JPH0231895B2 - - Google Patents
Info
- Publication number
- JPH0231895B2 JPH0231895B2 JP57191745A JP19174582A JPH0231895B2 JP H0231895 B2 JPH0231895 B2 JP H0231895B2 JP 57191745 A JP57191745 A JP 57191745A JP 19174582 A JP19174582 A JP 19174582A JP H0231895 B2 JPH0231895 B2 JP H0231895B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- signal
- test
- state
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims abstract description 102
- 230000007704 transition Effects 0.000 claims description 48
- 230000003111 delayed effect Effects 0.000 claims description 11
- 238000013459 approach Methods 0.000 claims description 4
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 8
- 230000008859 change Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 16
- 238000000034 method Methods 0.000 description 14
- 238000005259 measurement Methods 0.000 description 10
- 230000001934 delay Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 230000001960 triggered effect Effects 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Engineering & Computer Science (AREA)
- Logic Circuits (AREA)
- Manipulation Of Pulses (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US31852981A | 1981-11-05 | 1981-11-05 | |
US318529 | 1981-11-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5883433A JPS5883433A (ja) | 1983-05-19 |
JPH0231895B2 true JPH0231895B2 (enrdf_load_stackoverflow) | 1990-07-17 |
Family
ID=23238562
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57191745A Granted JPS5883433A (ja) | 1981-11-05 | 1982-10-29 | 論理レベル検出器 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5883433A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4743842A (en) * | 1987-03-11 | 1988-05-10 | Grumman Aerospace Corporation | Tri-state circuit tester |
-
1982
- 1982-10-29 JP JP57191745A patent/JPS5883433A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5883433A (ja) | 1983-05-19 |
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