JPS5893048A - ポジ型放射線レジスト - Google Patents
ポジ型放射線レジストInfo
- Publication number
- JPS5893048A JPS5893048A JP19149081A JP19149081A JPS5893048A JP S5893048 A JPS5893048 A JP S5893048A JP 19149081 A JP19149081 A JP 19149081A JP 19149081 A JP19149081 A JP 19149081A JP S5893048 A JPS5893048 A JP S5893048A
- Authority
- JP
- Japan
- Prior art keywords
- copolymer
- resist
- methacrylate
- sensitivity
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 14
- 229920001577 copolymer Polymers 0.000 claims abstract description 30
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 claims abstract description 24
- -1 oxime methacrylate Chemical class 0.000 claims abstract description 14
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 5
- 125000001624 naphthyl group Chemical group 0.000 claims description 3
- 238000007334 copolymerization reaction Methods 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 25
- 238000001312 dry etching Methods 0.000 abstract description 12
- 239000003999 initiator Substances 0.000 abstract description 3
- 125000002252 acyl group Chemical group 0.000 abstract 2
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2,2'-azo-bis-isobutyronitrile Substances N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 description 13
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 12
- 239000004926 polymethyl methacrylate Substances 0.000 description 12
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 150000002923 oximes Chemical class 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 239000000178 monomer Substances 0.000 description 4
- QSJXEFYPDANLFS-UHFFFAOYSA-N Diacetyl Chemical group CC(=O)C(C)=O QSJXEFYPDANLFS-UHFFFAOYSA-N 0.000 description 3
- FSEUPUDHEBLWJY-HWKANZROSA-N diacetylmonoxime Chemical compound CC(=O)C(\C)=N\O FSEUPUDHEBLWJY-HWKANZROSA-N 0.000 description 3
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000012662 bulk polymerization Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- RCJVRSBWZCNNQT-UHFFFAOYSA-N dichloridooxygen Chemical compound ClOCl RCJVRSBWZCNNQT-UHFFFAOYSA-N 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- VHRYZQNGTZXDNX-UHFFFAOYSA-N methacryloyl chloride Chemical compound CC(=C)C(Cl)=O VHRYZQNGTZXDNX-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- DNYZBFWKVMKMRM-UHFFFAOYSA-N n-benzhydrylidenehydroxylamine Chemical compound C=1C=CC=CC=1C(=NO)C1=CC=CC=C1 DNYZBFWKVMKMRM-UHFFFAOYSA-N 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- YIWGJFPJRAEKMK-UHFFFAOYSA-N 1-(2H-benzotriazol-5-yl)-3-methyl-8-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carbonyl]-1,3,8-triazaspiro[4.5]decane-2,4-dione Chemical compound CN1C(=O)N(c2ccc3n[nH]nc3c2)C2(CCN(CC2)C(=O)c2cnc(NCc3cccc(OC(F)(F)F)c3)nc2)C1=O YIWGJFPJRAEKMK-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 1
- 206010034972 Photosensitivity reaction Diseases 0.000 description 1
- 206010070834 Sensitisation Diseases 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- AOJOEFVRHOZDFN-UHFFFAOYSA-N benzyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1=CC=CC=C1 AOJOEFVRHOZDFN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000013065 commercial product Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007033 dehydrochlorination reaction Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 150000004702 methyl esters Chemical group 0.000 description 1
- IIXYEVUNJFXWEB-UHFFFAOYSA-N n-hydroxy-2-methylprop-2-enamide Chemical compound CC(=C)C(=O)NO IIXYEVUNJFXWEB-UHFFFAOYSA-N 0.000 description 1
- 125000003544 oxime group Chemical group 0.000 description 1
