JPS5890151A - 大形金属材の直接発光分光分析装置 - Google Patents

大形金属材の直接発光分光分析装置

Info

Publication number
JPS5890151A
JPS5890151A JP18886581A JP18886581A JPS5890151A JP S5890151 A JPS5890151 A JP S5890151A JP 18886581 A JP18886581 A JP 18886581A JP 18886581 A JP18886581 A JP 18886581A JP S5890151 A JPS5890151 A JP S5890151A
Authority
JP
Japan
Prior art keywords
plasma
metal material
pipe
tube
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18886581A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6214773B2 (enExample
Inventor
Akihiro Ono
小野　昭紘
Masao Saeki
佐伯　正夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP18886581A priority Critical patent/JPS5890151A/ja
Publication of JPS5890151A publication Critical patent/JPS5890151A/ja
Publication of JPS6214773B2 publication Critical patent/JPS6214773B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP18886581A 1981-11-25 1981-11-25 大形金属材の直接発光分光分析装置 Granted JPS5890151A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18886581A JPS5890151A (ja) 1981-11-25 1981-11-25 大形金属材の直接発光分光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18886581A JPS5890151A (ja) 1981-11-25 1981-11-25 大形金属材の直接発光分光分析装置

Publications (2)

Publication Number Publication Date
JPS5890151A true JPS5890151A (ja) 1983-05-28
JPS6214773B2 JPS6214773B2 (enExample) 1987-04-03

Family

ID=16231214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18886581A Granted JPS5890151A (ja) 1981-11-25 1981-11-25 大形金属材の直接発光分光分析装置

Country Status (1)

Country Link
JP (1) JPS5890151A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6113669A (en) * 1999-02-01 2000-09-05 Seltet Llc Method and apparatus for process and quality control in the production of metal
DE10155384B4 (de) * 2001-11-10 2014-12-31 Sms Siemag Aktiengesellschaft Online Qualitätskontrolle von Stranggieß-Produkten mittels Laseranalyse

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545488U (enExample) * 1977-06-14 1979-01-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545488U (enExample) * 1977-06-14 1979-01-13

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6113669A (en) * 1999-02-01 2000-09-05 Seltet Llc Method and apparatus for process and quality control in the production of metal
DE10155384B4 (de) * 2001-11-10 2014-12-31 Sms Siemag Aktiengesellschaft Online Qualitätskontrolle von Stranggieß-Produkten mittels Laseranalyse

Also Published As

Publication number Publication date
JPS6214773B2 (enExample) 1987-04-03

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