JPS5756704A - Detector for surface flaw of bloom - Google Patents

Detector for surface flaw of bloom

Info

Publication number
JPS5756704A
JPS5756704A JP13198680A JP13198680A JPS5756704A JP S5756704 A JPS5756704 A JP S5756704A JP 13198680 A JP13198680 A JP 13198680A JP 13198680 A JP13198680 A JP 13198680A JP S5756704 A JPS5756704 A JP S5756704A
Authority
JP
Japan
Prior art keywords
mirror
bloom
kinds
circuit
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13198680A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6246804B2 (enrdf_load_stackoverflow
Inventor
Akinobu Ogasawara
Toshiro Matsubara
Shuji Naito
Akiyoshi Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP13198680A priority Critical patent/JPS5756704A/ja
Publication of JPS5756704A publication Critical patent/JPS5756704A/ja
Publication of JPS6246804B2 publication Critical patent/JPS6246804B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13198680A 1980-09-22 1980-09-22 Detector for surface flaw of bloom Granted JPS5756704A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13198680A JPS5756704A (en) 1980-09-22 1980-09-22 Detector for surface flaw of bloom

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13198680A JPS5756704A (en) 1980-09-22 1980-09-22 Detector for surface flaw of bloom

Publications (2)

Publication Number Publication Date
JPS5756704A true JPS5756704A (en) 1982-04-05
JPS6246804B2 JPS6246804B2 (enrdf_load_stackoverflow) 1987-10-05

Family

ID=15070877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13198680A Granted JPS5756704A (en) 1980-09-22 1980-09-22 Detector for surface flaw of bloom

Country Status (1)

Country Link
JP (1) JPS5756704A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59162474A (ja) * 1983-02-16 1984-09-13 マ−ク・イアン・ホウエル 導体の電磁的探査装置
JPS62203081A (ja) * 1986-03-03 1987-09-07 Tokyo Gas Co Ltd 複数埋設管の検知方法及びその装置
JP2006098071A (ja) * 2004-09-28 2006-04-13 Lasertec Corp 欠陥検出装置及び欠陥検出方法並びにパターン基板の製造方法
JP2010117280A (ja) * 2008-11-13 2010-05-27 Jfe Steel Corp スラブ表面欠陥検出方法およびスラブ表面欠陥検出装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59162474A (ja) * 1983-02-16 1984-09-13 マ−ク・イアン・ホウエル 導体の電磁的探査装置
JPS62203081A (ja) * 1986-03-03 1987-09-07 Tokyo Gas Co Ltd 複数埋設管の検知方法及びその装置
JP2006098071A (ja) * 2004-09-28 2006-04-13 Lasertec Corp 欠陥検出装置及び欠陥検出方法並びにパターン基板の製造方法
JP2010117280A (ja) * 2008-11-13 2010-05-27 Jfe Steel Corp スラブ表面欠陥検出方法およびスラブ表面欠陥検出装置

Also Published As

Publication number Publication date
JPS6246804B2 (enrdf_load_stackoverflow) 1987-10-05

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