JPS5842472A - Thermal head - Google Patents

Thermal head

Info

Publication number
JPS5842472A
JPS5842472A JP56140653A JP14065381A JPS5842472A JP S5842472 A JPS5842472 A JP S5842472A JP 56140653 A JP56140653 A JP 56140653A JP 14065381 A JP14065381 A JP 14065381A JP S5842472 A JPS5842472 A JP S5842472A
Authority
JP
Japan
Prior art keywords
carbon
thermal head
wear
plasma
heating element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56140653A
Other languages
Japanese (ja)
Other versions
JPS6153955B2 (en
Inventor
Shunpei Yamazaki
舜平 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP56140653A priority Critical patent/JPS5842472A/en
Publication of JPS5842472A publication Critical patent/JPS5842472A/en
Publication of JPS6153955B2 publication Critical patent/JPS6153955B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N97/00Electric solid-state thin-film or thick-film devices, not otherwise provided for

Abstract

PURPOSE:To obtain a thermal head having excellent heat conductivity and excellent wear resistance and suitable for heat-sensitive recording by providing a carbon or carbon-based wear-resistant layer on a heating element layer on a base plate. CONSTITUTION:On a heating element layer 4 on a base plate 1, a carbon or carbon-based wear-resistant layer 5 is formed by a plasma gaseous phase method. In short, plasma is generated by producing glow or arc discharge by the addition of an electromagnetic energy of DC high-frequency (500kHz-50MHz) or micro-wave frequency (2.45GHz) under a reduced pressure of 0.01-10torr to activate and decomposite reactive gas, e.g., such hydrocarbon bases as ethylene, propane, etc., and thereby a film made of non-crystalline or semi-noncrystalline insulating carbon of based on a carbon containing 30mol% or less H and Si is formed.

Description

【発明の詳細な説明】 本発明は感熱記録用サーマルヘッドに関するもので、特
に耐摩耗層を熱伝導率が固体中で最大であり最も耐摩耗
性を有する炭素捷たは炭素を主成分とする材料によシ設
けることを目的としている。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thermal head for heat-sensitive recording, and in particular, the wear-resistant layer is mainly composed of carbon fiber or carbon, which has the highest thermal conductivity among solids and is the most wear-resistant. The purpose is to provide a barrier to the material.

本発明は発熱体層を非晶質(アモルファス以下Asとい
う)または95〜20OAの大きさの微結晶性を有する
半非晶質(セミアモルファス以下SASという)の如き
プラズマ気相法による100〜450oC好マシくハ2
00〜350DCの低温で形成する珪素または炭素を主
成分とする材料により設けることを目的としている。
In the present invention, the heating element layer is made of an amorphous (hereinafter referred to as amorphous) or a semi-amorphous (hereinafter referred to as SAS) having microcrystallinity of a size of 95 to 20 OA by plasma vapor phase heating at a temperature of 100 to 450oC. Good luck ha2
It is intended to be provided using a material whose main component is silicon or carbon, which is formed at a low temperature of 00 to 350 DC.

本発明はかかる耐摩耗層または発熱層がプラズマ気相法
すなわち0.01〜10torrの減圧下にて直流、高
周波(500KM2〜50MH2)またはマイクロ波(
例えば2゜45GHz)の周波数の電磁エネルギを加え
てグローまたはアーク放電を発生させてプラズマ化し、
かかる電磁エネルギにより気化した反応性気体例えばエ
チレン、プロパン等の炭化水素ガスを活性化、分解せし
めることによりAS寸たはSASの絶縁性の炭素または
炭素中に水素、珪素が30モルチ以下て含有した炭素を
主成分とする被膜を形成せんとするものである。
In the present invention, the wear-resistant layer or heat-generating layer is formed using a plasma vapor phase method, that is, under a reduced pressure of 0.01 to 10 torr, using direct current, high frequency (500 KM2 to 50 MH2) or microwave (
For example, by applying electromagnetic energy at a frequency of 2°45 GHz), a glow or arc discharge is generated to generate plasma,
By activating and decomposing the vaporized reactive gases such as hydrocarbon gases such as ethylene and propane by such electromagnetic energy, hydrogen and silicon are contained in the insulating carbon or carbon of the AS dimension or SAS in an amount of 30 mole or less. The purpose is to form a film whose main component is carbon.

