JP2512934B2 - Temperature measurement circuit - Google Patents

Temperature measurement circuit

Info

Publication number
JP2512934B2
JP2512934B2 JP62062845A JP6284587A JP2512934B2 JP 2512934 B2 JP2512934 B2 JP 2512934B2 JP 62062845 A JP62062845 A JP 62062845A JP 6284587 A JP6284587 A JP 6284587A JP 2512934 B2 JP2512934 B2 JP 2512934B2
Authority
JP
Japan
Prior art keywords
terminal
resistance
temperature detector
connection
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62062845A
Other languages
Japanese (ja)
Other versions
JPS63229338A (en
Inventor
崇夫 藤田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP62062845A priority Critical patent/JP2512934B2/en
Publication of JPS63229338A publication Critical patent/JPS63229338A/en
Application granted granted Critical
Publication of JP2512934B2 publication Critical patent/JP2512934B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、測温抵抗体を使用した温度測定回路に関す
るものである。
The present invention relates to a temperature measuring circuit using a resistance temperature detector.

〔従来の技術〕 測温抵抗体を使用した温度測定回路の従来例を第4図
に示す。図において、RTDは測温抵抗体、A,B,bは接続端
子である。測温抵抗体RTDの一端はリード線l1を介して
端子Aに,他端はリード線l2,l3を介して端子B,bに夫々
接続されている。r1〜r3はリード線l1〜l3の抵抗値を示
すもので、r1=r2=r3=rとなっている。ISは定電流
源、RSは基準抵抗で、定電流源ISは端子Aに接続され、
基準抵抗RSは接続線l4介して端子bと基準電位点COMの
間に接続されている。BUはバッファ増幅器、SUは差動増
幅器である。接続端子Aはバッファ増幅器BUを介して差
動増幅器SUの一方の入力端子に接続され、端子Bは直接
に差動増幅器SUの他方の入力端子に接続されている。
[Prior Art] FIG. 4 shows a conventional example of a temperature measuring circuit using a resistance temperature detector. In the figure, RTD is a resistance temperature detector, and A, B, and b are connection terminals. One end of the resistance temperature detector RTD is connected to the terminal A through the lead wire l1, and the other end is connected to the terminals B and b through the lead wires l2 and l3, respectively. r1 to r3 indicate resistance values of the lead wires l1 to l3, and r1 = r2 = r3 = r. IS is a constant current source, RS is a reference resistor, the constant current source IS is connected to terminal A,
The reference resistor RS is connected between the terminal b and the reference potential point COM via a connection line l4. BU is a buffer amplifier and SU is a differential amplifier. The connection terminal A is connected to one input terminal of the differential amplifier SU via the buffer amplifier BU, and the terminal B is directly connected to the other input terminal of the differential amplifier SU.

このような構成において、定電流源ISにより供給され
る定電流Iは端子Aよりリード線l1→測温低抗体RTD→
リード線l3→基準抵抗RSを介して基準電位点COMに流れ
る。この電流Iにより端子A,Bに生じる電圧降下をV1,V2
とし、RTを測温抵抗体RTD,RSを基準抵抗RSの抵抗値とす
ると、 V1=(RT+RS+2r)・I V2=(RS+r)・I となる。従って、差動増幅器SUの出力電圧をVoとする
と、Voは下式で表わされる。
In such a configuration, the constant current I supplied by the constant current source IS is from the terminal A to the lead wire l1 → low temperature measuring antibody RTD →
It flows to the reference potential point COM through the lead wire l3 → reference resistance RS. This current I causes the voltage drop at terminals A and B to be V1 and V2.
If RT is the resistance temperature detector RTD and RS is the resistance value of the reference resistance RS, then V1 = (RT + RS + 2r) * IV2 = (RS + r) * I. Therefore, when the output voltage of the differential amplifier SU is Vo, Vo is expressed by the following equation.

Vo=2V2−V1=(RS−RT) …(1) (1)式において基準抵抗RSの値を測温抵抗体RTDの
0℃の時の抵抗値と同じ値にすると、出力電圧Voは被測
定温度に対応する。
Vo = 2V2-V1 = (RS-RT) (1) If the value of the reference resistance RS is set to the same value as the resistance value of the RTD RTD at 0 ° C in the formula (1), the output voltage Vo is Corresponds to the measured temperature.

