JPS5791531A - Detecting method for position of electronic part - Google Patents

Detecting method for position of electronic part

Info

Publication number
JPS5791531A
JPS5791531A JP16751880A JP16751880A JPS5791531A JP S5791531 A JPS5791531 A JP S5791531A JP 16751880 A JP16751880 A JP 16751880A JP 16751880 A JP16751880 A JP 16751880A JP S5791531 A JPS5791531 A JP S5791531A
Authority
JP
Japan
Prior art keywords
coordinates
reference pattern
detecting
window
average value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16751880A
Other languages
Japanese (ja)
Other versions
JPS6412091B2 (en
Inventor
Masahito Nakajima
Tetsuo Hizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16751880A priority Critical patent/JPS5791531A/en
Publication of JPS5791531A publication Critical patent/JPS5791531A/en
Publication of JPS6412091B2 publication Critical patent/JPS6412091B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To compress the data amount and calculating time required for detecting the position of a reference pattern of a plurality of samples by a self teaching system by employing the average value of position coordinates data and as reference coordinates. CONSTITUTION:Two reference patterns 14, 14', 15, 15' are respectively provided on the surface of a substrate 3 of sample 2 and of a chip 4. The coordinates (Xi, Yi) of the position of the reference pattern are obtained for the larger sample number N higher than the prescribed value, and the average value is stored as reference coordinates. Since the reference coordinates approximately coincide with the distribution center of the position of the entire reference pattern, the reference coordinates (Xi, Yi) are specified as the coordinates of the center P of the detecting window 1. The size of the detecting window 1 is set approximately equal to the width of distribution of the coordinates of the position of the reference pattern to reduce the signal amount in the quantity corresponding to the contraction of the area of the window and to also reduce the required calculating time.
JP16751880A 1980-11-28 1980-11-28 Detecting method for position of electronic part Granted JPS5791531A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16751880A JPS5791531A (en) 1980-11-28 1980-11-28 Detecting method for position of electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16751880A JPS5791531A (en) 1980-11-28 1980-11-28 Detecting method for position of electronic part

Publications (2)

Publication Number Publication Date
JPS5791531A true JPS5791531A (en) 1982-06-07
JPS6412091B2 JPS6412091B2 (en) 1989-02-28

Family

ID=15851169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16751880A Granted JPS5791531A (en) 1980-11-28 1980-11-28 Detecting method for position of electronic part

Country Status (1)

Country Link
JP (1) JPS5791531A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57188835A (en) * 1981-05-18 1982-11-19 Hitachi Ltd Recognizing method for position
JPS59210648A (en) * 1983-05-16 1984-11-29 Toshiba Corp Wire bonding method of semiconductor
JPS61119054A (en) * 1984-11-14 1986-06-06 Rohm Co Ltd Automatic wire-bonding device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0356381A (en) * 1989-07-25 1991-03-11 Hitachi Elevator Eng & Service Co Ltd Elevator installing winch

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57188835A (en) * 1981-05-18 1982-11-19 Hitachi Ltd Recognizing method for position
JPS59210648A (en) * 1983-05-16 1984-11-29 Toshiba Corp Wire bonding method of semiconductor
JPS61119054A (en) * 1984-11-14 1986-06-06 Rohm Co Ltd Automatic wire-bonding device

Also Published As

Publication number Publication date
JPS6412091B2 (en) 1989-02-28

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