JPS58213248A - 超音波による欠陥識別方法とその装置 - Google Patents

超音波による欠陥識別方法とその装置

Info

Publication number
JPS58213248A
JPS58213248A JP57096221A JP9622182A JPS58213248A JP S58213248 A JPS58213248 A JP S58213248A JP 57096221 A JP57096221 A JP 57096221A JP 9622182 A JP9622182 A JP 9622182A JP S58213248 A JPS58213248 A JP S58213248A
Authority
JP
Japan
Prior art keywords
ultrasonic
defect
phase
ultrasound
absence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57096221A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0157738B2 (enrdf_load_stackoverflow
Inventor
Satoshi Ogura
聰 小倉
Sakae Sugiyama
栄 杉山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57096221A priority Critical patent/JPS58213248A/ja
Publication of JPS58213248A publication Critical patent/JPS58213248A/ja
Publication of JPH0157738B2 publication Critical patent/JPH0157738B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4436—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a reference signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP57096221A 1982-06-07 1982-06-07 超音波による欠陥識別方法とその装置 Granted JPS58213248A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57096221A JPS58213248A (ja) 1982-06-07 1982-06-07 超音波による欠陥識別方法とその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57096221A JPS58213248A (ja) 1982-06-07 1982-06-07 超音波による欠陥識別方法とその装置

Publications (2)

Publication Number Publication Date
JPS58213248A true JPS58213248A (ja) 1983-12-12
JPH0157738B2 JPH0157738B2 (enrdf_load_stackoverflow) 1989-12-07

Family

ID=14159175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57096221A Granted JPS58213248A (ja) 1982-06-07 1982-06-07 超音波による欠陥識別方法とその装置

Country Status (1)

Country Link
JP (1) JPS58213248A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59141062A (ja) * 1983-02-01 1984-08-13 Keizaburo Harumi 超音波探傷法
JPS62174653A (ja) * 1985-10-16 1987-07-31 Hitachi Constr Mach Co Ltd 超音波検査方法および装置
JPH01248053A (ja) * 1988-03-29 1989-10-03 Canon Inc 超音波測定方法及び超音波測定装置
JP2005315892A (ja) * 2004-04-30 2005-11-10 General Electric Co <Ge> エーロフォイルを超音波検査する方法
JP2015081849A (ja) * 2013-10-23 2015-04-27 大同特殊鋼株式会社 超音波欠陥判定方法
JP2016024142A (ja) * 2014-07-24 2016-02-08 大同特殊鋼株式会社 丸棒材の超音波探傷方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0360327U (enrdf_load_stackoverflow) * 1989-10-18 1991-06-13
JP6602449B1 (ja) * 2018-12-05 2019-11-06 株式会社日立パワーソリューションズ 超音波検査方法、超音波検査装置及び超音波検査プログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53118090A (en) * 1977-03-25 1978-10-16 Hitachi Ltd Ultrasonic inspector
JPS5750655A (en) * 1980-09-11 1982-03-25 Toshiba Corp Ultrasonic flaw detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53118090A (en) * 1977-03-25 1978-10-16 Hitachi Ltd Ultrasonic inspector
JPS5750655A (en) * 1980-09-11 1982-03-25 Toshiba Corp Ultrasonic flaw detector

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59141062A (ja) * 1983-02-01 1984-08-13 Keizaburo Harumi 超音波探傷法
JPS62174653A (ja) * 1985-10-16 1987-07-31 Hitachi Constr Mach Co Ltd 超音波検査方法および装置
JPH01248053A (ja) * 1988-03-29 1989-10-03 Canon Inc 超音波測定方法及び超音波測定装置
JP2005315892A (ja) * 2004-04-30 2005-11-10 General Electric Co <Ge> エーロフォイルを超音波検査する方法
JP2015081849A (ja) * 2013-10-23 2015-04-27 大同特殊鋼株式会社 超音波欠陥判定方法
JP2016024142A (ja) * 2014-07-24 2016-02-08 大同特殊鋼株式会社 丸棒材の超音波探傷方法

Also Published As

Publication number Publication date
JPH0157738B2 (enrdf_load_stackoverflow) 1989-12-07

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