JPS5828544B2 - Voltage applied current measurement circuit - Google Patents

Voltage applied current measurement circuit

Info

Publication number
JPS5828544B2
JPS5828544B2 JP7112777A JP7112777A JPS5828544B2 JP S5828544 B2 JPS5828544 B2 JP S5828544B2 JP 7112777 A JP7112777 A JP 7112777A JP 7112777 A JP7112777 A JP 7112777A JP S5828544 B2 JPS5828544 B2 JP S5828544B2
Authority
JP
Japan
Prior art keywords
terminal
circuit
voltage
inverting input
input terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7112777A
Other languages
Japanese (ja)
Other versions
JPS546584A (en
Inventor
秋男 三羽
陽一 浅野
英二 和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7112777A priority Critical patent/JPS5828544B2/en
Publication of JPS546584A publication Critical patent/JPS546584A/en
Publication of JPS5828544B2 publication Critical patent/JPS5828544B2/en
Expired legal-status Critical Current

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  • Emergency Protection Circuit Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Description

【発明の詳細な説明】 この発明は、電圧印加電流測定回路に関する。[Detailed description of the invention] The present invention relates to a voltage applied current measuring circuit.

この発明は、簡単な構成とした電圧印加電流測定回路を
提供するためになされた。
The present invention was made in order to provide a voltage applied current measuring circuit with a simple configuration.

また、この発明は、測定ケーブルの遮蔽効果を高めた電
圧印加電流測定回路を提供するためになされた。
Further, the present invention has been made to provide a voltage applied current measuring circuit with improved shielding effect of a measuring cable.

この発明は、反転入力端子を測定端子とし、非反転端子
を設定電圧端子とし、反転入力端子と出力端子との間に
抵抗を接続した演算増幅回路を用い、上記抵抗における
電圧降下を非反転端子と出力端子との電圧差として検出
しようとするものである。
This invention uses an operational amplifier circuit in which an inverting input terminal is used as a measurement terminal, a non-inverting terminal is used as a setting voltage terminal, and a resistor is connected between the inverting input terminal and the output terminal. It is intended to be detected as the voltage difference between the output terminal and the output terminal.

以下、実施例によりこの発明を具体的に説明する。EXAMPLES The present invention will be specifically explained below with reference to Examples.

第1図は、この発明の一実施例を示す回路図である。FIG. 1 is a circuit diagram showing one embodiment of the present invention.

演算増幅器1の反転入力端子(へ)を測定端子とし、ケ
ーブルlを介して被測定物RLに接続する。
The inverting input terminal (to) of the operational amplifier 1 is used as a measurement terminal, and is connected to the object to be measured RL via a cable l.

非反転入力端子(ト)を設定電圧端子として電圧Eoを
印加する。
A voltage Eo is applied using the non-inverting input terminal (G) as a set voltage terminal.

そして、反転入力端子(→と出力端子との間に抵抗R1
を接続する。
Then, a resistor R1 is connected between the inverting input terminal (→ and the output terminal).
Connect.

被測定物RLに流れる電流は、上記抵抗Rtを通してす
べて流れる。
All of the current flowing through the object to be measured RL flows through the resistor Rt.

これは、演算増幅器の入力インピーダンスが非常に高く
、入力電流を無視してよいからである。
This is because the input impedance of the operational amplifier is very high and the input current can be ignored.

上記測定物RLに流れる電流を、上記抵抗Rtにおける
電圧降下として検出するため、上記非反転入力端子(ト
)の電圧と出力端子との差の電圧を演算増幅器8により
構成された引き算回路6により求める。
In order to detect the current flowing through the measurement object RL as a voltage drop across the resistor Rt, the voltage difference between the voltage at the non-inverting input terminal (G) and the output terminal is calculated by a subtraction circuit 6 constituted by an operational amplifier 8. demand.

演算増幅器2により構成された回路5は、反転回路であ
り、上記引き算動作を行なわせるためのちのである。
The circuit 5 constituted by the operational amplifier 2 is an inverting circuit and is used to perform the above-mentioned subtraction operation.

したがって、差電圧検出回路としては、高入力インピー
ダンスの差動増幅回路であってもよい。
Therefore, the differential voltage detection circuit may be a high input impedance differential amplifier circuit.

この実施例回路によれば、演算増幅器1の入力端子(田
、(@の電圧差は零になるように各電圧が安定するため
、非反転入力端子(イ)と出力端子との間の電圧差は、
反転入力端子(→と出力端子との間の電圧差に等しくな
り、前者の電圧差を測定することが、上記抵抗R1にお
ける電圧降下を測定することとなる。
According to this embodiment circuit, since each voltage is stabilized so that the voltage difference between the input terminals (A) and (@) of the operational amplifier 1 becomes zero, the voltage between the non-inverting input terminal (A) and the output terminal The difference is
It is equal to the voltage difference between the inverting input terminal (→) and the output terminal, and measuring the former voltage difference measures the voltage drop across the resistor R1.

言い換えれば、負荷に流れる電流を測定することとなる
のである。
In other words, it measures the current flowing through the load.

この抵抗Rtに接続される測定回路は、演算増幅器3の
入力となっていることより、そのインピーダンスが極め
て太きいため、被測定物RLに流れる電流は、すべて抵
抗Rtに流れることとなり、精度の高い電流測定が可能
となる。
Since the measurement circuit connected to this resistor Rt is an input to the operational amplifier 3, its impedance is extremely large, so the current flowing to the object to be measured RL will all flow to the resistor Rt, resulting in poor accuracy. High current measurement becomes possible.

