JPS5773573A - Electronic beam scanning circuit - Google Patents
Electronic beam scanning circuitInfo
- Publication number
- JPS5773573A JPS5773573A JP55149165A JP14916580A JPS5773573A JP S5773573 A JPS5773573 A JP S5773573A JP 55149165 A JP55149165 A JP 55149165A JP 14916580 A JP14916580 A JP 14916580A JP S5773573 A JPS5773573 A JP S5773573A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- circuits
- signals
- generating circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/16—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by deflecting electron beam in cathode-ray tube, e.g. scanning corrections
- H04N3/22—Circuits for controlling dimensions, shape or centering of picture on screen
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Details Of Television Scanning (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55149165A JPS5773573A (en) | 1980-10-24 | 1980-10-24 | Electronic beam scanning circuit |
DE3140869A DE3140869C2 (de) | 1980-10-24 | 1981-10-14 | Abtasteinrichtung zum Abtasten einer Probe mittels eines geladenen Teilchenstrahls, insbesondere Elektronenstrahls |
US06/312,955 US4439681A (en) | 1980-10-24 | 1981-10-20 | Charged particle beam scanning device |
FR8119964A FR2493041B1 (fr) | 1980-10-24 | 1981-10-23 | Dispositif de balayage a faisceau de particules chargees |
GB8132261A GB2086182B (en) | 1980-10-24 | 1981-10-26 | A charged particle beam scanning device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55149165A JPS5773573A (en) | 1980-10-24 | 1980-10-24 | Electronic beam scanning circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5773573A true JPS5773573A (en) | 1982-05-08 |
JPS6240815B2 JPS6240815B2 (ja) | 1987-08-31 |
Family
ID=15469212
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55149165A Granted JPS5773573A (en) | 1980-10-24 | 1980-10-24 | Electronic beam scanning circuit |
Country Status (5)
Country | Link |
---|---|
US (1) | US4439681A (ja) |
JP (1) | JPS5773573A (ja) |
DE (1) | DE3140869C2 (ja) |
FR (1) | FR2493041B1 (ja) |
GB (1) | GB2086182B (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0314947A1 (de) * | 1987-11-03 | 1989-05-10 | Siemens Aktiengesellschaft | Schaltung zur vergrösserungsunabhängigen Bildverschiebung in einem Korpuskularstrahlgerät |
US5834774A (en) * | 1996-07-24 | 1998-11-10 | Jeol Ltd. | Scanning electron microscope |
US6727911B1 (en) * | 1999-04-28 | 2004-04-27 | Jeol Ltd. | Method and apparatus for observing specimen image on scanning charged-particle beam instrument |
JP4748714B2 (ja) * | 2005-10-28 | 2011-08-17 | エスアイアイ・ナノテクノロジー株式会社 | 荷電粒子ビーム走査照射方法、荷電粒子ビーム装置、試料観察方法、及び、試料加工方法 |
JP2007123164A (ja) * | 2005-10-31 | 2007-05-17 | Sii Nanotechnology Inc | 荷電粒子ビーム照射方法及び荷電粒子ビーム装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1398513A (en) * | 1971-05-18 | 1975-06-25 | Drayton W B D | Electron probe instruments |
GB1441824A (en) * | 1973-04-19 | 1976-07-07 | Cambridge Scientific Instr Ltd | Scanning electronbeam instrument |
US4057722A (en) * | 1975-09-25 | 1977-11-08 | Siemens Aktiengesellschaft | Method and apparatus for the generation of distortion-free images with electron microscope |
DE2617159A1 (de) * | 1976-04-20 | 1977-11-10 | Siemens Ag | Vorrichtung zur erzeugung rasterverzerrungsfreier rem-bilder |
JPS5275261A (en) * | 1975-12-19 | 1977-06-24 | Jeol Ltd | Test piece image dispaly unit |
-
1980
- 1980-10-24 JP JP55149165A patent/JPS5773573A/ja active Granted
-
1981
- 1981-10-14 DE DE3140869A patent/DE3140869C2/de not_active Expired
- 1981-10-20 US US06/312,955 patent/US4439681A/en not_active Expired - Fee Related
- 1981-10-23 FR FR8119964A patent/FR2493041B1/fr not_active Expired
- 1981-10-26 GB GB8132261A patent/GB2086182B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE3140869C2 (de) | 1985-04-11 |
JPS6240815B2 (ja) | 1987-08-31 |
FR2493041B1 (fr) | 1986-10-17 |
US4439681A (en) | 1984-03-27 |
DE3140869A1 (de) | 1982-06-16 |
GB2086182A (en) | 1982-05-06 |
FR2493041A1 (fr) | 1982-04-30 |
GB2086182B (en) | 1985-02-20 |
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