- UGFMBZYKVQSQFX-UHFFFAOYSA-N para-methoxy-n-methylamphetamine Chemical compound CNC(C)CC1=CC=C(OC)C=C1 UGFMBZYKVQSQFX-UHFFFAOYSA-N 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- BOQSSGDQNWEFSX-UHFFFAOYSA-N propan-2-yl 2-methylprop-2-enoate Chemical compound CC(C)OC(=O)C(C)=C BOQSSGDQNWEFSX-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000008313 sensitization Effects 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19149081A JPS5893048A (ja) | 1981-11-27 | 1981-11-27 | ポジ型放射線レジスト |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19149081A JPS5893048A (ja) | 1981-11-27 | 1981-11-27 | ポジ型放射線レジスト |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5893048A true JPS5893048A (ja) | 1983-06-02 |
JPS6349213B2 JPS6349213B2 (enrdf_load_stackoverflow) | 1988-10-04 |
Family
ID=16275506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19149081A Granted JPS5893048A (ja) | 1981-11-27 | 1981-11-27 | ポジ型放射線レジスト |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5893048A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5514762A (en) * | 1993-03-22 | 1996-05-07 | Basf Aktiengesellschaft | Copolymerizable oxime ethers and copolymers containing them |
US6376154B2 (en) | 1996-02-26 | 2002-04-23 | Matsushita Electric Industrial Co., Ltd. | Pattern forming material and pattern forming method |
KR20110041415A (ko) * | 2009-10-15 | 2011-04-21 | 스미또모 가가꾸 가부시키가이샤 | 포토레지스트 조성물 |
-
1981
- 1981-11-27 JP JP19149081A patent/JPS5893048A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5514762A (en) * | 1993-03-22 | 1996-05-07 | Basf Aktiengesellschaft | Copolymerizable oxime ethers and copolymers containing them |
US6376154B2 (en) | 1996-02-26 | 2002-04-23 | Matsushita Electric Industrial Co., Ltd. | Pattern forming material and pattern forming method |
US6387598B2 (en) | 1996-02-26 | 2002-05-14 | Matsushita Electric Industrial Co., Ltd. | Pattern forming material and pattern forming method |
US6387592B2 (en) | 1996-02-26 | 2002-05-14 | Matsushita Electric Industrial Co., Ltd. | Pattern forming material and pattern forming method |
KR20110041415A (ko) * | 2009-10-15 | 2011-04-21 | 스미또모 가가꾸 가부시키가이샤 | 포토레지스트 조성물 |
Also Published As
Publication number | Publication date |
---|---|
JPS6349213B2 (enrdf_load_stackoverflow) | 1988-10-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA1334059C (en) | Radiation sensitive mixture and production of relief patterns | |
JPS6048022B2 (ja) | 電子感応レジスト | |
US4289842A (en) | Negative-working polymers useful as electron beam resists | |
EP0119017B1 (en) | Electron-beam and x-ray sensitive polymers and resists | |
US4594309A (en) | α,β Diketone containing polymers as positive photoresist compositions | |
JPS5893048A (ja) | ポジ型放射線レジスト | |
JPS58192035A (ja) | ネガテイブ型レジストとして有用な重合体組成物の製造方法 | |
US4556619A (en) | Negative-type acetalized polyvinyl alcohol resist sensitive to ionizing radiation | |
US4795692A (en) | Negative-working polymers useful as X-ray or E-beam resists | |
JPH087443B2 (ja) | 高解像度ポジ型放射線感応性レジスト | |
JPS63271249A (ja) | ポジ型高感度放射線感応性レジスト | |
US4568734A (en) | Electron-beam and X-ray sensitive polymers and resists | |
US4504631A (en) | Photoresist material | |
JPH01154146A (ja) | 高感度感応性放射線レジスト | |
JPH0146052B2 (enrdf_load_stackoverflow) | ||
JPS5975244A (ja) | 放射線感応性有機高分子材料 | |
US4614703A (en) | Negative photoresists of α-chlorovinyl methyl ketone copolymers | |
US4885344A (en) | Polymeric materials and their use as resists | |
JPS6349212B2 (enrdf_load_stackoverflow) | ||
JPS59192245A (ja) | レジスト材料 | |
JPS59223422A (ja) | レジスト材料 | |
JPH0449705B2 (enrdf_load_stackoverflow) | ||
JPH0377985B2 (enrdf_load_stackoverflow) | ||
JPH0450581B2 (enrdf_load_stackoverflow) | ||
JPH01217020A (ja) | ポリアクリル酸誘導体 |