JPS58108853A - Testing device for electronic exchange program - Google Patents
Testing device for electronic exchange programInfo
- Publication number
- JPS58108853A JPS58108853A JP20893881A JP20893881A JPS58108853A JP S58108853 A JPS58108853 A JP S58108853A JP 20893881 A JP20893881 A JP 20893881A JP 20893881 A JP20893881 A JP 20893881A JP S58108853 A JPS58108853 A JP S58108853A
- Authority
- JP
- Japan
- Prior art keywords
- information
- test
- electronic exchange
- pseudo call
- test procedure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
- H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
- H04M3/32—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges
- H04M3/323—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges for the arrangements providing the connection (test connection, test call, call simulation)
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Exchange Systems With Centralized Control (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Abstract
Description
【発明の詳細な説明】
（ａ） 発明ノｌ゛の技術分野
本発明は電子交換プログラムの試験装置、特に電子交換
機に擬似呼を供給し動作状態を監視することによシミ子
交換プログラムを横１する試験装置に関す。DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a testing device for an electronic switching program, and particularly to a testing device for testing a smudge switching program by supplying pseudo calls to an electronic switching system and monitoring its operating status. 1. Concerning test equipment.
（ｂ）従来技術とｌ’＋ｊ］題点
従来あるこの伽電子交換プログラムの試験装置の一例と
しては、擬似呼発生装置が公知である。(b) Prior Art and l'+j] Problem As an example of a conventional test device for this electronic exchange program, a pseudo call generating device is known.
該擬似呼発生装置は、所定条件の擬似呼を発生し、試験
対象とする電子交換プログラムを主記憶装置に設定した
電子交換機に供給して動作状況を監視１．接続完了呼数
等の接続情報を出力するものである。該擬似呼発生条件
は起動に先立ち、発生呼数・保貿時間・接続積別・加入
者操作等の擬似呼発生条件を設定する必要があり、また
試験中も該擬似呼発生装置を監視［、出力する前記接続
＋ＷＩｇＭを収集すると同時に、電子交換機が輻緒勢の
異常状態となりた時に動作を停止させる等の作業を必要
とする。か＼る擬似呼発生装置の欠点を改良し、前記擬
似呼発生条件を設定後は、試験の開始から終了迄の一連
の試験手順を自動化した電子交換機能検証機も使用され
ている。然しか＼る電子交換機能検証機においても、試
験中の電子交換機が異常状態となった場合の動作停止等
は試験者の４ｙ作を必要とし、また異常状態の発生によ
り、主記憶装置内の電子交換ブロクラムのみならず外部
記憶装置に格納されている電子交換プログツムをも破壊
する可能性もｔＤ、か＼る場合には停止した電子変換機
の動作を再開させ、試験を続行することが不可能となる
。The pseudo call generating device generates a pseudo call under predetermined conditions, supplies the electronic exchange program to be tested to the electronic exchange set in the main memory, and monitors the operating status.1. It outputs connection information such as the number of connected calls. Prior to activation, it is necessary to set the pseudo call generation conditions, such as the number of calls generated, trade protection time, connection classification, subscriber operation, etc. Also, the pseudo call generation device must be monitored during the test. , it is necessary to collect the connection +WIgM to be output and at the same time to stop the operation when the electronic exchange becomes in an abnormal state of transmission. An electronic switching function verification machine is also in use that has improved the drawbacks of the pseudo call generation device and automated a series of test procedures from the start to the end of the test after setting the pseudo call generation conditions. However, even with the electronic switching function verification machine, if the electronic switching equipment under test becomes abnormal, the tester must perform 4 years to stop the operation, and due to the occurrence of an abnormal state, the main memory There is a possibility of destroying not only the electronic exchange program but also the electronic exchange program stored in the external storage device.In such a case, it is impossible to restart the stopped electronic converter and continue the test. It becomes possible.
（ｃｌ 発明の目的
本発明の目的は、前述の如き従来ろる′電子交換ブロク
ラムの試験装置の欠点を除去し、前記電子交換プログラ
ムの検１の２）の一連の試験操作を極力自動化するのみ
ならず、電子交換機が異常状態を呈した場合にも試験の
再開が可能な電子交換プログラムの試験装置を実現する
ことに在る。(cl. Purpose of the Invention) The purpose of the present invention is to eliminate the drawbacks of the conventional test equipment for electronic exchange programs as described above, and to automate as much as possible the series of test operations of test 1 and 2 for the electronic exchange program. Instead, the object is to realize a test device for an electronic exchange program that can restart the test even if the electronic exchange exhibits an abnormal state.