ここで、第4図の回路において基準抵抗RSは接続線l4
を介して端子bに接続されているが、その接続線l4にも
同様に抵抗が存在する。この抵抗を図でrsとして示して
あるが、第4図の回路においてはこの抵抗rsが測定値Vo
の誤差要因となる。
Here, in the circuit of FIG. 4, the reference resistance RS is the connection line l4.
Although it is connected to the terminal b through, the connecting line l4 also has a resistance. This resistance is shown as rs in the figure, but in the circuit of FIG. 4, this resistance rs is the measured value Vo.
Will cause an error.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

本発明はこのような問題点を解決するためになされた
もので、基準抵抗RSを接続する接続線l4の抵抗値が測定
結果に影響を及ぼさないようにしたものである。
The present invention has been made to solve such a problem, and is intended to prevent the resistance value of the connection line l4 connecting the reference resistance RS from affecting the measurement result.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は端子bに測温抵抗体の0℃の時の抵抗値と測
温抵抗体に流れる電流の積に対応した電圧を加えること
により、上記の目的を達成したものである。以下実施例
について詳細に説明する。
The present invention achieves the above object by applying to the terminal b a voltage corresponding to the product of the resistance value of the resistance temperature detector at 0 ° C. and the current flowing through the resistance temperature detector. Examples will be described in detail below.

〔実施例〕〔Example〕

第1図は本発明に係る温度測定回路の一実施例の接続
図である。なお、第1図において第4図と同一部分は第
4図と同一部号を付してその再説明は省略する。第1図
において、OPは演算増幅器で、その出力端は接続線l5を
介して、又反転入力端子は接続線l6を介して夫々端子b
に接続されている。0℃の時の測温抵抗体RTDの抵抗値
をRT(0)とすると、E=I・RT(0)で表わされる電
圧が演算増幅器OPの非反転入力端子には加えられてい
る。この構成により、印加電圧Eは演算増幅器Oにより
定電圧化されて端子bに加えられる。従って、このよう
な構成においてV1,V2は、 V1=E+(RT+2r)・I V2=E+r・I で表わされ、Voは Vo=2V2−V1=E+RT・I ={(RT(0)−RT}・I …(2) となる。(2)式から明らかなように、出力電圧Voは被
測定温度に対応したものとなる。なお、演算増幅器OPの
出力端及び反転入力端子は接続線l5,l6を介して端子b
に接続されており、それらの接続線にも抵抗r5,r6が存
在する。しかし、これらの抵抗は端子bの電位が定電圧
化されている為に誤差要因とならない。
FIG. 1 is a connection diagram of an embodiment of a temperature measuring circuit according to the present invention. In FIG. 1, the same parts as those in FIG. 4 are designated by the same parts as those in FIG. In FIG. 1, OP is an operational amplifier, the output terminal of which is connected via a connecting line 15 and the inverting input terminal thereof is connected via a connecting line 16 to a terminal b.
It is connected to the. When the resistance value of the resistance temperature detector RTD at 0 ° C. is RT (0), the voltage represented by E = I · RT (0) is applied to the non-inverting input terminal of the operational amplifier OP. With this configuration, the applied voltage E is made constant by the operational amplifier O and applied to the terminal b. Therefore, in such a configuration, V1 and V2 are represented by V1 = E + (RT + 2r) .I V2 = E + r.I, and Vo is Vo = 2V2-V1 = E + RT.I = {(RT (0) -RT } · I (2) As is clear from the equation (2), the output voltage Vo corresponds to the temperature to be measured Note that the output terminal of the operational amplifier OP and the inverting input terminal are connected by the connecting line l5. , b via l6
The resistors r5 and r6 are also present in those connecting lines. However, these resistors do not cause an error because the potential of the terminal b is constant.