本発明1はかかるプラズマ気相法KJこり形成した炭素
はそのエネルギバンド巾が2゜3eV以上代表的には3
eVを有する絶縁体でありかつその熱伝導率は2.5殿
代表的には5゜0 (W/cm deg)とダイヤモン
ド の6.60 (W/cm 60g)に近いきわめて
すぐれた高い値を有する。
The present invention 1 is characterized in that the carbon formed by plasma vapor phase method KJ has an energy band width of 2°3 eV or more, typically 3.
It is an insulator with eV and its thermal conductivity is typically 5°0 (W/cm deg), which is an extremely high value close to 6.60 (W/cm 60g) of diamond. have

さらVcンツカース硬度a5ooxg/旧;薯以上代表
的には6500Kg/T1m’というダイヤモンド類似
の硬さを有するきわめてすぐれた特性を見出しかかる特
性をサーマルヘッドに適用してすぐれた耐摩耗性、感熱
高速応答性を有せしめたものである。
In addition, we have found extremely excellent properties with hardness similar to diamond, typically 6500 kg/T1 m', and applied these properties to the thermal head to achieve excellent wear resistance and high-speed heat-sensitive response. It is something that has a certain sexuality.

さらに本発明はかかるASiたはSASの450°C以
下で作られた炭素中に■価または7価の不有せしめるこ
とができる。そのためとの場合は発熱素子として用い、
さらにその機械的特質より耐摩耗層を必ずしも形成させ
る必要が々いなどの特性を有せしめることができるとい
う他の特徴を有する。
Further, according to the present invention, the carbon produced at 450° C. or lower in ASi or SAS can be made to have no valent or heptavalent. For that purpose, use it as a heating element,
Furthermore, due to its mechanical properties, it has other characteristics such that it is not necessarily necessary to form a wear-resistant layer.

本発明はさらに耐摩耗層を減圧状態のプラズマ気相法に
用いるため、発熱層の側部に対しても上面と同様の厚さ
で保獲することができる。
Furthermore, since the present invention uses the wear-resistant layer in a plasma vapor phase method under reduced pressure, it is possible to retain the same thickness on the sides of the heat generating layer as on the top surface.

そのためこれ丑でスパッタ法、常圧気相法等で作られた
場合、この側面をおおうために結果として耐摩耗層を上
面の厚さ2μ以上(側面の厚さ0.2μ以上)を必要と
した。しかし本発明においては上面も側面も0゜]−〇
。3μあれば十分であり、結果として厚さが約コ/10
になったため、さらに感熱の応答速度を向上させること
ができるように々つだ。
Therefore, when this material is made by sputtering, normal pressure vapor phase, etc., a wear-resistant layer with a thickness of 2 μm or more on the top surface (0.2 μm or more on the side surfaces) is required to cover the side surfaces. . However, in the present invention, both the top and side surfaces are 0°]-〇. 3μ is sufficient, resulting in a thickness of about 1/10
This makes it possible to further improve the thermal response speed.

本発明において反応性気体は炭化水素例えばエチレン(
0,HDメタン系炭化水素(0,H,、Ω等の気体また
は珪素を一部に含んだ場合はテトラメチルシラン((C
H,C4S])、テトラエチルシラン((QえQ S 
1)等を用いてもよい。前者にあっては炭素に水素が3
0モル%以下特K SASとすると0.0]〜5モル%
と低く存在しつつも炭素同志の共有結合が強くダイヤモ
ンドと類似の物性を有していた。また後者にあっては水
素が0.01〜20モル係を含み、さらに珪素を炭素の
1/3〜以下に図面に従って実施例を示す。
In the present invention, the reactive gas is a hydrocarbon such as ethylene (
0,HD Methane-based hydrocarbons (0,H, Ω, etc.) or tetramethylsilane ((C
H, C4S]), tetraethylsilane ((QeQ S
1) etc. may also be used. In the former case, carbon and hydrogen are 3
0 mol% or less Special K SAS 0.0] to 5 mol%
Although the carbon content was low, the covalent bond between carbon atoms was strong and it had physical properties similar to those of diamond. In the latter case, hydrogen is contained in a proportion of 0.01 to 20 molar proportions, and silicon is contained in a proportion of 1/3 to 1/3 or less of that of carbon, as shown in the drawings.

第1図は本発明に用いられたザーマルプリンタのたて断
面図を示す。第1図(B)は第1図(A)のA −−A
’の断面を示す。(0)はB −B’の断面を示す。
FIG. 1 shows a vertical sectional view of a thermal printer used in the present invention. Figure 1 (B) is A--A of Figure 1 (A).
' shows a cross section. (0) shows the cross section along B-B'.

