JPS62253256A - Method for automatically generating testing condition - Google Patents

Abstract

PURPOSE:To automatically set the testing load of an electronic exchange without any handwork, by inputting the designing information and testing conditions of the electronic exchange. CONSTITUTION:A CPU 1 stores the state transition diagram of an electronic exchange drawn by a graphic editor 4 in an external storage device 5 as the described state transient information 51 of the electronic exchange. A prescribed number of testing condition commands inputted from an input device 3 is ana lyzed and discriminated at the CPU 1 and a route extracting section 12 is actuat ed. The section 12 extracts testing route information from the information 51 and prepares measuring stage information by referring to a test condition data base 54, and then, actuates a measuring condition setting section 13 and converting section 14 for load generating device. Then a macro-converting section 15 and load quantity setting section 16 are actuated and the section 16 loads a load generating device macro-table 53, and thus, the desired table 53 is automatically implemented.

Description

[Detailed Description of the Invention] [Summary] By extracting test route information based on test conditions from electronic exchange design information, setting measurement conditions, and converting to load generator test conditions, load generator test conditions can be automatically set. , dynamically generated, reducing man-hours, belief! We aim to improve our social skills.

[Industrial application field]

The present invention relates to a test condition automatic generation method for automatically creating test conditions for a load generator that generates a test load for an electronic exchange.

In the process of developing electronic exchanges or when adding functions after the start of operation, we generate simulated loads under various specified conditions in order to confirm stable operation under various load conditions. Load generators that apply power to target electronic exchanges are being put into practical use.

(Problems to be solved by the prior art and the invention) In order to generate the required load in this type of load generation device, a large number of changes must be made, such as the type of load, the amount of load, and the processing method when a failure occurs. Data (hereinafter referred to as test conditions) must be prepared according to the test purpose.

In the past, all test conditions of this type were created manually, which required a huge amount of man-hours and made it extremely difficult to generate various loads that covered the expected conditions. There was a problem that a highly accurate confirmation test could not be carried out.

[Means for solving problems]

FIG. 1 is a diagram showing the principle of the present invention.

In FIG. 1, 100 is the design information of the electronic exchange to which the load generator applies the load, 200 is the test condition specifying the load to be generated, 300 is the test route information extracted from the design information 100, and 600 is the load These are the test conditions for the generator.

400 is a test path extraction step provided according to the present invention.

500 is a measurement condition setting step provided according to the present invention.

700 is a conversion step provided by the present invention.

[Effect]

In the test route extraction step 400, test route information 300, which is the target of the load that should not be generated, is extracted from the received electronic exchange design information 100 based on the test conditions 200.

In the measurement condition setting step 500, measurement conditions such as delay time measurement are set in the test route information 300 extracted by the test route extraction step 400.

In the conversion step 700, the test route information 300 in which measurement conditions are set is converted into load generator test conditions 600 for operating a load generator that generates a test load for the electronic exchange.

Through the above process, when the electronic exchange design information 100 and test conditions 200 are input, the test conditions 600 for generating the required load on the load generator are automatically generated. The number of man-hours is significantly reduced, it becomes possible to generate various loads that meet all the assumed conditions, and the operational stability of the electronic exchange is confirmed with high accuracy.

〔Example〕

An embodiment of the present invention will be described below with reference to the drawings.

FIG. 2 is a diagram showing a test condition automatic generation system according to an embodiment of the present invention, FIG. 3 is a diagram showing an example of the test condition automatic generation process in FIG. 2, and FIG. 4 is a diagram showing an example of the test condition automatic generation process in FIG. FIG. 5 is a diagram showing an example of a state transition diagram, FIG. 5 is a diagram showing an example of a test path, FIG. 6 is a diagram showing an example of a measurement stage, and FIG. 7 is a diagram showing an example of insertion of a measurement process. FIG. 8 is a diagram showing an example of adding conditions.

The tester uses the graphic editor 4 provided in the test condition automatic generation system to draw, for example, a state transition diagram representing the operation of the electronic exchange as shown in FIG.