（ｄ） 発明の構成
この目的は、電子交換機に擬似呼を供給し、動作状態を
監視することにより電子交換プログラムを横１する試ｙ
装置において、１５に要数の試験手順情報、試験対象と
する電子り俟プログラムおよび試練成績情報を格納する
記憶手段と、骸市子変換プログラムを前記電子交換機の
主記憶装置に転送する記憶情報転送手段と、前記擬似呼
を前記電子交換機に供給し２候続情報を出力する擬似呼
発生装置との間に情報転送を行う擬似呼情報転送手段と
、前記電子交換機の中央制御装置との間に情報転送を行
う制御情報転送手段と、前記各試験手順情報を顆次前記
記憶手段から抽出し、該抽出された試験手順情報に基づ
き、前記電子交換プログラムを前記主記憶装置に格納し
た前記電子交換機に前記擬似呼発生装置から擬似呼を供
給した場合の動作状態を監視し、得られる試験成績情報
を前記記憶手段に格納する試験を順次実行する制御手段
とを設けることにより速成される。(d) Structure of the Invention The object is to provide an attempt to horizontally control an electronic switching program by supplying pseudo calls to the electronic switching system and monitoring its operating status.
In the apparatus, 15 includes a storage means for storing a required number of test procedure information, an electronic program to be tested, and trial result information, and a storage information transfer unit for transmitting the Mukuro Ichiko conversion program to the main storage device of the electronic exchange. and a pseudo call generating device that supplies the pseudo call to the electronic exchange and outputs two candidate information, and a pseudo call information transfer means that transfers information between the means and a central control device of the electronic exchange. control information transfer means for transferring information; and the electronic exchanger which extracts each of the test procedure information from the storage means and stores the electronic exchange program in the main storage device based on the extracted test procedure information. This can be quickly accomplished by providing a control means for sequentially executing a test that monitors the operating state when a pseudo call is supplied from the pseudo call generating device and stores the obtained test result information in the storage means.
（ｅ） 発明４案の実施例 以下、本発明の一実施例を図面によシ観明する。(e) Examples of the four invention proposals An embodiment of the present invention will be explained below with reference to the drawings.
第１図は本発明の一実施例による電子交換プログラムの
試験装置を示す図であシ、第２図は第１図における動作
過程の一例を示す流れ図、第３図は第２図における試験
手順情報実行過程の一例を示す流れ図である。第１図に
おいて、電子交換プログラムの試験装置（以下試験装置
１０と称す）には、Ｐｊｒ賛数の試験手順情報を格納す
る記憶手段としての試験手順記憶装置１２、所要数の試
験対象とする電子交換プログラムを格納する記憶手段と
してのプログラム記憶装置１７および試験を実行した結
果収集される試験成績情報を格紀する記が゛
憶手段としての試験成績記憶装置１９ｆ！設けられてい
る。なお 前記試験手順情報とは、所定の電子交換プロ
グラムを、所定状態に初期設定された゛（子交候機３０
に、所定の擬似呼発生条件に基づいて発生する擬似呼を
供給することにより、第３図に示される過程で実行され
るＫｈの手順を指定する情報である。従って電子交換プ
ログラムの１類、電子交換機３０の初期設定状態および
擬似呼発生条件の少なくも何れかが異なる試験を連続し
て実行する場合には、それぞれの試験に対応する試験手
順情報を試験手順記憶装置１２に格納しておく必要があ
る。また電子交換機３０の通話路系装置３５の加入者栂
および局間中継線には公知の快似呼発生装勤２０が接続
さｔ］ている０試験装置１０には、該績似叶光生４＆ｆ
ＩＬ２０との間に擬似呼発生条件および接続情報等の振
似呼情報の転送を行う擬似呼転送手段としての擬似呼転
送１１１１５が設けられておシ、史に電子交換機３０の
中央制御装置３１との間に、該中央制御装置３０が保守
パネル装置ｔ３３との間で交換すると同様の各、Ｓ制御
情報の転送を行う制御情報転送手段としての制御情報転
送装置１６および主記憶装置３２に対し、試験対象とす
る電子交換プログラムを転送する記憶情報転送手段とし
ての記憶情報転送装置ｔｓが設けられている。更に試験
装置１０には前記試験手順情報に基づく試験を順次実行
する制御手段としての制御装置１１、内部記憶装置１１
４および外部記憶制御装置１３が設けられている。以下
、第２図および第３図を用いて試験装置の動作過程の一
例を説明する。第２図において、試験手順情報装ｆｉｌ
ｌ１２に所要数の試験手順情報が格納され、またプログ
ラム記憶装置１７に所要数の電子交換プログラムが格納
されると（ステップ１）、制御装置１１は外部記憶制御
装置１３を介して試験手順記憶装置１２から試験手順情
報を１組抽出し、内部記憶装置１４に格納する（ステッ
プ２）。内部記憶装置１４に格納した試験手順情報に基
づき、制御装ｗ１１は第３１に示される如き試験を実行
する（ステップ４）ｏ該試験手順情報による試験が終了
すると、制御装置１１は再び試験手順記憶装置１２から
他の試験手職情報を１組抽出し、以下同様の過程で試験
を実行する。試験手順記憶装置１２に格納されている総
べての試験手順情報に基づく試験が終了すると（ステッ
プ３）、制御装置１１は試験手職記憶装置１２を解放し
くステップ５）、新たな所費数の試験手順情報が試験手
順情報記憶装置１２に格納されるのを待機する（ステッ
