JPS5797638A - Substrate for test of semiconductor chip - Google Patents

Substrate for test of semiconductor chip

Info

Publication number
JPS5797638A
JPS5797638A JP17320480A JP17320480A JPS5797638A JP S5797638 A JPS5797638 A JP S5797638A JP 17320480 A JP17320480 A JP 17320480A JP 17320480 A JP17320480 A JP 17320480A JP S5797638 A JPS5797638 A JP S5797638A
Authority
JP
Japan
Prior art keywords
substrate
pads
cable
test
semiconductor chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17320480A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6234145B2 (enrdf_load_stackoverflow
Inventor
Katsumi Yabe
Fumiyuki Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17320480A priority Critical patent/JPS5797638A/ja
Publication of JPS5797638A publication Critical patent/JPS5797638A/ja
Publication of JPS6234145B2 publication Critical patent/JPS6234145B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17320480A 1980-12-10 1980-12-10 Substrate for test of semiconductor chip Granted JPS5797638A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17320480A JPS5797638A (en) 1980-12-10 1980-12-10 Substrate for test of semiconductor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17320480A JPS5797638A (en) 1980-12-10 1980-12-10 Substrate for test of semiconductor chip

Publications (2)

Publication Number Publication Date
JPS5797638A true JPS5797638A (en) 1982-06-17
JPS6234145B2 JPS6234145B2 (enrdf_load_stackoverflow) 1987-07-24

Family

ID=15956035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17320480A Granted JPS5797638A (en) 1980-12-10 1980-12-10 Substrate for test of semiconductor chip

Country Status (1)

Country Link
JP (1) JPS5797638A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6234145B2 (enrdf_load_stackoverflow) 1987-07-24

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