JPS57187668A - Wiring method for printed-wiring plate - Google Patents
Wiring method for printed-wiring plateInfo
- Publication number
- JPS57187668A JPS57187668A JP56072752A JP7275281A JPS57187668A JP S57187668 A JPS57187668 A JP S57187668A JP 56072752 A JP56072752 A JP 56072752A JP 7275281 A JP7275281 A JP 7275281A JP S57187668 A JPS57187668 A JP S57187668A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- wiring
- plate
- printed
- disconnection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE:To obtain a wiring method enabling detection of a position of disconnection of a wiring pattern caused by microcracks or the like, by measuring an electrostatic capacitance between the wiring pattern and an earth pattern provided opposite to and directly below the wiring pattern. CONSTITUTION:A wiring pattern 2 is printed on a ceramic gase plate 5, while an earth pattern 3 is provided in an intermediate layer of the plate 5, in a position opposite to and just below the pattern 2. When disconnection of the pattern 2 is confirmed between terminals A and B, for instance, electrostatic capacitances C1 and C2 between the pattern 3 and the terminals A and B are measured. Then, the position of a disconnected place 8 is decided by comparing the capacitance C1 with C2 whose sum is constant because the width, thickness, etc. of the pattern 2 are constant, and thus a wiring method for a printed-wiring plate enabling detection of the position of disconnection of the wiring pattern caused by microcracks or the like is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56072752A JPS57187668A (en) | 1981-05-14 | 1981-05-14 | Wiring method for printed-wiring plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56072752A JPS57187668A (en) | 1981-05-14 | 1981-05-14 | Wiring method for printed-wiring plate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57187668A true JPS57187668A (en) | 1982-11-18 |
Family
ID=13498392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56072752A Pending JPS57187668A (en) | 1981-05-14 | 1981-05-14 | Wiring method for printed-wiring plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57187668A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006162525A (en) * | 2004-12-10 | 2006-06-22 | Hioki Ee Corp | Circuit board inspection apparatus and circuit board inspection method |
CN109557448A (en) * | 2017-09-25 | 2019-04-02 | 日本电产理德股份有限公司 | Base board checking device and substrate inspecting method |
-
1981
- 1981-05-14 JP JP56072752A patent/JPS57187668A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006162525A (en) * | 2004-12-10 | 2006-06-22 | Hioki Ee Corp | Circuit board inspection apparatus and circuit board inspection method |
CN109557448A (en) * | 2017-09-25 | 2019-04-02 | 日本电产理德股份有限公司 | Base board checking device and substrate inspecting method |
KR20190035510A (en) * | 2017-09-25 | 2019-04-03 | 니혼덴산리드가부시키가이샤 | Substrate inspection apparatus and substrate inspection method |
JP2019060627A (en) * | 2017-09-25 | 2019-04-18 | 日本電産リード株式会社 | Substrate inspection apparatus and substrate inspection method |
TWI816699B (en) * | 2017-09-25 | 2023-10-01 | 日商日本電產理德股份有限公司 | Substrate inspection device and substrate inspection method |
TWI873800B (en) * | 2017-09-25 | 2025-02-21 | 日商日本電產理德股份有限公司 | Substrate inspection device and substrate inspection method |
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