JPS5812851U - X線分析装置 - Google Patents

X線分析装置

Info

Publication number
JPS5812851U
JPS5812851U JP10650981U JP10650981U JPS5812851U JP S5812851 U JPS5812851 U JP S5812851U JP 10650981 U JP10650981 U JP 10650981U JP 10650981 U JP10650981 U JP 10650981U JP S5812851 U JPS5812851 U JP S5812851U
Authority
JP
Japan
Prior art keywords
ray
wavelength
filter
rays
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10650981U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0432603Y2 (enrdf_load_stackoverflow
Inventor
中山 正雄
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP10650981U priority Critical patent/JPS5812851U/ja
Publication of JPS5812851U publication Critical patent/JPS5812851U/ja
Application granted granted Critical
Publication of JPH0432603Y2 publication Critical patent/JPH0432603Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP10650981U 1981-07-17 1981-07-17 X線分析装置 Granted JPS5812851U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10650981U JPS5812851U (ja) 1981-07-17 1981-07-17 X線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10650981U JPS5812851U (ja) 1981-07-17 1981-07-17 X線分析装置

Publications (2)

Publication Number Publication Date
JPS5812851U true JPS5812851U (ja) 1983-01-27
JPH0432603Y2 JPH0432603Y2 (enrdf_load_stackoverflow) 1992-08-05

Family

ID=29900980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10650981U Granted JPS5812851U (ja) 1981-07-17 1981-07-17 X線分析装置

Country Status (1)

Country Link
JP (1) JPS5812851U (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5564303B2 (ja) * 2009-06-12 2014-07-30 株式会社日立ハイテクサイエンス X線透過検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51111386A (en) * 1975-03-26 1976-10-01 Seiko Instr & Electronics Ltd Apparatus for radiation analysis

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51111386A (en) * 1975-03-26 1976-10-01 Seiko Instr & Electronics Ltd Apparatus for radiation analysis

Also Published As

Publication number Publication date
JPH0432603Y2 (enrdf_load_stackoverflow) 1992-08-05

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