図面において基板特にセラミック基板上にグレイズドさ
れたガラス層(2)、発熱体層(4)、電極(4)、耐
摩耗層(5)が積層して設けられている。また第1図(
0)に示す如く、感熱紙がこすられる部分は発熱体層(
3)上に接してi=1摩耗層(5)が設けられている。
In the drawing, a glazed glass layer (2), a heating element layer (4), an electrode (4), and an abrasion-resistant layer (5) are laminated on a substrate, particularly a ceramic substrate. Also, Figure 1 (
As shown in 0), the part where the thermal paper is rubbed is covered with a heating element layer (
3) An i=1 wear layer (5) is provided in contact with the top.

本発明はこの耐摩耗層(5)を炭素丑たは炭素を主成分
とした材料とし、この材料をプラズマ気相法により形成
するため、第1図(B)、(0)に示す如く、発熱体層
の側部の厚さが発熱体層上面の厚さを概略一致させるこ
とができるという特徴を有する。
In the present invention, the wear-resistant layer (5) is made of carbon or a material mainly composed of carbon, and this material is formed by a plasma vapor phase method. A feature is that the thickness of the side portions of the heat generating layer can be made approximately equal to the thickness of the top surface of the heat generating layer.

これは減圧下(0,01〜IC1torr)であり、反
応性気体の平均自由行程が長くなり気相法を行うに際し
ても側辺へのまわりこみが大きいためである。加えてプ
ラズマ化シ゛ 痙が枦へ反応性気体同志に大きな運動エネルギを与えて
互いに衝突させ、四方六方への飛しようを促しているこ
とにある。
This is because the reaction gas is under reduced pressure (0.01 to IC1 torr), and the mean free path of the reactive gas is long, so that even when performing a gas phase method, there is a large amount of wraparound to the sides. In addition, the plasma convulsion imparts a large amount of kinetic energy to the reactive gases that cause them to collide with each other, prompting them to fly in all directions.

耐摩耗層に関しては、以下の如くにして作製した。すな
わち被形成面を有する基板を反応容器内に封入し、この
反応容器を10tOrrまで真空引きをするとともに、
この基板を加熱炉によリ100〜450’O好捷しくけ
200〜350°C例えば300°Cに加熱した。この
後この雰囲気中に水素へリュームを導入し、1O−10
torrにした後誘μ 導方式または  結合方式により電磁エネルギを加えた
。例えば]、 3−56 MHz% 50〜500 W
とし、その実質的な電極間1叫は15〜150cmと長
くした。それはプラズマ化した時の反応性気いエネルギ
を力え、炭素同志互いに共有結合をさせるためである。
Regarding the wear-resistant layer, it was produced as follows. That is, a substrate having a surface to be formed is sealed in a reaction container, and the reaction container is evacuated to 10 tOrr.
This substrate was heated to 200 to 350°C, for example 300°C, in a heating furnace at 100 to 450°C. After this, hydrogen gas was introduced into this atmosphere, and 1O-10
After setting it to torr, electromagnetic energy was applied using an induction method or a coupling method. For example], 3-56 MHz% 50-500 W
The actual distance between the electrodes was set to 15 to 150 cm. This is because the reactive energy generated when the carbon is turned into plasma is used to covalently bond the carbon atoms to each other.

形成された被膜に関して出力が50〜150WKてはA
sが250〜500WではSASハその中間ではそれら
が混合した構造が電子線回折では観察された。
If the output of the formed film is 50 to 150WK, it is A.
When s was 250 to 500 W, a structure in which SAS was mixed with SAS was observed in electron beam diffraction.

さらにこのプラズマ化した雰囲気に対し、炭化物気体例
えばメチレンまたはプロパンを導入した。するとこの反
応性気体が脱水素化し、炭素の結合が互いに共有結合し
合って、被形成面に炭素被膜を形成させることができた
Furthermore, a carbide gas such as methylene or propane was introduced into this plasma atmosphere. Then, this reactive gas was dehydrogenated, and the carbon bonds were covalently bonded to each other, making it possible to form a carbon film on the surface to be formed.