このため、電圧印加電流測定回路は、半導体集積回路に
おけるリーク電流、あるいはC−MOS(相補型MO8
FET回路)等の消費電力等の微小電流の測定に、主と
して用いるものである。
For this reason, the voltage applied current measurement circuit is used to measure leakage current in semiconductor integrated circuits or C-MOS (complementary MO8
It is mainly used to measure minute currents such as power consumption of FET circuits.

以上構成の実施例回路は、第2図に示す従来広く用いら
れていた電圧印加電流測定回路に比ベインピーダンス変
換回路を構成する演算増幅器14を省略できるため、回
路構成を簡単にすることができる。
In the embodiment circuit having the above configuration, the operational amplifier 14 constituting the ratio vane impedance conversion circuit can be omitted from the conventionally widely used voltage applied current measuring circuit shown in FIG. 2, so that the circuit configuration can be simplified. .

すなわち、同図に示す回路は、抵抗RMにおける電圧降
下を測定するため、この抵抗RMを通して測定回路に流
れる電流を禁止する演算増幅器4を必要とするからであ
る。
That is, the circuit shown in the figure requires the operational amplifier 4 that prohibits current from flowing into the measuring circuit through the resistor RM in order to measure the voltage drop across the resistor RM.

これに比して、この実施例回路は、演算増幅器1の反転
入力端子を測定とし、非反転入力端子を設定電圧端子と
することともに、この非反転入力端子と出力端子とを測
定端子とすることにより、上記インピーダンス変換回路
を一つ省略できるのである。
In contrast, in this embodiment circuit, the inverting input terminal of the operational amplifier 1 is used as the measurement terminal, the non-inverting input terminal is used as the setting voltage terminal, and the non-inverting input terminal and the output terminal are used as the measurement terminal. This allows one impedance conversion circuit to be omitted.

また、被測定物RLに対しては、遮蔽ケーブルlを介し
て接続されるのである。
Further, it is connected to the object to be measured RL via a shielded cable l.

この場合、第2図に示す回路にあっては、遮蔽線を接地
すると、信号線と接地間の寄生容量に充電動作がなされ
るため、充電動作が終了するまで測定ができないことと
なる。
In this case, in the circuit shown in FIG. 2, when the shield line is grounded, a charging operation is performed on the parasitic capacitance between the signal line and the ground, so that measurement cannot be performed until the charging operation is completed.

リーク電流の測定のように微小電流を測定する場合、こ
の充電時間は相当長くなり能率的ではない。
When measuring minute currents such as leakage current measurements, this charging time becomes considerably long and is not efficient.

このため、上記遮蔽線を信号線と同電位となる演算増幅
器4の出力端子に接線することが考えられるが、この場
合、上記出力端子は、信号線に誘導された雑音により変
動するため遮蔽効果が悪くなる。
For this reason, it is conceivable to connect the above-mentioned shielding line to the output terminal of the operational amplifier 4, which has the same potential as the signal line, but in this case, the above-mentioned output terminal fluctuates due to noise induced in the signal line, so the shielding effect is becomes worse.

これに比して、この実施例回路のように、遮蔽線を非反
転入力端子(ト)に接続することにより、信号線と同電
位の安定した電位に保つことができるため遮蔽効果を向
上させることができる。
In contrast, as in this example circuit, by connecting the shielding line to the non-inverting input terminal (G), it is possible to maintain the same stable potential as the signal line, improving the shielding effect. be able to.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、この発明の一実施例を示す回路図、第2図は
、従来技術の一例を示す回路図である。 1〜4・・・演算増幅器、5・・・反転回路、6・・・
差電圧検出回路。
FIG. 1 is a circuit diagram showing an embodiment of the present invention, and FIG. 2 is a circuit diagram showing an example of the prior art. 1 to 4... operational amplifier, 5... inverting circuit, 6...
Differential voltage detection circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 反転入力端子を測定端子とし、非反転入力端子を設
定電圧端子とし、反転入力端子と出力端子との間に抵抗
を接続した演算増幅器と、非反転入力端子と出力端子と
の間の電圧差を検出する高入力インピーダンスの高電圧
板出回路とを具備することを特徴とする電圧印加電流測
定回路。
1. Voltage difference between an operational amplifier in which the inverting input terminal is the measurement terminal, the non-inverting input terminal is the setting voltage terminal, and a resistor is connected between the inverting input terminal and the output terminal, and the non-inverting input terminal and the output terminal. 1. A voltage applied current measuring circuit comprising: a high input impedance high voltage output circuit for detecting a high input impedance;
JP7112777A 1977-06-17 1977-06-17 Voltage applied current measurement circuit Expired JPS5828544B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7112777A JPS5828544B2 (en) 1977-06-17 1977-06-17 Voltage applied current measurement circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7112777A JPS5828544B2 (en) 1977-06-17 1977-06-17 Voltage applied current measurement circuit

Publications (2)

Publication Number Publication Date
JPS546584A JPS546584A (en) 1979-01-18
JPS5828544B2 true JPS5828544B2 (en) 1983-06-16

Family

ID=13451585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7112777A Expired JPS5828544B2 (en) 1977-06-17 1977-06-17 Voltage applied current measurement circuit

Country Status (1)

Country Link
JP (1) JPS5828544B2 (en)

Also Published As

Publication number Publication date
JPS546584A (en) 1979-01-18

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