JPS58117438A - 赤外分光計で透過ーおよび反射測定を実施するための補助装置 - Google Patents

赤外分光計で透過ーおよび反射測定を実施するための補助装置

Info

Publication number
JPS58117438A
JPS58117438A JP57209463A JP20946382A JPS58117438A JP S58117438 A JPS58117438 A JP S58117438A JP 57209463 A JP57209463 A JP 57209463A JP 20946382 A JP20946382 A JP 20946382A JP S58117438 A JPS58117438 A JP S58117438A
Authority
JP
Japan
Prior art keywords
mirror
sample
auxiliary device
axis
infrared spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57209463A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6333093B2 (enExample
Inventor
ユルゲン・ガスト
ルツツ・ヴンシユ
ギユンタ−・ツアツハマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BURUUKAA ANARIYUUTEITSUSHIE ME
BURUUKAA ANARIYUUTEITSUSHIE MESUTEHINIKU GmbH
Original Assignee
BURUUKAA ANARIYUUTEITSUSHIE ME
BURUUKAA ANARIYUUTEITSUSHIE MESUTEHINIKU GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BURUUKAA ANARIYUUTEITSUSHIE ME, BURUUKAA ANARIYUUTEITSUSHIE MESUTEHINIKU GmbH filed Critical BURUUKAA ANARIYUUTEITSUSHIE ME
Publication of JPS58117438A publication Critical patent/JPS58117438A/ja
Publication of JPS6333093B2 publication Critical patent/JPS6333093B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57209463A 1981-12-02 1982-12-01 赤外分光計で透過ーおよび反射測定を実施するための補助装置 Granted JPS58117438A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3147689A DE3147689C2 (de) 1981-12-02 1981-12-02 Zusatzgerät zur Durchführung von Reflexionsmessungen mit einem IR-Spektrometer
DE3147689.9 1981-12-02

Publications (2)

Publication Number Publication Date
JPS58117438A true JPS58117438A (ja) 1983-07-13
JPS6333093B2 JPS6333093B2 (enExample) 1988-07-04

Family

ID=6147706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57209463A Granted JPS58117438A (ja) 1981-12-02 1982-12-01 赤外分光計で透過ーおよび反射測定を実施するための補助装置

Country Status (5)

Country Link
US (1) US4479058A (enExample)
JP (1) JPS58117438A (enExample)
DE (1) DE3147689C2 (enExample)
FR (1) FR2517429B1 (enExample)
GB (1) GB2110836B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014119448A (ja) * 2012-12-17 2014-06-30 Advantest Corp 光線入射装置および反射光測定装置

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3303140A1 (de) * 1983-01-31 1984-08-02 Bruker Analytische Meßtechnik GmbH, 7512 Rheinstetten Infrarot-spektrometer
US4547068A (en) * 1983-03-04 1985-10-15 Covey Joel P Optical analytical instrument beam condenser
US4606636A (en) * 1983-10-25 1986-08-19 Universite De Saint-Etienne Optical apparatus for identifying the individual multiparametric properties of particles or bodies in a continuous flow
US4657390A (en) * 1985-02-21 1987-04-14 Laser Precision Corporation Universal spectrometer system having modular sampling chamber
US4702598A (en) * 1985-02-25 1987-10-27 Research Corporation Flow cytometer
US4692024A (en) * 1985-05-10 1987-09-08 Electro-Tec Corporation Automatic refractometer
US4786169A (en) * 1985-08-08 1988-11-22 Nicolet Instrument Corporation Optical analytical instrument for testing the transmission and reflection of a sample
US4695727A (en) * 1986-03-07 1987-09-22 Nicolet Instrument Corporation Optical analytical instrument with automatic sample changing
US4734584A (en) * 1986-09-16 1988-03-29 Trebor Industries, Inc. Quantitative near-infrared measurement instrument for multiple measurements in both reflectance and transmission modes
US4928014A (en) * 1988-10-03 1990-05-22 Futrex, Inc. Near-infrared apparatus and method for determining percent fat in a body
US5088821A (en) * 1990-06-29 1992-02-18 Nicolas J. Harrick Spectroscopic analysis system with remote terminals
US5048970A (en) * 1990-06-29 1991-09-17 Nicolas J. Harrick Optical attachment for variable angle reflection spectroscopy
JP3390063B2 (ja) * 1993-10-25 2003-03-24 日本分光株式会社 高感度反射測定装置用の光学系
DE4410036B4 (de) * 1994-03-23 2004-09-02 Berthold Gmbh & Co. Kg Zweistrahl-Polychromator
GB2402493B (en) * 2003-06-04 2006-06-14 Ford Global Tech Llc Plastics identification
CN103760133B (zh) * 2014-01-24 2016-04-20 深圳市安鑫宝科技发展有限公司 检测农副产品异常成分的方法及装置
CN119291943B (zh) * 2024-10-21 2025-11-11 深圳技术大学 辅助安装设备及调试方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1186241B (de) * 1958-06-03 1965-01-28 Phywe Ag Optisches Messgeraet zur Bestimmung des Molekulargewichts
FR1480923A (enExample) * 1965-05-24 1967-08-09
US3524983A (en) * 1966-09-28 1970-08-18 Sinclair Research Inc Process and apparatus for determining the cure characteristics of materials
DE2251080A1 (de) * 1972-10-18 1974-05-02 Max Planck Gesellschaft Michelson-interferometer
US4158772A (en) * 1978-05-02 1979-06-19 The United States Of America As Represented By The United States Department Of Energy Device for collecting and analyzing matrix-isolated samples

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014119448A (ja) * 2012-12-17 2014-06-30 Advantest Corp 光線入射装置および反射光測定装置

Also Published As

Publication number Publication date
US4479058A (en) 1984-10-23
FR2517429A1 (fr) 1983-06-03
GB2110836B (en) 1985-08-21
DE3147689C2 (de) 1984-04-26
GB2110836A (en) 1983-06-22
JPS6333093B2 (enExample) 1988-07-04
DE3147689A1 (de) 1983-06-16
FR2517429B1 (fr) 1986-08-22

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