JPH0432603Y2 - - Google Patents

Info

Publication number
JPH0432603Y2
JPH0432603Y2 JP1981106509U JP10650981U JPH0432603Y2 JP H0432603 Y2 JPH0432603 Y2 JP H0432603Y2 JP 1981106509 U JP1981106509 U JP 1981106509U JP 10650981 U JP10650981 U JP 10650981U JP H0432603 Y2 JPH0432603 Y2 JP H0432603Y2
Authority
JP
Japan
Prior art keywords
rays
detector
ray
central axis
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981106509U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5812851U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10650981U priority Critical patent/JPS5812851U/ja
Publication of JPS5812851U publication Critical patent/JPS5812851U/ja
Application granted granted Critical
Publication of JPH0432603Y2 publication Critical patent/JPH0432603Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP10650981U 1981-07-17 1981-07-17 Ｘ線分析装置 Granted JPS5812851U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10650981U JPS5812851U (ja) 1981-07-17 1981-07-17 Ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10650981U JPS5812851U (ja) 1981-07-17 1981-07-17 Ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPS5812851U JPS5812851U (ja) 1983-01-27
JPH0432603Y2 true JPH0432603Y2 (enrdf_load_stackoverflow) 1992-08-05

Family

ID=29900980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10650981U Granted JPS5812851U (ja) 1981-07-17 1981-07-17 Ｘ線分析装置

Country Status (1)

Country Link
JP (1) JPS5812851U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011017690A (ja) * 2009-06-12 2011-01-27 Sii Nanotechnology Inc Ｘ線透過検査装置及びｘ線透過検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932731B2 (ja) * 1975-03-26 1984-08-10 セイコーインスツルメンツ株式会社 放射線分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011017690A (ja) * 2009-06-12 2011-01-27 Sii Nanotechnology Inc Ｘ線透過検査装置及びｘ線透過検査方法

Also Published As

Publication number Publication date
JPS5812851U (ja) 1983-01-27

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