JPS5886769A - Lateral p-n-p type transistor - Google Patents
Lateral p-n-p type transistorInfo
- Publication number
- JPS5886769A JPS5886769A JP18580281A JP18580281A JPS5886769A JP S5886769 A JPS5886769 A JP S5886769A JP 18580281 A JP18580281 A JP 18580281A JP 18580281 A JP18580281 A JP 18580281A JP S5886769 A JPS5886769 A JP S5886769A
- Authority
- JP
- Japan
- Prior art keywords
- region
- type
- layer
- type semiconductor
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 33
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 239000012535 impurity Substances 0.000 claims description 8
- 239000002689 soil Substances 0.000 claims 1
- 238000009413 insulation Methods 0.000 abstract description 5
- 238000002347 injection Methods 0.000 abstract description 2
- 239000007924 injection Substances 0.000 abstract description 2
- 239000010410 layer Substances 0.000 abstract 10
- 239000002344 surface layer Substances 0.000 abstract 2
- 238000002955 isolation Methods 0.000 description 8
- 230000005684 electric field Effects 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 230000000368 destabilizing effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Transistors (AREA)
Abstract
Description
【発明の詳細な説明】 本発明は横型PNP )ランジスタに関する。[Detailed description of the invention] The present invention relates to a horizontal PNP transistor.
現在使用さhているバイポーラトランジスタは。What are the bipolar transistors currently in use?
製造技術上の容易さからNPN形が主体でおるが。The NPN type is the main type due to the ease of manufacturing technology.
PNP形を混用することにより、レベルシフト。Level shift by mixing PNP type.
位相反転などが容易になり、設計の自由度の増大。Phase inversion becomes easier, increasing the degree of freedom in design.
回路構成の簡素化などが可能となる。またNPNトラン
ジスタの負荷としてPNP ) 、yンジスタを用いふ
ことにより、消費電力の減少、集積密度の増大など数多
くの利点を有しているので、PNPトランジスタを積極
的に利用する傾向にある。It becomes possible to simplify the circuit configuration. Furthermore, by using a PNP transistor as a load for an NPN transistor, there are many advantages such as a reduction in power consumption and an increase in integration density, so there is a tendency to actively utilize PNP transistors.
NPN )ランジスタの製造プロセスのもとにおいて、
工程数を増加することなく導入できるPNPトランジス
タとして、コレクタが基板に接続され。NPN) Under the transistor manufacturing process,
The collector is connected to the substrate as a PNP transistor that can be introduced without increasing the number of steps.
エミッタを出力とする縦型PNP トランジスタとコレ
クタを出力として取り出す横型”PNP トランジスタ
が知られているが、411F殊な使用以外は横型PNP
トランジスタを用いることが多い。Vertical PNP transistors with emitter as output and horizontal PNP transistors with collector as output are known, but 411F except for special use uses horizontal PNP transistors.
Transistors are often used.
第1図に縦来の横型PNP )ランジスタの断面□□□
管示す。Figure 1 shows a cross-section of a vertical and horizontal PNP transistor □□□
Show tube.
横型PNPトランジスタは9通常のNPN )ランシス
タのベース拡散を利用して、エミッタlとコレクタ3を
同時に形成することにより作られる。A lateral PNP transistor is fabricated by simultaneously forming the emitter l and collector 3 using the base diffusion of nine conventional NPN transistors.
またNPN )ランジスタのコレクタ抵抗を減少させる
目的で導入されているN十型埋込/1ii5をエミッタ
とコレクタの底面に近接して設けている。図において2
はN生型ベース、4はN型ベース領域。Further, an N0-type buried /1ii5 introduced for the purpose of reducing the collector resistance of the NPN transistor is provided close to the bottom surfaces of the emitter and collector. In the figure 2
is the N-type base, and 4 is the N-type base region.
6はP+型絶縁分離領域、7はP型半導体基板である。6 is a P+ type insulation isolation region, and 7 is a P type semiconductor substrate.
また6には負のバイアス8が印加されている。Further, a negative bias 8 is applied to 6.
