JPS5779633A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5779633A
JPS5779633A JP15457780A JP15457780A JPS5779633A JP S5779633 A JPS5779633 A JP S5779633A JP 15457780 A JP15457780 A JP 15457780A JP 15457780 A JP15457780 A JP 15457780A JP S5779633 A JPS5779633 A JP S5779633A
Authority
JP
Japan
Prior art keywords
region
substrate
silicon
layer
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15457780A
Other languages
Japanese (ja)
Inventor
Masaru Ihara
Yoshihiro Arimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15457780A priority Critical patent/JPS5779633A/en
Publication of JPS5779633A publication Critical patent/JPS5779633A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76264SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76264SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
    • H01L21/76281Lateral isolation by selective oxidation of silicon

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Element Separation (AREA)

Abstract

PURPOSE:To enable to integrate a high voltage circuit and a low voltage high speed circuit on the same substrate of a semiconductor device by a method wherein single crystal semiconductor layers being insulated lectrically and having different film thickness are formed on the concave and region of a magnesia spinel layer. CONSTITUTION:After resist masks 4 are formed on the silicon single crystal substrate 3 to cover and protect the upper parts of an element isolation region, the exposed part of the silicon substrate 3 is etched using NaOH, etc., to form a concave region 10. The magnesia spinel layer 2 is formed on the substrate 3, and a silicon epitaxial layer 1 is formed on the upper surface of the layer 2 thereof. A part of the thin film silicon epitaxial layer in the convex regions are oxidized to form silicon dioxide 5, and electric isolation between the adjoining region is attained.
JP15457780A 1980-11-05 1980-11-05 Manufacture of semiconductor device Pending JPS5779633A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15457780A JPS5779633A (en) 1980-11-05 1980-11-05 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15457780A JPS5779633A (en) 1980-11-05 1980-11-05 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5779633A true JPS5779633A (en) 1982-05-18

Family

ID=15587255

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15457780A Pending JPS5779633A (en) 1980-11-05 1980-11-05 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5779633A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61164238A (en) * 1985-01-17 1986-07-24 Toshiba Corp Composite semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61164238A (en) * 1985-01-17 1986-07-24 Toshiba Corp Composite semiconductor device

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