JPS58155725A - 自生酸化物層の形成方法および半導体装置 - Google Patents
自生酸化物層の形成方法および半導体装置Info
- Publication number
- JPS58155725A JPS58155725A JP57205925A JP20592582A JPS58155725A JP S58155725 A JPS58155725 A JP S58155725A JP 57205925 A JP57205925 A JP 57205925A JP 20592582 A JP20592582 A JP 20592582A JP S58155725 A JPS58155725 A JP S58155725A
- Authority
- JP
- Japan
- Prior art keywords
- autogenous
- substrate
- oxide
- oxygen
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6304—Formation by oxidation, e.g. oxidation of the substrate
- H10P14/6306—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
- H10P14/6312—Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group III-V semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6338—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition the reactions being activated by other means than plasma or thermal, e.g. photo-CVD
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/668—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/69215—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
Landscapes
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US32378081A | 1981-11-23 | 1981-11-23 | |
| US323780 | 1981-11-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58155725A true JPS58155725A (ja) | 1983-09-16 |
| JPH0436456B2 JPH0436456B2 (enExample) | 1992-06-16 |
Family
ID=23260697
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57205925A Granted JPS58155725A (ja) | 1981-11-23 | 1982-11-24 | 自生酸化物層の形成方法および半導体装置 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPS58155725A (enExample) |
| DE (1) | DE3242921A1 (enExample) |
| FR (1) | FR2517121A1 (enExample) |
| GB (1) | GB2111037B (enExample) |
| NL (1) | NL8204475A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59111333A (ja) * | 1982-12-09 | 1984-06-27 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | SiO領域をSiO↓2領域に変換してSiO↓2領を形成する方法 |
| DE3680623D1 (de) * | 1985-02-28 | 1991-09-05 | Sony Corp | Verfahren zur herstellung isolierender oxid-schichten auf einem halbleiterkoerper. |
| DE3545242A1 (de) * | 1985-12-20 | 1987-06-25 | Licentia Gmbh | Strukturierter halbleiterkoerper |
| US5178682A (en) * | 1988-06-21 | 1993-01-12 | Mitsubishi Denki Kabushiki Kaisha | Method for forming a thin layer on a semiconductor substrate and apparatus therefor |
| JPH01319944A (ja) * | 1988-06-21 | 1989-12-26 | Mitsubishi Electric Corp | 半導体基板表面に薄膜を形成する方法およびその装置 |
| FR2635915B1 (fr) * | 1988-08-30 | 1992-04-30 | Loualiche Slimane | Procede de fabrication d'une couche mince d'oxyde par voie seche sur un materiau iii-v, couche d'oxyde obtenue par ce procede et application a une diode schottky |
| WO2005113134A1 (ja) * | 2004-05-21 | 2005-12-01 | Mitsubishi Gas Chemical Company, Inc. | 物質の酸化方法およびその酸化装置 |
| JP6501486B2 (ja) * | 2014-10-27 | 2019-04-17 | 学校法人東海大学 | 滅菌装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5696704A (en) * | 1979-12-17 | 1981-08-05 | Hughes Aircraft Co | Oxide layer optical gas phase cladding method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3718503A (en) * | 1971-07-14 | 1973-02-27 | Us Army | Method of forming a diffusion mask barrier on a silicon substrate |
| DE2155849C3 (de) * | 1971-11-10 | 1979-07-26 | Semikron Gesellschaft Fuer Gleichrichterbau Und Elektronik Mbh, 8500 Nuernberg | Verfahren zur Herstellung eines stabilisierenden und/oder isolierenden Überzuges auf Halbleiteroberflächen |
-
1982
- 1982-10-19 GB GB08229832A patent/GB2111037B/en not_active Expired
- 1982-11-18 NL NL8204475A patent/NL8204475A/nl not_active Application Discontinuation
- 1982-11-20 DE DE19823242921 patent/DE3242921A1/de not_active Withdrawn
- 1982-11-23 FR FR8219564A patent/FR2517121A1/fr active Pending
- 1982-11-24 JP JP57205925A patent/JPS58155725A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5696704A (en) * | 1979-12-17 | 1981-08-05 | Hughes Aircraft Co | Oxide layer optical gas phase cladding method |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2517121A1 (fr) | 1983-05-27 |
| GB2111037B (en) | 1984-10-17 |
| DE3242921A1 (de) | 1983-08-04 |
| JPH0436456B2 (enExample) | 1992-06-16 |
| NL8204475A (nl) | 1983-06-16 |
| GB2111037A (en) | 1983-06-29 |
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