JPS58169067A - 周波数領域特性の測定方法 - Google Patents

周波数領域特性の測定方法

Info

Publication number
JPS58169067A
JPS58169067A JP5216482A JP5216482A JPS58169067A JP S58169067 A JPS58169067 A JP S58169067A JP 5216482 A JP5216482 A JP 5216482A JP 5216482 A JP5216482 A JP 5216482A JP S58169067 A JPS58169067 A JP S58169067A
Authority
JP
Japan
Prior art keywords
data
output
digital
frequency
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5216482A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0368351B2 (cg-RX-API-DMAC10.html
Inventor
ブル−ス・ジエイ・ペニ−
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to JP5216482A priority Critical patent/JPS58169067A/ja
Priority to DE8383301804T priority patent/DE3381119D1/de
Priority to CA000424902A priority patent/CA1224845A/en
Priority to EP19830301804 priority patent/EP0095234B1/en
Publication of JPS58169067A publication Critical patent/JPS58169067A/ja
Publication of JPH0368351B2 publication Critical patent/JPH0368351B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP5216482A 1982-03-30 1982-03-30 周波数領域特性の測定方法 Granted JPS58169067A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP5216482A JPS58169067A (ja) 1982-03-30 1982-03-30 周波数領域特性の測定方法
DE8383301804T DE3381119D1 (de) 1982-03-30 1983-03-30 Verfahren und geraet zur spitzenwerterfassung eines signals.
CA000424902A CA1224845A (en) 1982-03-30 1983-03-30 Method of measuring a frequency domain characteristic
EP19830301804 EP0095234B1 (en) 1982-03-30 1983-03-30 Signal peak-to-peak detection method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5216482A JPS58169067A (ja) 1982-03-30 1982-03-30 周波数領域特性の測定方法

Publications (2)

Publication Number Publication Date
JPS58169067A true JPS58169067A (ja) 1983-10-05
JPH0368351B2 JPH0368351B2 (cg-RX-API-DMAC10.html) 1991-10-28

Family

ID=12907186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5216482A Granted JPS58169067A (ja) 1982-03-30 1982-03-30 周波数領域特性の測定方法

Country Status (4)

Country Link
EP (1) EP0095234B1 (cg-RX-API-DMAC10.html)
JP (1) JPS58169067A (cg-RX-API-DMAC10.html)
CA (1) CA1224845A (cg-RX-API-DMAC10.html)
DE (1) DE3381119D1 (cg-RX-API-DMAC10.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006031027A1 (de) * 2006-07-05 2008-01-24 Atmel Germany Gmbh Verfahren zur Funktionskontrolle von wenigstens einem analogen Schaltungsblock

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2924769A (en) * 1958-06-16 1960-02-09 Gen Electric Peak reading circuit
IT1025356B (it) * 1974-10-31 1978-08-10 Ates Componenti Elettron Circuito duplicatore rivelatore in cascata

Also Published As

Publication number Publication date
JPH0368351B2 (cg-RX-API-DMAC10.html) 1991-10-28
EP0095234A3 (en) 1986-03-26
DE3381119D1 (de) 1990-02-22
EP0095234B1 (en) 1990-01-17
EP0095234A2 (en) 1983-11-30
CA1224845A (en) 1987-07-28

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