ここでPNP トランジスタにおけるN+型埋込層の働
きについて説明する。ベースとN+型埋込層の境界にけ
N+型埋込層からベースへ向かうB111t−in 電
界が存在するので、縦方向へ注入される正孔はこの電界
に妨げられてN+型埋込層に入り込むことができな−い
。したがってN+型埋込層は正孔の縦方向への無効注入
を減少させる役割ケ果たしている。Here, the function of the N+ type buried layer in the PNP transistor will be explained. Since there is a B111t-in electric field from the N+ buried layer toward the base at the boundary between the base and the N+ buried layer, holes injected in the vertical direction are blocked by this electric field and flow into the N+ buried layer. I can't get into it. Therefore, the N+ type buried layer plays the role of reducing ineffective injection of holes in the vertical direction.
バイポーラ型集積回路においては基板に負のバイアス・
電圧會印加して使用するのが通例であるから、N 型埋
込層がなければベース−基板間のN−P接合は逆バイア
スされ、縦方向に注入さhる正孔のほとんどは基板へ流
れ込んでしまう。つまり、横型PNP ) ?ンジスタ
の動作とともに、縦型PNP)、7ンジスタの動作tす
る。したがって+JHlf PNP ) ?ンジスタの
みの動作をするためには一9N型ベース領域とP型基板
の接合部分が無いようKする。すなわちN+型埋込層か
絶縁分離領域と接するように形成すれば良い。しかし第
1図に示すように通常用いられている横型PNP )ラ
ンジスタにおいては、上記の様な構造をとっていない。In bipolar integrated circuits, the substrate is negatively biased.
Since it is customary to use a voltage applied, if there is no N-type buried layer, the N-P junction between the base and the substrate will be reverse biased, and most of the holes injected in the vertical direction will be directed to the substrate. It flows into me. In other words, horizontal PNP)? Along with the operation of the transistor, the operation of the vertical PNP) and seven transistors also occurs. Therefore +JHlf PNP)? In order to operate only the transistor, the junction between the N-type base region and the P-type substrate should be eliminated. That is, it may be formed so as to be in contact with the N+ type buried layer or the insulation isolation region. However, as shown in FIG. 1, the commonly used horizontal PNP transistor does not have the above structure.
これは仮にN十型埋込層5と、絶縁分離領域6とが接し
ていれば、ベース2と基板7との接合容量が著しく増大
するとともに、ベース−基板間の耐圧が極端に低下する
からで1両者の間にはある程度の間隔を必要とする。し
たがってこのような構造の横型)’NP )ランジスタ
においテハエミッタからベースに流れる電流のhFg倍
すべてがコレクタには流れず、一部N+型埋込層と絶縁
分離領域のすき間を通って基板へ流れ込むので。This is because if the N-type buried layer 5 and the insulation isolation region 6 were in contact with each other, the junction capacitance between the base 2 and the substrate 7 would increase significantly, and the withstand voltage between the base and the substrate would be extremely reduced. 1. A certain amount of space is required between the two. Therefore, in a horizontal (NP) transistor with such a structure, all of the current flowing from the emitter to the base (hFg times) does not flow to the collector, but partially flows into the substrate through the gap between the N+ type buried layer and the insulation isolation region. .
コレクタ3には所望のコレクタ電流を得ることができな
かった。また基板に電流が流れ込むことにより基板の電
位を上昇させるので、近傍のトランジスタの動作を不安
定にさせるという欠点があった。さらに、絶縁分離領域
6とエミッタ1が接近していれば、上記6をコレクタと
するPNP )ランジスタ動作を起こす危険性があるの
で、絶縁分離領域とエミッタの間隔全充分に取る必要が
有り。A desired collector current could not be obtained in the collector 3. Furthermore, since current flows into the substrate, the potential of the substrate is increased, which has the disadvantage of destabilizing the operation of nearby transistors. Furthermore, if the isolation region 6 and the emitter 1 are close to each other, there is a risk that a PNP transistor will operate with the collector 6, so it is necessary to provide a sufficient distance between the isolation region and the emitter.
このことが素子の縮少化を難しくしていた。This makes it difficult to reduce the size of the device.
本発明は上記不都合に鑑みてなされたもので。The present invention has been made in view of the above disadvantages.
コレクタ電流の損失を無くシ、安定した横型PNPトラ
ンジスタを提供するものである。This provides a stable lateral PNP transistor that eliminates collector current loss.
