JPS5876709A - ナイフマ−ク検査機 - Google Patents

ナイフマ−ク検査機

Info

Publication number
JPS5876709A
JPS5876709A JP17537281A JP17537281A JPS5876709A JP S5876709 A JPS5876709 A JP S5876709A JP 17537281 A JP17537281 A JP 17537281A JP 17537281 A JP17537281 A JP 17537281A JP S5876709 A JPS5876709 A JP S5876709A
Authority
JP
Japan
Prior art keywords
light
knife mark
projector
receiver
knife
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17537281A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6351482B2 (enrdf_load_stackoverflow
Inventor
Yutaka Abe
豊 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP17537281A priority Critical patent/JPS5876709A/ja
Publication of JPS5876709A publication Critical patent/JPS5876709A/ja
Publication of JPS6351482B2 publication Critical patent/JPS6351482B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacture Of Wood Veneers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP17537281A 1981-10-31 1981-10-31 ナイフマ−ク検査機 Granted JPS5876709A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17537281A JPS5876709A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検査機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17537281A JPS5876709A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検査機

Publications (2)

Publication Number Publication Date
JPS5876709A true JPS5876709A (ja) 1983-05-09
JPS6351482B2 JPS6351482B2 (enrdf_load_stackoverflow) 1988-10-14

Family

ID=15994939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17537281A Granted JPS5876709A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検査機

Country Status (1)

Country Link
JP (1) JPS5876709A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167865A (ja) * 1983-03-11 1984-09-21 Mitsubishi Electric Corp 磁気録画再生装置のテ−プ停止位置検知装置
JPS59167866A (ja) * 1983-03-11 1984-09-21 Mitsubishi Electric Corp 磁気録画再生装置のテ−プ停止位置検知装置
JPS59201258A (ja) * 1983-04-29 1984-11-14 Mitsubishi Electric Corp 磁気テ−プ停止位置検知装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167865A (ja) * 1983-03-11 1984-09-21 Mitsubishi Electric Corp 磁気録画再生装置のテ−プ停止位置検知装置
JPS59167866A (ja) * 1983-03-11 1984-09-21 Mitsubishi Electric Corp 磁気録画再生装置のテ−プ停止位置検知装置
JPS59201258A (ja) * 1983-04-29 1984-11-14 Mitsubishi Electric Corp 磁気テ−プ停止位置検知装置

Also Published As

Publication number Publication date
JPS6351482B2 (enrdf_load_stackoverflow) 1988-10-14

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