JPS5745471A - Testing circuit for semiconductor integrated circuit - Google Patents

Testing circuit for semiconductor integrated circuit

Info

Publication number
JPS5745471A
JPS5745471A JP55121507A JP12150780A JPS5745471A JP S5745471 A JPS5745471 A JP S5745471A JP 55121507 A JP55121507 A JP 55121507A JP 12150780 A JP12150780 A JP 12150780A JP S5745471 A JPS5745471 A JP S5745471A
Authority
JP
Japan
Prior art keywords
circuit
terminal
test mode
signal
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55121507A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0160792B2 (enrdf_load_stackoverflow
Inventor
Toshiaki Machida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55121507A priority Critical patent/JPS5745471A/ja
Publication of JPS5745471A publication Critical patent/JPS5745471A/ja
Publication of JPH0160792B2 publication Critical patent/JPH0160792B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP55121507A 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit Granted JPS5745471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121507A JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121507A JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS5745471A true JPS5745471A (en) 1982-03-15
JPH0160792B2 JPH0160792B2 (enrdf_load_stackoverflow) 1989-12-25

Family

ID=14812901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121507A Granted JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5745471A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0757254A3 (de) * 1995-08-04 1998-01-07 Siemens Aktiengesellschaft Integrierte Schaltung

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5264749U (enrdf_load_stackoverflow) * 1975-11-07 1977-05-13
JPS52123662A (en) * 1976-04-09 1977-10-18 Seiko Instr & Electronics Ltd Ic inspection circuit in electronic watches
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5264749U (enrdf_load_stackoverflow) * 1975-11-07 1977-05-13
JPS52123662A (en) * 1976-04-09 1977-10-18 Seiko Instr & Electronics Ltd Ic inspection circuit in electronic watches
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0757254A3 (de) * 1995-08-04 1998-01-07 Siemens Aktiengesellschaft Integrierte Schaltung

Also Published As

Publication number Publication date
JPH0160792B2 (enrdf_load_stackoverflow) 1989-12-25

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