基板の温度が100−200’Oにては、硬度が弱干低
く、まだ基板への密着性が必ずしも好ましいものではな
かったが、200″′C以上特に250〜350°C(
/Cおいては、きわめて安定な強い被形成面への密着性
を有していた。
When the temperature of the substrate was 100-200'O, the hardness was slightly low and the adhesion to the substrate was not necessarily favorable, but when the temperature of the substrate was 200''C or higher, especially 250-350°C (
/C had extremely stable and strong adhesion to the surface on which it was formed.

加熱温度(/1450’o以上にすると、基板との熱膨
張係数の差によりストレスが内在してしまい問題があり
、250〜450”Cで形成された被膜が理想的な耐摩
耗材料であった。
If the heating temperature is higher than /1450'o, stress will be generated due to the difference in thermal expansion coefficient with the substrate, creating a problem, so a coating formed at 250 to 450'C is an ideal wear-resistant material. .

出発膜質をTMS ((OH,) Si)、T E S
 ((OLIQ、 S i)を用いると、形成された被
膜には珪素が15〜30Y子チ含まれる主成分が炭素の
被膜であった。これでも炭素のみと同様の硬度があった
The starting film quality was TMS ((OH,)Si), TES
(When (OLIQ, Si) was used, the formed film contained 15 to 30 Y of silicon and was mainly composed of carbon. Even this film had the same hardness as carbon alone.

熱伝導度は炭素のみが5W/cm degであったが2
〜3W/cm clegと少なかった。
Only carbon had a thermal conductivity of 5 W/cm deg, but 2
It was as low as ~3 W/cm cleg.

以上の如くにして形成された炭素被膜は帆05〜0.2
μの厚さすなわち従来の115〜1/10の薄さであっ
ても〕−04時間以上の使用に而」える耐摩耗性を有し
ていた。
The carbon film formed as described above has a sail size of 05 to 0.2
Even if the thickness was 115 to 1/10 of the conventional thickness, it had wear resistance that could be used for more than 4 hours.

実施例2 この実施例は実施例1と同様の硬度のサーマルプリンタ
を実施例1と同様のプラズマ気相法を用いて発熱体層を
形成させた場合である。
Example 2 In this example, a heat generating layer was formed using a thermal printer having the same hardness as in Example 1 using the same plasma vapor phase method as in Example 1.

その製造は実施例1と同様の条件のプラズマ気4目法と
した。しかし形成される被膜が導電性(抵抗性)捷たけ
半導体性であることを必要とするため、形成された被膜
は■価またはV価の不純物例えばホウ素、またはリンを
添加しないを形成ぜしめた。
The production was carried out using the plasma gas method under the same conditions as in Example 1. However, since it is necessary for the film to be formed to be conductive (resistive) and semiconductive, the film formed does not contain valent or V-valent impurities such as boron or phosphorous. .

すなわちf’+4の珪素被膜に関しては、出発物質をシ
ラン(S i n Hzl、2 、n之l)、四フッ化
珪素を用い、同様のコ○O〜4500C例えば200−
350°Cにて形成させた。高周波エネルギは13.5
6MHzを10〜50WとしてAJiたは50〜20o
wとして(9) SASを形成させた。1「価の不純物は例えばホウ素を
BJ(、を用いて、またV価の不純物は例えばリンをP
H,を用いて前記した比の如く微少々ドープ寸たけノン
ドープをして用いた。形成された被膜中に水素が20モ
ル係以下に含有したが発熱させることによりそれらは外
部に放出されてしまった。
That is, for the silicon film of f'+4, silane (S in Hzl, 2, nl) and silicon tetrafluoride are used as the starting materials, and similar coatings are prepared using
It was formed at 350°C. High frequency energy is 13.5
AJi or 50-20o with 6MHz as 10-50W
(9) SAS was formed as w. 1 valence impurity, for example, boron using BJ
H, was used after being slightly doped and non-doped as shown in the above ratio. Although hydrogen was contained in the formed film in an amount of 20 molar or less, it was released to the outside by generating heat.

丑だ炭素匠おいては、実施例1と同様のメチレンを用い
た。ここK BJ(,10占=0.01〜3%、pry
’CtHt・0.01〜3条として形成させた。その結
果電気伝導度は]0〜10 (−0,c m)’が得ら
れた。
At Ushida Carbon Takumi, the same methylene as in Example 1 was used. Here K BJ (, 10 fortune = 0.01~3%, pry
'CtHt·0.01 to 3 stripes were formed. As a result, an electrical conductivity of 0 to 10 (-0, cm) was obtained.

