JPS5883433A - 論理レベル検出器 - Google Patents

論理レベル検出器

Info

Publication number
JPS5883433A
JPS5883433A JP57191745A JP19174582A JPS5883433A JP S5883433 A JPS5883433 A JP S5883433A JP 57191745 A JP57191745 A JP 57191745A JP 19174582 A JP19174582 A JP 19174582A JP S5883433 A JPS5883433 A JP S5883433A
Authority
JP
Japan
Prior art keywords
data
signal
state
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57191745A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0231895B2 (enrdf_load_stackoverflow
Inventor
Fuiruuzu Kamuran
カムラン・フイル−ズ
Aaru Haautsudo Bansu
バンス・ア−ル・ハ−ウツド
Shii Iritsuku Jiyunia Robaato
ロバ−ト・シ−・イリツク・ジユニア
Tei Kurutsuku Deibitsudo
デイビツド・テイ・クルツク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Publication of JPS5883433A publication Critical patent/JPS5883433A/ja
Publication of JPH0231895B2 publication Critical patent/JPH0231895B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Engineering & Computer Science (AREA)
  • Logic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
JP57191745A 1981-11-05 1982-10-29 論理レベル検出器 Granted JPS5883433A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US31852981A 1981-11-05 1981-11-05
US318529 1981-11-05

Publications (2)

Publication Number Publication Date
JPS5883433A true JPS5883433A (ja) 1983-05-19
JPH0231895B2 JPH0231895B2 (enrdf_load_stackoverflow) 1990-07-17

Family

ID=23238562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57191745A Granted JPS5883433A (ja) 1981-11-05 1982-10-29 論理レベル検出器

Country Status (1)

Country Link
JP (1) JPS5883433A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GR880100153A (el) * 1987-03-11 1989-01-31 Grumman Aerospace Corp Δοκιμαστης κυκλωματος τριων καταστασεων

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GR880100153A (el) * 1987-03-11 1989-01-31 Grumman Aerospace Corp Δοκιμαστης κυκλωματος τριων καταστασεων
EP0317578A4 (en) * 1987-03-11 1989-10-24 Grumman Aerospace Corp THREE-LEVEL SWITCH TEST DEVICE.

Also Published As

Publication number Publication date
JPH0231895B2 (enrdf_load_stackoverflow) 1990-07-17

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