プ６）。FIG. 1 is a diagram showing a testing device for an electronic exchange program according to an embodiment of the present invention, FIG. 2 is a flowchart showing an example of the operation process in FIG. 1, and FIG. 3 is a test procedure in FIG. 2. 2 is a flowchart illustrating an example of an information execution process. In FIG. 1, an electronic exchange program test device (hereinafter referred to as test device 10) includes a test procedure storage device 12 as a storage means for storing test procedure information for Pjr approval, and a required number of electronic devices to be tested. A program storage device 17 as a storage device for storing the exchange program and a test result storage device 19f as a storage device for storing test result information collected as a result of executing the test! It is provided. Note that the test procedure information refers to information on the initial setting of a predetermined electronic exchange program to a predetermined state (sub-aircraft 30).
This is information specifying the procedure of Kh to be executed in the process shown in FIG. 3 by supplying a pseudo call generated based on predetermined pseudo call generation conditions to. Therefore, when performing tests in succession that differ in at least one of the type 1 electronic exchange program, the initial setting state of the electronic exchange 30, and the pseudo call generation conditions, the test procedure information corresponding to each test is It is necessary to store it in the storage device 12. In addition, a known similar call generation device 20 is connected to the subscriber line and the inter-office relay line of the communication line system device 35 of the electronic exchange 30.
A pseudo call transfer 11115 is provided between the IL 20 and the central controller 31 of the electronic exchange 30 as a pseudo call transfer means for transferring pseudo call information such as pseudo call generation conditions and connection information. During this time, the central control device 30 exchanges the same information with the maintenance panel device t33, and the control information transfer device 16 and the main storage device 32 as control information transfer means that transfer S control information. A storage information transfer device ts is provided as a storage information transfer means for transferring an electronic exchange program to be tested. Furthermore, the test apparatus 10 includes a control device 11 and an internal storage device 11 as control means for sequentially executing tests based on the test procedure information.
4 and an external storage control device 13 are provided. An example of the operation process of the test device will be described below with reference to FIGS. 2 and 3. In Figure 2, the test procedure information system fil
When the required number of test procedure information is stored in the l12 and the required number of electronic exchange programs are stored in the program storage device 17 (step 1), the control device 11 stores the test procedure information in the test procedure storage device via the external storage control device 13. One set of test procedure information is extracted from 12 and stored in the internal storage device 14 (step 2). Based on the test procedure information stored in the internal storage device 14, the control device w11 executes a test as shown in No. 31 (step 4) o When the test based on the test procedure information is completed, the control device 11 again stores the test procedure. One set of other test craft information is extracted from the device 12, and the test is subsequently executed in the same process. When the test based on all the test procedure information stored in the test procedure storage device 12 is completed (step 3), the control device 11 releases the test skill storage device 12 (step 5) and calculates a new number of expenses. The test procedure information is stored in the test procedure information storage device 12 (step 6).