以上の説明より明らかな如く、本発明はそのホ 基狼累父としてプラズマ気相法を用いるため、基板温度
が100〜45o0c代表的には250〜4oo0c特
K 300°Cという従来の被膜形成方法で考えるなら
ば低い温度で可能である。特に5oo′c以下であるこ
とは基板材料としてガラスを用いる時その熱膨張の歪に
対しきわめてこれを少くし、従来の高温処理による基板
のそり等の大きな欠(lつ 点を防ぐ。とが1きえ。そ。たW−?ivプリンタの発
熱部がlrflmあたシロ本しか作れなかったが、これ
を24本Ktで高めることができるようになった。
As is clear from the above explanation, since the present invention uses a plasma vapor phase method as its main feature, the conventional film forming method requires a substrate temperature of 100 to 45°C, typically 250 to 40°C, and 300°C. If you think about it, it is possible at a low temperature. In particular, the value of 5oo'c or less greatly reduces distortion due to thermal expansion when glass is used as a substrate material, and prevents major defects such as warping of the substrate due to conventional high-temperature processing. The heat generating part of the W-?iv printer could only produce 24 units of lrflm, but now it can be increased to 24 units.

以上の説明よシ明らかな如く、本発明はそのエネルギバ
ンドri]2゜OeV以上代表的には25.5〜3eV
を有する絶縁性の透光性炭素を耐摩耗性材料として用い
たこと、さらに炭素または炭素を主成分とする抵抗体ま
たは半導体を発熱体層として用いたことを特徴としてい
る。そのために本発明はプラズマ気相法によシその一方
または双方を形成せしめ、従来の気相法で形成された温
度よりも300〜500ICも低い500’O以下の温
度で作ることができ、基板材料の選定に大きな自由度を
得、低価格化にきわめてすぐれた特徴を有していた。
As is clear from the above explanation, the present invention has an energy band r]2゜OeV or more, typically 25.5 to 3eV.
The invention is characterized in that insulating, translucent carbon having the following properties is used as the wear-resistant material, and that carbon or a resistor or semiconductor containing carbon as a main component is used as the heat generating layer. To this end, the present invention uses a plasma vapor phase method to form one or both of them, and can be formed at a temperature of 500'O or less, which is 300 to 500 IC lower than the temperature at which the substrate is formed using a conventional vapor phase method. It offered great freedom in material selection and was extremely low-cost.

本発明はプラズマ気相法を主として記した。The present invention mainly describes the plasma vapor phase method.

しかしかかる耐摩耗性が得られる限りにおいてイオンブ
レーティングその他のプラズマまたはレーザ等の電磁エ
ネルギ、光エネルギを用いてもよい。
However, as long as such wear resistance can be obtained, ion blasting, other electromagnetic energy such as plasma or laser, or optical energy may be used.

本発明の実施例においての第1図の構造はその一例を示
したもので、発熱体層を単結晶としてトランジスタ構造
であってもよく、その化シリコンメサ構造、プレナー構
造等に用いるととができる。
The structure shown in FIG. 1 in the embodiment of the present invention shows one example, and the heat generating layer may be a single crystal transistor structure, and it can be used in a silicon mesa structure, a planar structure, etc. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のサーマルプリンタのたて断面図を示す
FIG. 1 shows a vertical sectional view of the thermal printer of the present invention.

Claims (1)

【特許請求の範囲】 1、基板上の発熱体層上に炭素または炭素を主成分とす
る耐摩耗層が設けられたことを特徴とするサーマルヘッ
ド。 2 基板上に非晶質または微結晶性を有する半非晶質構
造を有する炭素または珪素を主成分とする発熱体層が設
けられたことを特徴とするサーマルヘッド。 3 特許請求の範囲第2項において、■価またはV価の
不純物が0.01〜3係添加された炭素または珪素を主
成分とする発熱体層が設けられたことを特徴とするサー
マルヘッド。 4、特許請求の範囲第1項または第2項において、水素
またはハロゲン元素が0.01〜20モル係添加された
ことを特徴とするサーマルヘッド。
[Scope of Claims] 1. A thermal head characterized in that a wear-resistant layer containing carbon or carbon as a main component is provided on a heating element layer on a substrate. 2. A thermal head characterized in that a heating element layer mainly composed of carbon or silicon and having an amorphous or microcrystalline semi-amorphous structure is provided on a substrate. 3. A thermal head according to claim 2, further comprising a heating layer mainly composed of carbon or silicon doped with 0.01 to 3 parts of a valent or V-valent impurity. 4. A thermal head according to claim 1 or 2, characterized in that hydrogen or a halogen element is added in a molar proportion of 0.01 to 20.
JP56140653A 1981-09-07 1981-09-07 Thermal head Granted JPS5842472A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56140653A JPS5842472A (en) 1981-09-07 1981-09-07 Thermal head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56140653A JPS5842472A (en) 1981-09-07 1981-09-07 Thermal head

