JPS5779406A - Angle detecting method - Google Patents

Angle detecting method

Info

Publication number
JPS5779406A
JPS5779406A JP15469580A JP15469580A JPS5779406A JP S5779406 A JPS5779406 A JP S5779406A JP 15469580 A JP15469580 A JP 15469580A JP 15469580 A JP15469580 A JP 15469580A JP S5779406 A JPS5779406 A JP S5779406A
Authority
JP
Japan
Prior art keywords
elastic material
inclination
measured
angle
arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15469580A
Other languages
Japanese (ja)
Inventor
Shigeyasu Ueno
Shuji Sakaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP15469580A priority Critical patent/JPS5779406A/en
Publication of JPS5779406A publication Critical patent/JPS5779406A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C9/00Measuring inclination, e.g. by clinometers, by levels
    • G01C9/12Measuring inclination, e.g. by clinometers, by levels by using a single pendulum plumb lines G01C15/10

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

PURPOSE:To realize the detection of angle with a simple and miniature device, by attaching an elastic material with a weight fixed at its one end and measuring the bending degree of the elastic material. CONSTITUTION:A weight is attached to an end of an elastic material having the elasticity in a single direction, and the other end is fixed an object to be measured. Then the bending of the elastic material caused by the inclination of the object to be measured is measured to detect the angle of inclination. For instance, an elastic material 4 of a flat plate type and containing a weight 5 at its one end of attached to an arm 2 via an attachment part 3. The bending of the matter 4 which is caused according to the inclination of the arm 2 is detected by a distortion gauge 6 attached to the material 4. In such constitution, the angle of inclination of the arm 2 can be easily obtained from the intrinsic value of the material 4 and the measured value obtained by the gauge 6.
JP15469580A 1980-11-05 1980-11-05 Angle detecting method Pending JPS5779406A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15469580A JPS5779406A (en) 1980-11-05 1980-11-05 Angle detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15469580A JPS5779406A (en) 1980-11-05 1980-11-05 Angle detecting method

Publications (1)

Publication Number Publication Date
JPS5779406A true JPS5779406A (en) 1982-05-18

Family

ID=15589917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15469580A Pending JPS5779406A (en) 1980-11-05 1980-11-05 Angle detecting method

Country Status (1)

Country Link
JP (1) JPS5779406A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6516529B2 (en) * 2000-06-23 2003-02-11 Mitutoyo Corporation Touch signal probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6516529B2 (en) * 2000-06-23 2003-02-11 Mitutoyo Corporation Touch signal probe

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