本発明の特徴は、P型半導体基板と、このP型子導体基
板上に形成された高不純物濃度のN型半導体第1領域と
、このN型半導体第1領域およびP型半導体基板に接す
るように形成されたN型半導体第2領域と、このN型半
導体第2@域内に互いに分離されるように形成されたP
型半導体第1領域およびP型半導体第2領域とを含み、
そのN型半導体第2領域をベース、P型半導体第1領域
をエミッタ、P型半導体第2領域tコレクタとしf横f
JIPNPトランジスタにおいて、N型半導体第2領域
内に、P型半導体第1および第2fjl域ケとり囲み、
しかもN型半導体第1領域に接するように高不純物濃度
のN型半導体第3領域を形成した横型PNP トランジ
スタにある。The present invention is characterized by a P-type semiconductor substrate, a highly impurity-concentrated N-type semiconductor first region formed on the P-type child conductor substrate, and a region in contact with the N-type semiconductor first region and the P-type semiconductor substrate. A second N-type semiconductor region formed in the N-type semiconductor second region, and a P-type semiconductor region formed in the second N-type semiconductor region so as to be separated from each other.
a P-type semiconductor first region and a P-type semiconductor second region;
The second N-type semiconductor region is the base, the first P-type semiconductor region is the emitter, the second P-type semiconductor region is the collector, and the width is f.
In the JIPNP transistor, in the N-type semiconductor second region, surrounding the P-type semiconductor first and second fjl regions,
Moreover, the present invention is a lateral PNP transistor in which a third N-type semiconductor region with a high impurity concentration is formed so as to be in contact with the first N-type semiconductor region.
以下、実施例によりこの発明を具体的に説明する。EXAMPLES The present invention will be specifically described below with reference to Examples.
第2図(atは本発明の実施例を示す横型PNP トラ
ンジスタの断面図であり、第2図(b)はその平面図で
ある。FIG. 2(at) is a sectional view of a lateral PNP transistor showing an embodiment of the present invention, and FIG. 2(b) is a plan view thereof.
第2図(a)において101,102,103は本発明
における横型PNP)?ンジスタのエミッタ、ベース、
コレクタを示し、 104はベース領域、105はN十
型埋込層、 106けP型絶縁分離領域、107FiP
型基板會示す。また106には負のバイアス10Bが印
加されている。従来のPNP トランジスタとの異なる
点は、エミッタlotコレクタ103を取り囲む形でN
+型不純物109がN+型埋込層105に達するように
拡散さhていることであZ0このN+型不純物109は
横型PNP )ランジスタの動作においてN+型埋込層
と同様の働き管する。In FIG. 2(a), 101, 102, and 103 are horizontal PNPs in the present invention)? emitter, base,
It shows a collector, 104 is a base region, 105 is an N-type buried layer, 106 is a P-type isolation region, 107 is a FiP
Type board meeting is shown. Further, a negative bias 10B is applied to 106. The difference from the conventional PNP transistor is that the N
Since the +-type impurity 109 is diffused to reach the N+-type buried layer 105, the N+-type impurity 109 functions similarly to the N+-type buried layer in the operation of a lateral PNP transistor.
すなわち、ベース領域104とN十不純物109との電
界にはN+型不純物からベースへ向かうBuilt−i
n電界が存在するので、正孔はこの電界に妨けらh正孔
の基板107、絶縁分離領域106への無効注入tit
とんど無くすることができる。That is, the electric field between the base region 104 and the N+ impurity 109 has a built-in electric field directed from the N+ type impurity toward the base.
Since the electric field exists, the holes are prevented from being ineffectively injected into the substrate 107 and the isolation region 106 by the electric field.
It can be completely eliminated.
したがってベース電流のhFE倍すべてをコレクタ電流
として取り出すことが可能となり、コレクタ103には
所望の出力を得ることができる。Therefore, it is possible to extract all hFE times the base current as a collector current, and a desired output can be obtained from the collector 103.
また109のようなN+型不純物を、通常のPNPトラ
ンジスタのコレクタ抵抗管減少させる目的で導入してい
るプロセスにおいては、本発明の横型PNPト9ンジス
タ會プロセスの工程数を増加することなく形成すること
ができる。Furthermore, in a process in which an N+ type impurity such as 109 is introduced for the purpose of reducing the collector resistance of a normal PNP transistor, the lateral PNP transistor of the present invention can be formed without increasing the number of process steps. be able to.