Related Child Applications (4)

Application Number Title Priority Date Filing Date
JP62229383A Division JPS6378761A (en) 1987-09-12 1987-09-12 Preparation of thermal head
JP22938587A Division JPS63145776A (en) 1987-09-12 1987-09-12 Formation of carbon coated film
JP22938687A Division JPS6379972A (en) 1987-09-12 1987-09-12 Carbon film
JP62229384A Division JPS6372559A (en) 1987-09-12 1987-09-12 Thermal head

Publications (2)

Publication Number Publication Date
JPS5842472A true JPS5842472A (en) 1983-03-11
JPS6153955B2 JPS6153955B2 (en) 1986-11-20

Family

ID=15273645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56140653A Granted JPS5842472A (en) 1981-09-07 1981-09-07 Thermal head

Country Status (1)

Country Link
JP (1) JPS5842472A (en)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59195365A (en) * 1983-04-19 1984-11-06 Kao Corp Sliding contact parts of recording medium
JPS61189957A (en) * 1985-02-19 1986-08-23 Matsushita Electric Ind Co Ltd Thermal head
JPS634068A (en) * 1986-06-23 1988-01-09 Nec Corp Diamondlike carbon film
US4783369A (en) * 1985-03-23 1988-11-08 Canon Kabushiki Kaisha Heat-generating resistor and heat-generating resistance element using same
US4804974A (en) * 1985-03-23 1989-02-14 Canon Kabushiki Kaisha Thermal recording head
JPH01132779A (en) * 1987-11-17 1989-05-25 Nikon Corp Hard carbon film-coated metallic substrate
US4845513A (en) * 1985-03-23 1989-07-04 Canon Kabushiki Kaisha Thermal recording head
US4847639A (en) * 1985-06-10 1989-07-11 Canon Kabushiki Kaisha Liquid jet recording head and recording system incorporating the same
US4870388A (en) * 1985-03-22 1989-09-26 Canon Kabushiki Kaisha Heat-generating resistor and heat-generating resistance element using same
JPH021339A (en) * 1988-03-28 1990-01-05 Toshiba Corp Heat-resistant insulation substrate, thermal head and heat sensitive recording device
JPH02238957A (en) * 1990-01-26 1990-09-21 Semiconductor Energy Lab Co Ltd Thermal head
US4983993A (en) * 1985-03-25 1991-01-08 Canon Kabushiki Kaisha Thermal recording head
JPH0656145U (en) * 1992-12-28 1994-08-05 住金鋼材工業株式会社 Cut beam jack
US6165582A (en) * 1992-11-19 2000-12-26 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
US6171674B1 (en) * 1993-07-20 2001-01-09 Semiconductor Energy Laboratory Co., Ltd. Hard carbon coating for magnetic recording medium
US6256052B1 (en) 1998-07-21 2001-07-03 Fuji Photo Film Co., Ltd. Thermal head
US6748959B1 (en) 1999-03-26 2004-06-15 Fuji Photo Film., Ltd. Carbon layer forming method
US6805941B1 (en) 1992-11-19 2004-10-19 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
US6835523B1 (en) 1993-05-09 2004-12-28 Semiconductor Energy Laboratory Co., Ltd. Apparatus for fabricating coating and method of fabricating the coating

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63289975A (en) * 1987-05-22 1988-11-28 Ckd Corp Piezoelectric actuator
JP2002079522A (en) * 2000-06-23 2002-03-19 Hitachi Maxell Ltd Die for molding disk substrate and die for molding resin

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52143841A (en) * 1976-05-26 1977-11-30 Matsushita Electric Ind Co Ltd Thin film type thermal head
JPS5325442A (en) * 1976-08-20 1978-03-09 Matsushita Electric Ind Co Ltd Thermal print head
JPS5390943A (en) * 1977-01-20 1978-08-10 Tdk Corp Printing head of heat sesitive system
JPS5476242A (en) * 1977-11-30 1979-06-18 Namiki Precision Jewel Co Ltd Thermal head
JPS5492270A (en) * 1977-12-28 1979-07-21 Canon Inc Thermal head