次に各試験手順情報に基づく試験の実行（ステップ４）
の詳細を第３図により゛説明する９最初に制御装置１１
は内部記憶装ｆｆ１ｉ１４に格納されている試験手順情
報の中から擬似呼発生装置１２０に初期設定すべき前記
擬似呼発生条件を指定する擬似呼情報を抽出し、擬似呼
情報転送装置１５を介して擬似呼発生装置Ｉｔ２０に転
送する（ステップ４１）。Next, execute the test based on each test procedure information (step 4)
The details of the control device 11 will be explained with reference to FIG.
extracts pseudo call information specifying the pseudo call generation conditions to be initialized in the pseudo call generation device 120 from the test procedure information stored in the internal storage device ff1i14, and transfers it via the pseudo call information transfer device 15. The call is transferred to the pseudo call generating device It20 (step 41).
次に制御装ｆｉｌｌは前記拭り月＝Ｉｌｉｊ情報から中
央制御装置３１の内部レジスタ類に設定すべき各種制御
情報（例えば動作停止すべき異常状態の判定値等）を制
御情報転送装置１６を介して中央制御装置３１に転送す
る（ステップ４２）ｅ１次に制御装置１１は前記試験子
１＠情報により指定される電子交換プログラムを、プロ
グラム記憶装置１７から外部記憶制御装置１１３を介し
て抽出し、記憶情報転送装置１８を介して主記憶装置３
２に転送する（ステップ４３）。次に制御装置ｔｔＵ擬
似呼情報転送装置１５を介して擬似呼発生装置２０を起
動しくステップ４４′）Ｓ前記試験手順情報によシ指定
される監視時間を内蔵する監視タイマに設定した後（ス
テップ４５）、制御情報転送装置１６を介して中央制御
装置３１に起動信号を転送する（ステップ４６）。以後
制御装置１１は制御情報転送装置１６を介して中央制御
装置３１の内部レジスタ類の各種情報を監視しくステッ
プ４７ｘまた擬似呼情報転送装置１５を介して擬似呼発
生装［２０が出力する前記接続情報を監視しくステップ
４８）、何れもが前記試験手順情報により指定される条
件を満足した状態で、前記監視タイマが所定の監視時間
の経過を示すと（ステップ４９および４１０）、制御情
報転送装置１６を介して中央制御装置３１に停止信号を
転送して、電子交換機３０を動作停止させる（ステップ
４１１）、なお腋の監視時間が経過しない間に、中央制
御装［３１からの制御情報、または擬似呼発生装置２０
からの接続情報が前記試験手順情報によシ指定される条
件を満足しなくなった場合、制御装ｆｋＬ１１は電子交
換機３０が異冨状態に在ると判定し、動作を停止させる
。Next, the control device fill sends various control information (for example, a judgment value of an abnormal state in which operation should be stopped, etc.) to be set in the internal registers of the central control device 31 from the wipe month = Ilij information via the control information transfer device 16. and transfers it to the central control device 31 (step 42) e1 Next, the control device 11 extracts the electronic exchange program specified by the test child 1@ information from the program storage device 17 via the external storage control device 113, Main storage device 3 via storage information transfer device 18
2 (step 43). Next, the pseudo call generating device 20 is activated via the control device ttU pseudo call information transfer device 15 (Step 44') S After setting the monitoring time designated by the test procedure information in the built-in monitoring timer (Step 44') 45), the activation signal is transferred to the central control device 31 via the control information transfer device 16 (step 46). Thereafter, the control device 11 monitors various information in the internal registers of the central control device 31 via the control information transfer device 16. At step 47 When the monitoring timer indicates that a predetermined monitoring time has elapsed (steps 49 and 410), the control information transfer device A stop signal is transferred to the central controller 31 via the central controller 16 to stop the electronic exchange 30 from operating (step 411), and while the armpit monitoring time has not elapsed, the control information from the central controller 31 or Pseudo call generator 20
If the connection information from the electronic exchange 30 no longer satisfies the conditions specified by the test procedure information, the control device fkL11 determines that the electronic exchange 30 is in an abnormal state and stops its operation.
何れの場合にも、電子交換機３０の動作停止後、制御装
置１１は擬似呼情報転送装＃Ｌ１５、制御情報転送装置
１６および記憶情報転送装置１８を介して、擬似呼発生
装置２０、中央制御装置３１および主記憶装置！３２か
ら試験手順情報の指定する各種情報を収集シフ、該試験
手順情報に対応する試験成績情報として、外部記憶制御
装置１３を介して試験成績情報装［１９に格納する。In either case, after the electronic exchange 30 stops operating, the control device 11 communicates with the pseudo call generation device 20, the central control device via the pseudo call information transfer device #L15, the control information transfer device 16, and the storage information transfer device 18. 31 and main memory! Various information specified by the test procedure information is collected from 32 and stored in the test result information device 19 via the external storage control device 13 as test result information corresponding to the test procedure information.
