JPS5759320A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5759320A JPS5759320A JP13442580A JP13442580A JPS5759320A JP S5759320 A JPS5759320 A JP S5759320A JP 13442580 A JP13442580 A JP 13442580A JP 13442580 A JP13442580 A JP 13442580A JP S5759320 A JPS5759320 A JP S5759320A
- Authority
- JP
- Japan
- Prior art keywords
- diffusion region
- psg layer
- psg
- region
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
Abstract
PURPOSE:To extend a P type diffusion region up to the prescribed depth and to enhance gettering effect in a semiconductor device by a method wherein after a PSG layer used to form the P type diffusion region shallowly is removed, a new PSG layer is provided and heat treatment is performed. CONSTITUTION:An opening is formed in an SiO2 film 2 on an Si substrate 1 being proided with a base region 3, the PSG layer is provided, and after the shallow diffusion region is formed, the PSG layer thereof is removed, then the second PSG layer 6 is provided, P in the shallow diffusion region is made to be diffused still more deeply, and an N<+> type emitter region 7 is formed. Accordingly the phosphorus diffusion region can be formed to the desired depth, and gettering effect to be generated by the PSG can be enhanced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13442580A JPS5759320A (en) | 1980-09-29 | 1980-09-29 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13442580A JPS5759320A (en) | 1980-09-29 | 1980-09-29 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5759320A true JPS5759320A (en) | 1982-04-09 |
Family
ID=15128075
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13442580A Pending JPS5759320A (en) | 1980-09-29 | 1980-09-29 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5759320A (en) |
-
1980
- 1980-09-29 JP JP13442580A patent/JPS5759320A/en active Pending
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