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52143841A (en) * 1976-05-26 1977-11-30 Matsushita Electric Ind Co Ltd Thin film type thermal head
JPS5325442A (en) * 1976-08-20 1978-03-09 Matsushita Electric Ind Co Ltd Thermal print head
JPS5390943A (en) * 1977-01-20 1978-08-10 Tdk Corp Printing head of heat sesitive system
JPS5476242A (en) * 1977-11-30 1979-06-18 Namiki Precision Jewel Co Ltd Thermal head
JPS5492270A (en) * 1977-12-28 1979-07-21 Canon Inc Thermal head

Cited By (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59195365A (en) * 1983-04-19 1984-11-06 Kao Corp Sliding contact parts of recording medium
JPH0410124B2 (en) * 1983-04-19 1992-02-24
JPS61189957A (en) * 1985-02-19 1986-08-23 Matsushita Electric Ind Co Ltd Thermal head
US4870388A (en) * 1985-03-22 1989-09-26 Canon Kabushiki Kaisha Heat-generating resistor and heat-generating resistance element using same
US4783369A (en) * 1985-03-23 1988-11-08 Canon Kabushiki Kaisha Heat-generating resistor and heat-generating resistance element using same
US4804974A (en) * 1985-03-23 1989-02-14 Canon Kabushiki Kaisha Thermal recording head
US4845513A (en) * 1985-03-23 1989-07-04 Canon Kabushiki Kaisha Thermal recording head
US4983993A (en) * 1985-03-25 1991-01-08 Canon Kabushiki Kaisha Thermal recording head
US4847639A (en) * 1985-06-10 1989-07-11 Canon Kabushiki Kaisha Liquid jet recording head and recording system incorporating the same
JPH0558068B2 (en) * 1986-06-23 1993-08-25 Nippon Electric Co
JPS634068A (en) * 1986-06-23 1988-01-09 Nec Corp Diamondlike carbon film
JPH01132779A (en) * 1987-11-17 1989-05-25 Nikon Corp Hard carbon film-coated metallic substrate
JPH021339A (en) * 1988-03-28 1990-01-05 Toshiba Corp Heat-resistant insulation substrate, thermal head and heat sensitive recording device
JPH0575590B2 (en) * 1988-03-28 1993-10-20 Tokyo Shibaura Electric Co
JPH02238957A (en) * 1990-01-26 1990-09-21 Semiconductor Energy Lab Co Ltd Thermal head
JPH0512152B2 (en) * 1990-01-26 1993-02-17 Handotai Energy Kenkyusho
US6194047B1 (en) * 1992-11-19 2001-02-27 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
US6623836B1 (en) 1992-11-19 2003-09-23 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
US7391592B2 (en) 1992-11-19 2008-06-24 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium including a diamond-like carbon protective film and at least two additional elements
US7083873B2 (en) 1992-11-19 2006-08-01 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium including a diamond-like carbon protective film with hydrogen and at least two additional elements
US6165582A (en) * 1992-11-19 2000-12-26 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
US6805941B1 (en) 1992-11-19 2004-10-19 Semiconductor Energy Laboratory Co., Ltd. Magnetic recording medium
JPH0656145U (en) * 1992-12-28 1994-08-05 住金鋼材工業株式会社 Cut beam jack
US6835523B1 (en) 1993-05-09 2004-12-28 Semiconductor Energy Laboratory Co., Ltd. Apparatus for fabricating coating and method of fabricating the coating
US6468617B1 (en) 1993-07-20 2002-10-22 Semiconductor Energy Laboratory Co., Ltd. Apparatus for fabricating coating and method of fabricating the coating
US6183816B1 (en) 1993-07-20 2001-02-06 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating the coating
US6171674B1 (en) * 1993-07-20 2001-01-09 Semiconductor Energy Laboratory Co., Ltd. Hard carbon coating for magnetic recording medium
US7700164B2 (en) 1993-07-20 2010-04-20 Semiconductor Energy Laboratory Co., Ltd Apparatus for fabricating coating and method of fabricating the coating
US6256052B1 (en) 1998-07-21 2001-07-03 Fuji Photo Film Co., Ltd. Thermal head
US6748959B1 (en) 1999-03-26 2004-06-15 Fuji Photo Film., Ltd. Carbon layer forming method

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