JPS58204375A - 基板の絶縁導通判定装置 - Google Patents

基板の絶縁導通判定装置

Info

Publication number
JPS58204375A
JPS58204375A JP57087165A JP8716582A JPS58204375A JP S58204375 A JPS58204375 A JP S58204375A JP 57087165 A JP57087165 A JP 57087165A JP 8716582 A JP8716582 A JP 8716582A JP S58204375 A JPS58204375 A JP S58204375A
Authority
JP
Japan
Prior art keywords
board
substrate
terminal
probe
registered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57087165A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0343591B2 (enrdf_load_stackoverflow
Inventor
Yasushi Suzuki
康司 鈴木
Teizo Sekiya
関屋　禎三
Akira Ogawa
明 小川
Eiichi Shirakawa
白川　栄一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57087165A priority Critical patent/JPS58204375A/ja
Publication of JPS58204375A publication Critical patent/JPS58204375A/ja
Publication of JPH0343591B2 publication Critical patent/JPH0343591B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57087165A 1982-05-22 1982-05-22 基板の絶縁導通判定装置 Granted JPS58204375A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57087165A JPS58204375A (ja) 1982-05-22 1982-05-22 基板の絶縁導通判定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57087165A JPS58204375A (ja) 1982-05-22 1982-05-22 基板の絶縁導通判定装置

Publications (2)

Publication Number Publication Date
JPS58204375A true JPS58204375A (ja) 1983-11-29
JPH0343591B2 JPH0343591B2 (enrdf_load_stackoverflow) 1991-07-03

Family

ID=13907371

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57087165A Granted JPS58204375A (ja) 1982-05-22 1982-05-22 基板の絶縁導通判定装置

Country Status (1)

Country Link
JP (1) JPS58204375A (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5572210A (en) * 1978-11-22 1980-05-30 Fujitsu Ltd Drive control system for circuit testing prober
JPS55160866A (en) * 1979-05-30 1980-12-15 Asahi Denki Seisakusho:Kk Device for deciding short-circuit and disconnection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5572210A (en) * 1978-11-22 1980-05-30 Fujitsu Ltd Drive control system for circuit testing prober
JPS55160866A (en) * 1979-05-30 1980-12-15 Asahi Denki Seisakusho:Kk Device for deciding short-circuit and disconnection

Also Published As

Publication number Publication date
JPH0343591B2 (enrdf_load_stackoverflow) 1991-07-03

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