JPS5760593A - Sample holding circuit - Google Patents

Sample holding circuit

Info

Publication number
JPS5760593A
JPS5760593A JP55132932A JP13293280A JPS5760593A JP S5760593 A JPS5760593 A JP S5760593A JP 55132932 A JP55132932 A JP 55132932A JP 13293280 A JP13293280 A JP 13293280A JP S5760593 A JPS5760593 A JP S5760593A
Authority
JP
Japan
Prior art keywords
signal
fet2
power source
electrode
distortion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55132932A
Other languages
Japanese (ja)
Other versions
JPS636957B2 (en
Inventor
Shinichi Ohashi
Isao Akitake
Tsutomu Noda
Takao Arai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55132932A priority Critical patent/JPS5760593A/en
Publication of JPS5760593A publication Critical patent/JPS5760593A/en
Publication of JPS636957B2 publication Critical patent/JPS636957B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element

Landscapes

  • Amplifiers (AREA)

Abstract

PURPOSE:To eliminate the distortion component which is caused on the basis of the electrostatic capacity among various types of electrodes and the nonlinearity of the on-resistance, etc. by applying the input signal to both the gate electrode and the substrate electrode of a semiconductor switching element. CONSTITUTION:An input signal 1 is applied to both gate driving power source 5a and bias power source 5b of an MOSFET2. At the same time, the signal 1 is sampled by the FET2 and then charged to a holding capacitor 3. Thus the terminal voltage of the capacitor 3 is set nearly equal to the input voltage. Accordingly no input voltage component is applied among the 4 pieces of electrode terminal of the FET2. As a result, the factor of distortion can be eliminated for a holding signal.
JP55132932A 1980-09-26 1980-09-26 Sample holding circuit Granted JPS5760593A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55132932A JPS5760593A (en) 1980-09-26 1980-09-26 Sample holding circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55132932A JPS5760593A (en) 1980-09-26 1980-09-26 Sample holding circuit

Publications (2)

Publication Number Publication Date
JPS5760593A true JPS5760593A (en) 1982-04-12
JPS636957B2 JPS636957B2 (en) 1988-02-13

Family

ID=15092863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55132932A Granted JPS5760593A (en) 1980-09-26 1980-09-26 Sample holding circuit

Country Status (1)

Country Link
JP (1) JPS5760593A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03219724A (en) * 1989-10-12 1991-09-27 Yokogawa Electric Corp Tracking/holding circuit
US5479121A (en) * 1995-02-27 1995-12-26 Industrial Technology Research Institute Compensating circuit for MOSFET analog switches
WO2001084716A3 (en) * 2000-04-27 2002-02-07 Maxim Integrated Products Sample and hold circuits and methods
EP1538634A2 (en) * 2003-11-21 2005-06-08 Agere Systems, Inc. Long hold time sample and hold circuits

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0728990Y2 (en) * 1990-05-19 1995-07-05 高島屋日発工業株式会社 Interior materials for automobiles

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107246A (en) * 1978-02-09 1979-08-22 Matsushita Electric Ind Co Ltd Analogue switch and sample hold circuit using it

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54107246A (en) * 1978-02-09 1979-08-22 Matsushita Electric Ind Co Ltd Analogue switch and sample hold circuit using it

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03219724A (en) * 1989-10-12 1991-09-27 Yokogawa Electric Corp Tracking/holding circuit
US5479121A (en) * 1995-02-27 1995-12-26 Industrial Technology Research Institute Compensating circuit for MOSFET analog switches
WO2001084716A3 (en) * 2000-04-27 2002-02-07 Maxim Integrated Products Sample and hold circuits and methods
EP1538634A2 (en) * 2003-11-21 2005-06-08 Agere Systems, Inc. Long hold time sample and hold circuits
EP1538634A3 (en) * 2003-11-21 2006-05-10 Agere Systems, Inc. Long hold time sample and hold circuits

Also Published As

Publication number Publication date
JPS636957B2 (en) 1988-02-13

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