JPS5834736U - semiconductor wafer - Google Patents

semiconductor wafer

Info

Publication number
JPS5834736U
JPS5834736U JP13042381U JP13042381U JPS5834736U JP S5834736 U JPS5834736 U JP S5834736U JP 13042381 U JP13042381 U JP 13042381U JP 13042381 U JP13042381 U JP 13042381U JP S5834736 U JPS5834736 U JP S5834736U
Authority
JP
Japan
Prior art keywords
semiconductor wafer
adhesive surface
metal layer
solder
junction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13042381U
Other languages
Japanese (ja)
Inventor
真 富田
Original Assignee
日本電気ホームエレクトロニクス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気ホームエレクトロニクス株式会社 filed Critical 日本電気ホームエレクトロニクス株式会社
Priority to JP13042381U priority Critical patent/JPS5834736U/en
Publication of JPS5834736U publication Critical patent/JPS5834736U/en
Pending legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)
  • Die Bonding (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、半導体ウェーハの平面図、第2図は、ウェー
ハをペレット化するブレーキング概念構成図、第3図は
、個々のペレットの斜視図、第4図は、ウェーハの概略
断面図、第5図は、この考案の一実施例を示すパワート
ランジスタ・ウェーハの断面図、第6図乃至第8図はそ
の金属層を設ける手法を示す各工程の要部断面図である
。 14.14・・・・・・素子(パワ−トランジスタ)、
20.20・・・・・・区画境界帯域、22・・・・・
・固着面、23・・・・・・露出部、24.24・曲・
金属層、25゜25・・・・・・予備半田。
FIG. 1 is a plan view of a semiconductor wafer, FIG. 2 is a conceptual block diagram of breaking to pelletize the wafer, FIG. 3 is a perspective view of each pellet, and FIG. 4 is a schematic cross-sectional view of the wafer. FIG. 5 is a sectional view of a power transistor wafer showing an embodiment of this invention, and FIGS. 6 to 8 are sectional views of essential parts of each step showing a method of providing the metal layer. 14.14... Element (power transistor),
20.20... Division boundary band, 22...
・Fixed surface, 23...Exposed part, 24.24・Curve・
Metal layer, 25°25...Preliminary solder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] PN接合を作り、多数の素子を形成し、各素子に分割す
る際に基板に固着する固着面に予備半田を付着させるも
のにおいて、前記固着面上の各素子区画境界帯域以外に
、オーミック接触月並予備半田付着性良好な金属層を設
けたことを特徴とする半導体ウェーハ。
In a method in which a PN junction is made, a large number of elements are formed, and preliminary solder is attached to the adhesive surface that is fixed to the substrate when dividing into each element, there is an ohmic contact surface in addition to the boundary zone of each element section on the adhesive surface. A semiconductor wafer characterized by being provided with a metal layer having good pre-solder adhesion.
JP13042381U 1981-08-31 1981-08-31 semiconductor wafer Pending JPS5834736U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13042381U JPS5834736U (en) 1981-08-31 1981-08-31 semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13042381U JPS5834736U (en) 1981-08-31 1981-08-31 semiconductor wafer

Publications (1)

Publication Number Publication Date
JPS5834736U true JPS5834736U (en) 1983-03-07

Family

ID=29924051

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13042381U Pending JPS5834736U (en) 1981-08-31 1981-08-31 semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS5834736U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03234043A (en) * 1990-02-09 1991-10-18 Rohm Co Ltd Manufacture of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03234043A (en) * 1990-02-09 1991-10-18 Rohm Co Ltd Manufacture of semiconductor device

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