In FIG. 4, when the central processing unit 1 detects a call from a subscriber (step 3101), it identifies whether the calling subscriber is a general subscriber or a special subscriber such as a toll-free subscriber (step 5102), If you are a subscriber, move to special number processing,
If you are a general subscriber, you are a subscriber who uses a rotary dial telephone (
(hereinafter referred to as a DP subscriber) or a subscriber using a push-button dialing telephone (hereinafter referred to as a PB subscriber) (step 3103); if the subscriber is a DP subscriber, an instruction to start receiving digits using a dial pulse (step 3103); 510
4), and a search instruction for the storage area (SLT) that stores various information related to the call (step 5105) is executed to the corresponding processing unit, and a dial tone (DT) is sent to the caller (step 5106). A transition is made to the sound sending state (step 5107).

When the calling party sends out a dial pulse, the central processing unit 1 receives the digits (step 810.8).

On the other hand, as a result of the identification in step 5103, if the subscriber is a PB subscriber, an instruction to start receiving digits using a push-button dialing signal (step 5109) and an instruction to search a storage area (SLT) for storing various information related to outgoing calls (step 5Lio ) is executed on the corresponding processing unit to send a dial tone (DT) to the caller (step 5111), and transition to a dial tone sending state (step 5112).

When the caller sends the PB double signal, the electronic exchange receives the digits (step 5113).

The central processing unit 1 stores electronic exchange state transition information 51 in which the state transition diagram shown in FIG. The information 6100 is stored in the external storage device 5.

Next, the tester inputs a test condition command string 11 consisting of the following six test condition commands 010 to 060 from the input/output device 3 as the test condition 200.

010 $0FFICE LOCAL [General local route extraction instruction] 020 $TERM Dp:to.

(DP subscriber, specify 100 lines) 030 $TRF DPDL, RBTDL (Specify measurement of transmission delay time of dial tone and ring tone as measurement condition) 040 $CUT B; 1.A; 2.D; 3 [On the way] Specify the abandonment rate as the ratio before broadcasting (B), after broadcasting (A), and during broadcasting (D)] 050 $FREE O; 2.T; 2.A; 1 0), specified by the ratio of called party's first call (T) and called party's re-answer (A)] 060 $PROCA,
X, BAY, C, Z [Processing when errors A, B, C occur x
, y, and z] The central processing unit 1 analyzes the test condition command 010 input from the input/output device 3, identifies that the extraction of a general local route is specified, and further specifies the test condition command 0.
20, and if it is identified that a DP subscriber is specified, the route extractor 12 is activated.

The route extraction unit 12 extracts a test route (as shown in FIG.
Test route information 300 corresponding to steps 5101 to 5108) is extracted.

Next, the central processing unit 1 analyzes the test condition commands 030 and 060 input from the input/output device 3, and when it identifies that the measurement of the transmission delay time of the dial tone and the ring tone is specified, the central processing unit Referring to the test condition database 54 stored in the test condition database 54, for example, as a measurement point for the transmission delay time of a beep, as shown in FIG. Measurement stage information corresponding to the measurement stage diagram is created, and the measurement condition setting section I3 and the load generation device conversion section 14 are activated.

The measurement condition setting section 13 and the load generation device conversion section 14 refer to the test condition database 54 based on the measurement stage information, and convert the 0FFHOOK signal reception instruction (step 5IOI) shown in FIG. 6 to the one shown in FIG. How <OFF
It is converted into a HOOK signal sending instruction (step 5201), and further a timer set instruction (step S202) is inserted based on the * mark added to the step 5IOI.

Note that the subscriber's phone i identification (step 5 IO3), number reception start instruction (step S104), and storage area search instruction (step 5105) are processed within the electronic exchange, so they are ignored as they are irrelevant to the load generator. .

Next, a tone transmission instruction (step 5106) in FIG.
) as shown in FIG.
03) and further instructs the timer to run continuously based on the ** mark added to step 5106 (step 5204)
Insert.

Next, the tone transmission state in FIG. 6 (step 510
7) in the dial tone reception state (step 5) as shown in FIG.
205) and further converts the number reception instruction (
Step 3108) is converted into a numeric sending instruction (step 8206) as shown in FIG.

