式老化设备
JP4097617B2 (ja) 保管装置
JPH1138063A (ja) エージング装置