以上の説明の如く、本発明の横型PNP )7ンジスタ
によれは、安定したPNP トランジスタ動作を得られ
る。また、NPN )ランジスタ等と混用することKよ
り、PNP )ランジスタの機能を最大限に利用するこ
とが可能となり、その効果は大きい。As explained above, the lateral PNP transistor of the present invention provides stable PNP transistor operation. In addition, since it is mixed with NPN) transistors, etc., it becomes possible to utilize the functions of PNP) transistors to the maximum extent, which has a great effect.
第1図は従来の横型PNPトランジスタを集積化した場
合の断面図、第2図(a)および第2図(b)は各々本
発明の横型PNP トランジスタの実施例管示す断面図
および平面図である。
なお図において、 l 、 101 、101’・・
団・エミッタ、2,102・・・・・・ベース、3,1
03,103’・・ヤ・・・コレクタ、4,104・・
団N Wエピタキシャル層(ベース領域)、5,105
・・・・・・N+型埋込層、6゜106・・・・・パP
型絶鍬分離領域、7,107・・・・・・P型基板、8
,108・・・・・・負のバイアス電圧、109゜10
9′・・・・・・N生型不純物、である。
第2図(t))FIG. 1 is a sectional view of a conventional lateral PNP transistor integrated, and FIGS. 2(a) and 2(b) are a sectional view and a plan view showing an embodiment of the lateral PNP transistor of the present invention, respectively. be. In the figure, l, 101, 101'...
Group/emitter, 2,102...Base, 3,1
03,103'...Ya...Collector, 4,104...
Group NW epitaxial layer (base region), 5,105
...N+ type buried layer, 6゜106...PaP
Type separation area, 7,107...P type substrate, 8
, 108... Negative bias voltage, 109°10
9'...N native impurity. Figure 2 (t))
Claims (1)
不純物@IのN型半導体第1領域と、該N型半導体第1
領域および前記P型半導体基板に接するように形成され
た・N型半導体第2領域と。 該N型半導体第2領域内に互いに分離されるように形成
されたP型半導体第1領域およびP型半導体第2領域と
を含み、前記N型半導体第2領域をベース、P型半導体
第1領域をエミッタ、P型半導体第2領域をコレクタと
した横型PNP トランジスタにおいて、前記N型半導
体@2領域内に。 前記P型半導体第1および第2領域をとり囲み。 しかも前記N型半導体第1領域に接するように高不紳物
隋良のN型半導体第3領域を形成したことを特徴とする
横a!!PNP)シンジスタ。[Claims] A P-type semiconductor substrate, a highly impurity @I N-type semiconductor first region completely formed in the P-type semiconductor substrate, and a first N-type semiconductor region formed in the P-type semiconductor substrate soil.
and an N-type semiconductor second region formed so as to be in contact with the P-type semiconductor substrate. The second N-type semiconductor region includes a first P-type semiconductor region and a second P-type semiconductor region formed to be separated from each other, and the second N-type semiconductor region is used as a base, and the first P-type semiconductor region is formed as a base. In a lateral PNP transistor in which the region is an emitter and the P-type semiconductor second region is a collector, the N-type semiconductor @2 region is used. surrounding the P-type semiconductor first and second regions; Moreover, the horizontal a! ! PNP) syndista.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18580281A JPS5886769A (en) | 1981-11-19 | 1981-11-19 | Lateral p-n-p type transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18580281A JPS5886769A (en) | 1981-11-19 | 1981-11-19 | Lateral p-n-p type transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5886769A true JPS5886769A (en) | 1983-05-24 |
Family
ID=16177137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18580281A Pending JPS5886769A (en) | 1981-11-19 | 1981-11-19 | Lateral p-n-p type transistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5886769A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6373663A (en) * | 1986-09-17 | 1988-04-04 | Sanyo Electric Co Ltd | Lateral transistor |
-
1981
- 1981-11-19 JP JP18580281A patent/JPS5886769A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6373663A (en) * | 1986-09-17 | 1988-04-04 | Sanyo Electric Co Ltd | Lateral transistor |
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