JPS5769584A - Non-volatile semiconductor memory - Google Patents

Non-volatile semiconductor memory

Info

Publication number
JPS5769584A
JPS5769584A JP14394880A JP14394880A JPS5769584A JP S5769584 A JPS5769584 A JP S5769584A JP 14394880 A JP14394880 A JP 14394880A JP 14394880 A JP14394880 A JP 14394880A JP S5769584 A JPS5769584 A JP S5769584A
Authority
JP
Japan
Prior art keywords
potential
line
vth5
writing
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14394880A
Other languages
English (en)
Japanese (ja)
Other versions
JPS628877B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Iwahashi
Masamichi Asano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14394880A priority Critical patent/JPS5769584A/ja
Priority to DE8686201618T priority patent/DE3177270D1/de
Priority to EP81304660A priority patent/EP0050005B1/en
Priority to EP19860201618 priority patent/EP0214705B1/en
Priority to DE8181304660T priority patent/DE3176751D1/de
Priority to US06/310,822 priority patent/US4477884A/en
Publication of JPS5769584A publication Critical patent/JPS5769584A/ja
Publication of JPS628877B2 publication Critical patent/JPS628877B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
JP14394880A 1980-10-15 1980-10-15 Non-volatile semiconductor memory Granted JPS5769584A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP14394880A JPS5769584A (en) 1980-10-15 1980-10-15 Non-volatile semiconductor memory
DE8686201618T DE3177270D1 (de) 1980-10-15 1981-10-07 Halbleiterspeicher mit datenprogrammierzeit.
EP81304660A EP0050005B1 (en) 1980-10-15 1981-10-07 Semiconductor memory with improved data programming time
EP19860201618 EP0214705B1 (en) 1980-10-15 1981-10-07 Semiconductor memory with improvend data programming time
DE8181304660T DE3176751D1 (en) 1980-10-15 1981-10-07 Semiconductor memory with improved data programming time
US06/310,822 US4477884A (en) 1980-10-15 1981-10-13 Semiconductor memory with improved data programming time

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14394880A JPS5769584A (en) 1980-10-15 1980-10-15 Non-volatile semiconductor memory

Publications (2)

Publication Number Publication Date
JPS5769584A true JPS5769584A (en) 1982-04-28
JPS628877B2 JPS628877B2 (enrdf_load_stackoverflow) 1987-02-25

Family

ID=15350768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14394880A Granted JPS5769584A (en) 1980-10-15 1980-10-15 Non-volatile semiconductor memory

Country Status (1)

Country Link
JP (1) JPS5769584A (enrdf_load_stackoverflow)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107493A (ja) * 1982-12-09 1984-06-21 Ricoh Co Ltd テスト回路付きｅｐｒｏｍメモリ装置
JPS6086169A (ja) * 1983-10-19 1985-05-15 Nippon Kayaku Co Ltd アゾ化合物の製法
JPS6090264A (ja) * 1983-10-25 1985-05-21 Nippon Kayaku Co Ltd ホルムアザン化合物及びそれを用いる繊維材料の染色法
JPS6090265A (ja) * 1983-10-25 1985-05-21 Nippon Kayaku Co Ltd ジスアゾ化合物の製造法
JPS60229300A (ja) * 1984-03-01 1985-11-14 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Ｅｅｐｒｏｍ型メモリ装置
US4984212A (en) * 1984-09-26 1991-01-08 Hitachi, Ltd. Semiconductor memory
US5136546A (en) * 1984-09-26 1992-08-04 Hitachi, Ltd. Semiconductor memory
US6404663B2 (en) * 1999-06-14 2002-06-11 Fujitsu Limited Semiconductor integrated circuit having testing mode for modifying operation timing
US6535441B2 (en) * 2001-01-23 2003-03-18 Mitsubishi Denki Kabushiki Kaisha Static semiconductor memory device capable of accurately detecting failure in standby mode

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107638A (en) * 1978-02-10 1979-08-23 Sanyo Electric Co Ltd Memory data readout circuit in semiconductor memory unit
JPS54110742A (en) * 1978-02-17 1979-08-30 Sanyo Electric Co Ltd Nonvolatile semiconductor memory device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107638A (en) * 1978-02-10 1979-08-23 Sanyo Electric Co Ltd Memory data readout circuit in semiconductor memory unit
JPS54110742A (en) * 1978-02-17 1979-08-30 Sanyo Electric Co Ltd Nonvolatile semiconductor memory device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107493A (ja) * 1982-12-09 1984-06-21 Ricoh Co Ltd テスト回路付きｅｐｒｏｍメモリ装置
JPS6086169A (ja) * 1983-10-19 1985-05-15 Nippon Kayaku Co Ltd アゾ化合物の製法
JPS6090264A (ja) * 1983-10-25 1985-05-21 Nippon Kayaku Co Ltd ホルムアザン化合物及びそれを用いる繊維材料の染色法
JPS6090265A (ja) * 1983-10-25 1985-05-21 Nippon Kayaku Co Ltd ジスアゾ化合物の製造法
JPS60229300A (ja) * 1984-03-01 1985-11-14 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Ｅｅｐｒｏｍ型メモリ装置
US4984212A (en) * 1984-09-26 1991-01-08 Hitachi, Ltd. Semiconductor memory
US5136546A (en) * 1984-09-26 1992-08-04 Hitachi, Ltd. Semiconductor memory
US6404663B2 (en) * 1999-06-14 2002-06-11 Fujitsu Limited Semiconductor integrated circuit having testing mode for modifying operation timing
US6535441B2 (en) * 2001-01-23 2003-03-18 Mitsubishi Denki Kabushiki Kaisha Static semiconductor memory device capable of accurately detecting failure in standby mode

Also Published As

Publication number Publication date
JPS628877B2 (enrdf_load_stackoverflow) 1987-02-25

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