JPS5779633A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5779633A JPS5779633A JP15457780A JP15457780A JPS5779633A JP S5779633 A JPS5779633 A JP S5779633A JP 15457780 A JP15457780 A JP 15457780A JP 15457780 A JP15457780 A JP 15457780A JP S5779633 A JPS5779633 A JP S5779633A
- Authority
- JP
- Japan
- Prior art keywords
- region
- substrate
- silicon
- layer
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
- H01L21/76281—Lateral isolation by selective oxidation of silicon
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To enable to integrate a high voltage circuit and a low voltage high speed circuit on the same substrate of a semiconductor device by a method wherein single crystal semiconductor layers being insulated lectrically and having different film thickness are formed on the concave and region of a magnesia spinel layer. CONSTITUTION:After resist masks 4 are formed on the silicon single crystal substrate 3 to cover and protect the upper parts of an element isolation region, the exposed part of the silicon substrate 3 is etched using NaOH, etc., to form a concave region 10. The magnesia spinel layer 2 is formed on the substrate 3, and a silicon epitaxial layer 1 is formed on the upper surface of the layer 2 thereof. A part of the thin film silicon epitaxial layer in the convex regions are oxidized to form silicon dioxide 5, and electric isolation between the adjoining region is attained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15457780A JPS5779633A (en) | 1980-11-05 | 1980-11-05 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15457780A JPS5779633A (en) | 1980-11-05 | 1980-11-05 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5779633A true JPS5779633A (en) | 1982-05-18 |
Family
ID=15587255
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15457780A Pending JPS5779633A (en) | 1980-11-05 | 1980-11-05 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5779633A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61164238A (en) * | 1985-01-17 | 1986-07-24 | Toshiba Corp | Composite semiconductor device |
-
1980
- 1980-11-05 JP JP15457780A patent/JPS5779633A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61164238A (en) * | 1985-01-17 | 1986-07-24 | Toshiba Corp | Composite semiconductor device |
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