以上の説明から明らかな如く、本実り例によれば、試験
対象とする電子交換プログラムは試験装置１０内のプロ
グラム記憶装置１７に格納され、別に準備された試験手
順情報に基づいて、試験実行の都度電子交換機３０の主
記憶装置３２に設定されるので、試験の結果電子交換機
３０が異常状態となつ九場合にも、以後の試験手順情報
に基づく試験が支障無く継続可能となる。なお所要数の
試験手順情報を予め単信することによシ、各試験手順情
報に基づく桧柾は自動的に継続される０なお、第１図乃
至第３図はあく迄本発明の一実施例に過ぎず、例えば試
験装＠ｉｏの構成は図示されるものに限定されることは
無く、他に競争の変形が考慮されるが、何れの場合にも
本発明の効果は変らない０また試験装置１０の動作過程
は図示されるものに限定されることは無く、他に幾多の
変形が考慮されるが、何れの場合にも本発明の効果は変
らない。As is clear from the above explanation, according to this practical example, the electronic exchange program to be tested is stored in the program storage device 17 in the test device 10, and the test execution is performed based on separately prepared test procedure information. Since it is set in the main storage device 32 of the electronic exchange 30 each time, even if the electronic exchange 30 is in an abnormal state as a result of the test, subsequent tests based on the test procedure information can be continued without any problem. By transmitting the required number of test procedure information in advance, the process based on each test procedure information is automatically continued. Note that FIGS. 1 to 3 only show one implementation of the present invention. This is merely an example; for example, the configuration of the test equipment @io is not limited to what is shown in the drawings, and other competitive variations may be considered; however, in any case, the effects of the present invention remain the same. The operating process of the test device 10 is not limited to that shown in the drawings, and many other modifications may be considered, but the effects of the present invention remain the same in any case.
（ｆ＞ 発明ｔｇの効果
以上、本発明によれば、前記電子交換プログラムの試験
装置において、予め試験対象となる電子交換プログラム
および試験手順情報を所要数、前記試験装置に準備する
ことによシ、所要の電子交換プログラムの試験が連続し
て自動的に実施され、途中で電子交換機が異常状態を呈
した場合にも、以後の検証が支障無く継続可納となる。(f> Effects of Invention tg) According to the present invention, in the electronic exchange program testing device, a required number of electronic exchange programs to be tested and test procedure information are prepared in advance in the testing device. , Tests of the required electronic exchange program are automatically conducted continuously, and even if the electronic exchange exhibits an abnormal state during the process, subsequent verification can be continued without any problem.
４ 図面の簡単なり！！、明
第１図は本発明の一実施例による電子交換プログラムの
試験装置を示す図、第２−は第１図における動作過程の
一例を示す流れ図、第３図は第２図における試験手順情
報実行過程の一例を示す流れ図である。 ：、、
。4. Easy drawing! ! , Fig. 1 is a diagram showing a testing device for an electronic exchange program according to an embodiment of the present invention, Fig. 2- is a flowchart showing an example of the operation process in Fig. 1, and Fig. 3 is a diagram showing test procedure information in Fig. 2. It is a flowchart which shows an example of an execution process. :,,
.
図において、１０は試験装置、１１は制御装置、１２は
試験手順情報装Ｗｌ、ｌａは外部記憶制御装置、１４は
内部記憶装置、１５は擬似呼情報転送装置、１６は制御
情報転送装置、１７はプログラム記憶装置、１８は記惰
情報転送装置、１９社試験成績記憶装置、２０は擬似呼
発生装撫、３０は電子交換機、３１は中央制御装置、３
２は主記憶装置、３３は保守パネル製筒、３４はデータ
チャネル装置、３５は通話路系装置、３６Ｖｉ外部記憶
装隨、３７は入出力製型、を示す。In the figure, 10 is a test device, 11 is a control device, 12 is a test procedure information device Wl, la is an external storage control device, 14 is an internal storage device, 15 is a pseudo call information transfer device, 16 is a control information transfer device, 17 1 is a program storage device, 18 is a storage information transfer device, 19 is a test result storage device, 20 is a pseudo call generator, 30 is an electronic exchange, 31 is a central control device, 3
2 is a main storage device, 33 is a maintenance panel cylinder, 34 is a data channel device, 35 is a communication line system device, 36 is a Vi external storage device, and 37 is an input/output mold.