Furthermore, a measurement condition setting section 13 and a load generation device direction conversion section 1
4 is based on the analysis results of the test condition commands 040 and 060, and the beep tone reception instruction (step 3) in FIG.
After step 203), a step 5301 is inserted to determine whether the received signal tone is a dial tone or not, and if it is not a dial tone, the process moves to error processing.

Also, the dial tone reception state in FIG. 7 (step 5205)
), a step 5302 for identifying mid-term abandonment is inserted, and if it is a mid-term abandonment, the process moves to mid-term abandonment processing.

When the above process is completed, the central processing unit 1 creates load generation device state transition information 52 that describes the load generation device state transition diagram as shown in FIG. The data is stored in the storage device 5.

Next, the central processing unit 1 activates the macro conversion section 15 and the load amount setting section 16.

The macro conversion unit 15 refers to the macro dictionary 55 and converts the load ordering device state transition information 52 described in communication software functional specification description language (SDL) into load generation device test conditions 600 suitable for the load generation device. is converted into the load generator macro table 53.

The load amount setting unit 16 calculates the holding time from the time required for each state transition on the load generation device state transition diagram, further takes into account the abandonment rate, and determines the call origination that can maximize the processing capacity of the load ordering device. The interval (load) is calculated and loaded into the load generator macro table 53.

As is clear from the above description, according to this embodiment, by inputting the state transition information 51 of the target electronic exchange and the test condition command string 11, the required load generator macro table 53 is automatically created. generated.

Note that FIGS. 2 to 8 are merely examples of the present invention, and include, for example, a state transition diagram of an electronic exchange, a test route diagram, a measurement stage diagram, a measurement process insertion diagram, and a load generator state transition diagram. is not limited to what is shown in the drawings, and many other modifications may be considered, but the effects of the present invention remain the same in any case.

〔Effect of the invention〕

As described above, according to the present invention, by inputting the design information of the electronic exchange and the test conditions, the test conditions for generating the required load on the load generator are automatically generated, and the test conditions for creating the test conditions are automatically generated. This greatly reduces man-hours, makes it possible to generate a variety of loads covering all possible conditions, and confirms the operational stability of the electronic exchange with high accuracy.

[Brief explanation of drawings]

Fig. 1 is a diagram showing the principle of the present invention, Fig. 2 is a diagram showing a test condition automatic generation system according to an embodiment of the present invention, and Fig. 3 is a diagram showing an example of the test condition automatic generation process in Fig. 2. , Fig. 4 shows an example of a state transition diagram of an electronic exchange, Fig. 5 shows an example of a test route, Fig. 6 shows an example of a measurement stage, and Fig. 7 shows an example of insertion of a measurement process. Figure 8
The figure is a diagram showing an example of adding conditions. In the figure, 1 is a central processing unit, 2 is a main storage device, 3 is an input/output device, 4 is a graphic editor, 5 is an external storage device, 6 to 8 are control devices, 11 is a test condition command string, and 12 is a route extraction part, 13 is δI11 constant condition setting part, 1
4 is a converter in the load generator, 15 is a macro converter, 16
51 is the load amount setting section, 51 is the electronic exchange state transition information, and 52 is the load amount setting section.
is load generator state transition information, 53 is a load generator macro table, 54 is a test condition database, 55 is a macro dictionary, 100 is design information, 200 is test condition, 300
is test route information, 400 is test route extraction step, 50
0 is the measurement condition setting step, 600 is the actual principle diagram of the throat 1 Country Ma41: : = 鞠fhf mortars'h # 'jj
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Claims (1)

[Claims] Electronic exchange design information (100) and test conditions (200)
), and receives test route information (300) from the electronic exchange design information (100) based on the test conditions (200).
), a test route extraction step (400) for extracting the test route information (300); a measurement condition setting step (500) for setting measurement conditions in the test route information (300) extracted by the test route extraction step (400); It is characterized by comprising a conversion step (700) of converting and outputting the set test route information (300) into load generator test conditions (600) for operating a load generator that generates a test load for the electronic exchange. A method for automatically generating test conditions.