なお、第4図の従来例ではスキャナ等を使用して入力
を切換える場合にはそのスキャナのリレーの接触抵抗の
バラツキなどにより出力電圧Voに誤差が生じる。第2図
及び第3図はこのようなスキャナリレーの接触抵抗に影
響されないようにしたものである。第2図及び第3図に
おいてSCはそのスキャナで、第2図において端子A,B,b
をすべてスキャナ接点s1〜s5により切換えるようになっ
ている。この場合、スキャナ接点s4,s5は端子bと演算
増幅器OPを結ぶ接続線l5,l6に接続されているので、ス
キャナ接点s1〜s3はもちろんのこと、スキャナ接点s5,s
6の接触抵抗も第1図で説明したように誤差要因となら
ないものとなっている。第3図は端子bをすべてのチャ
ネル間で共用させるようにしたもので、この場合第1図
で説明したように接続線l5,l6による誤差要因はなくな
る。なお、端子bを何チャネル間で共用させる場合があ
り、そのときは接続線l5,l6における点X,Yで別のスキャ
ナ接点を用いる必要があるが、その場合もそのスキャナ
接点の接触抵抗による影響はない。
In the conventional example shown in FIG. 4, when the input is switched using a scanner or the like, an error occurs in the output voltage Vo due to variations in the contact resistance of the relay of the scanner. 2 and 3 are designed so as not to be affected by the contact resistance of such a scanner relay. SC is the scanner in FIGS. 2 and 3, and terminals A, B, and b in FIG.
Are all switched by the scanner contacts s1 to s5. In this case, since the scanner contacts s4, s5 are connected to the connection lines l5, l6 connecting the terminal b and the operational amplifier OP, not only the scanner contacts s1 to s3 but also the scanner contacts s5, s5.
The contact resistance of 6 also does not cause an error as described in FIG. In FIG. 3, the terminal b is shared by all channels. In this case, the error factors due to the connection lines l5 and l6 are eliminated as described in FIG. In some cases, the terminal b may be shared between channels, and at that time, it is necessary to use another scanner contact at the points X and Y on the connecting lines l5 and l6. There is no effect.

〔本発明の効果〕[Effect of the present invention]

以上説明したように、本発明においては3線式で接続
する測温低抗体の接続端子bの電位を定電圧化するよう
に構成したので、この接続端子bに接続される接続線の
抵抗値或いはスキャナ接点の接触抵抗による影響のない
温度測定回路を極めて簡単な構成によって得ることがで
きる。
As described above, in the present invention, since the potential of the connection terminal b of the temperature-measuring low antibody connected by the three-wire system is configured to be a constant voltage, the resistance value of the connection wire connected to this connection terminal b Alternatively, a temperature measuring circuit that is not affected by the contact resistance of the scanner contact can be obtained with an extremely simple structure.

【図面の簡単な説明】[Brief description of drawings]

第1図乃至第3図は夫々本発明に係る温度測定回路の実
施例の接続図、第4図は従来のこの種の回路の一例の接
続図である。 RTD……測温抵抗体、A,B,b……接続端子、IS……定電流
源、SU……差動増幅器、OP……演算増幅器、E……電
圧。
1 to 3 are connection diagrams of an embodiment of a temperature measuring circuit according to the present invention, and FIG. 4 is a connection diagram of an example of a conventional circuit of this type. RTD: RTD, A, B, b ... Connection terminals, IS ... Constant current source, SU ... Differential amplifier, OP ... Operational amplifier, E ... Voltage.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】測温抵抗体を3端子A,B,bを用いて接続
し、端子Aより供給される定電流により端子A,B間に生
じる電圧降下の差を差動増幅器を用いて取り出すように
した温度測定回路において、 一方の入力端に前記測温抵抗体の0℃の時の抵抗値と前
記定電流によりこの測温抵抗体に流れる電流の積に対応
した電圧を加え他方の入力端と出力端とを夫々抵抗を介
して前記端子bに接続してなる演算増幅器を具備した温
度測定回路。
1. A resistance temperature detector is connected using three terminals A, B, b, and a differential amplifier is used to detect the difference in voltage drop between terminals A, B caused by a constant current supplied from terminal A. In the temperature measuring circuit to be taken out, a voltage corresponding to the product of the resistance value of the resistance temperature detector at 0 ° C. and the current flowing through the resistance temperature detector due to the constant current is applied to one input end of the other end. A temperature measuring circuit comprising an operational amplifier having an input terminal and an output terminal connected to the terminal b via resistors.
JP62062845A 1987-03-18 1987-03-18 Temperature measurement circuit Expired - Lifetime JP2512934B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62062845A JP2512934B2 (en) 1987-03-18 1987-03-18 Temperature measurement circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62062845A JP2512934B2 (en) 1987-03-18 1987-03-18 Temperature measurement circuit

Publications (2)

Publication Number Publication Date
JPS63229338A JPS63229338A (en) 1988-09-26
JP2512934B2 true JP2512934B2 (en) 1996-07-03

Family

ID=13212048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62062845A Expired - Lifetime JP2512934B2 (en) 1987-03-18 1987-03-18 Temperature measurement circuit

Country Status (1)

Country Link
JP (1) JP2512934B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101109662B (en) 2006-07-17 2010-09-29 梅特勒-托利多仪器(上海)有限公司 Thermal resistance temperature surveying circuit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57182133A (en) * 1981-05-02 1982-11-09 Yokogawa Hokushin Electric Corp Temperature measuring circuit by temperature measuring resistor

Also Published As

Publication number Publication date
JPS63229338A (en) 1988-09-26

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