Claims (1)
によシミ子交換プログラムを横１する試験装置において
、所要数の試験手順情報、試験対象とする電子交換プロ
グラムおよび試験成績情報を格納する記憶手段と 該電
子交換プログラムを前記電子交換機の主記憶装置に転送
する記憶情報転送手段と、前記擬似呼を前記電子交換機
に供給し接続情報を出力する擬似呼発生装置との間に情
報転送を行う擬似呼情報転送手段と、前配電子交換機の
中央制御装置との間に情報転送を行う制御情報転送手段
と、前記各試験手順情報を１−次前記記憶手段から抽出
し、該抽出された試験手順情報に基づき、前記電子交換
プログラムを前記主記憶装置に格納した前記電子変換機
に前記擬似呼発生装置から擬似呼を供給した場合の動作
状態を監視し、得られる試験成績情報を前■し記憶手段
に格納する試験を順次実行する制御手段とを設けること
を特徴とする電子父換プログラムの試験装置。In a test device that horizontally performs a stain exchange program by supplying pseudo calls to an electronic exchange and monitoring its operating status, a required number of test procedure information, electronic exchange programs to be tested, and test result information are stored. Information transfer is performed between a storage means, a storage information transfer means for transferring the electronic exchange program to a main memory of the electronic exchange, and a pseudo call generation device for supplying the pseudo call to the electronic exchange and outputting connection information. a control information transfer means for transferring information between a pseudo call information transfer means for performing pseudo call information, a control information transfer means for transferring information between a central control device of a predistribution electronic switch, and a control information transfer means for transferring information between the pseudo call information transfer means and a central control device of a predistribution electronic exchange; Based on the test procedure information, the operating state when a pseudo call is supplied from the pseudo call generator to the electronic converter storing the electronic exchange program in the main storage device is monitored, and the obtained test result information is and control means for sequentially executing the tests stored in the storage means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20893881A JPS58108853A (en) | 1981-12-23 | 1981-12-23 | Testing device for electronic exchange program |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20893881A JPS58108853A (en) | 1981-12-23 | 1981-12-23 | Testing device for electronic exchange program |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58108853A true JPS58108853A (en) | 1983-06-29 |
| JPH0221708B2 JPH0221708B2 (en) | 1990-05-15 |
Family
ID=16564613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20893881A Granted JPS58108853A (en) | 1981-12-23 | 1981-12-23 | Testing device for electronic exchange program |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58108853A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62253256A (en) * | 1986-04-18 | 1987-11-05 | Fujitsu Ltd | Method for automatically generating testing condition |
| JPH0338956A (en) * | 1989-07-05 | 1991-02-20 | Nec Corp | Automatic test equipment |
| JP2009297324A (en) * | 2008-06-16 | 2009-12-24 | Mitsubishi Heavy Ind Ltd | Radiotherapy apparatus and gantry angle restriction method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5136009A (en) * | 1974-09-24 | 1976-03-26 | Oki Electric Ind Co Ltd | FUAKUSHIMIRISHINGONADONOKIOKUHOHO |
| JPS53100711A (en) * | 1977-02-15 | 1978-09-02 | Nec Corp | Automatic call test equipment |
-
1981
- 1981-12-23 JP JP20893881A patent/JPS58108853A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5136009A (en) * | 1974-09-24 | 1976-03-26 | Oki Electric Ind Co Ltd | FUAKUSHIMIRISHINGONADONOKIOKUHOHO |
| JPS53100711A (en) * | 1977-02-15 | 1978-09-02 | Nec Corp | Automatic call test equipment |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62253256A (en) * | 1986-04-18 | 1987-11-05 | Fujitsu Ltd | Method for automatically generating testing condition |
| JPH0457264B2 (en) * | 1986-04-18 | 1992-09-11 | Fujitsu Ltd | |
| JPH0338956A (en) * | 1989-07-05 | 1991-02-20 | Nec Corp | Automatic test equipment |
| JP2009297324A (en) * | 2008-06-16 | 2009-12-24 | Mitsubishi Heavy Ind Ltd | Radiotherapy apparatus and gantry angle restriction method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0221708B2 (en) | 1990-05-15 |
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