JPS5743279A - Method for detecting position of x-y symmetrical body - Google Patents

Method for detecting position of x-y symmetrical body

Info

Publication number
JPS5743279A
JPS5743279A JP55119082A JP11908280A JPS5743279A JP S5743279 A JPS5743279 A JP S5743279A JP 55119082 A JP55119082 A JP 55119082A JP 11908280 A JP11908280 A JP 11908280A JP S5743279 A JPS5743279 A JP S5743279A
Authority
JP
Japan
Prior art keywords
detected
center
difference
center point
edges
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55119082A
Other languages
English (en)
Inventor
Takashi Sato
Isamu Shimada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55119082A priority Critical patent/JPS5743279A/ja
Priority to DE8181303887T priority patent/DE3167094D1/de
Priority to EP81303887A priority patent/EP0047127B1/en
Priority to US06/296,310 priority patent/US4424588A/en
Priority to IE1985/81A priority patent/IE51678B1/en
Publication of JPS5743279A publication Critical patent/JPS5743279A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP55119082A 1980-08-29 1980-08-29 Method for detecting position of x-y symmetrical body Pending JPS5743279A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP55119082A JPS5743279A (en) 1980-08-29 1980-08-29 Method for detecting position of x-y symmetrical body
DE8181303887T DE3167094D1 (en) 1980-08-29 1981-08-25 Method of detecting position of symmetric article
EP81303887A EP0047127B1 (en) 1980-08-29 1981-08-25 Method of detecting position of symmetric article
US06/296,310 US4424588A (en) 1980-08-29 1981-08-26 Method for detecting the position of a symmetrical article
IE1985/81A IE51678B1 (en) 1980-08-29 1981-08-28 Method of detecting position of symmetric article

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55119082A JPS5743279A (en) 1980-08-29 1980-08-29 Method for detecting position of x-y symmetrical body

Publications (1)

Publication Number Publication Date
JPS5743279A true JPS5743279A (en) 1982-03-11

Family

ID=14752427

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55119082A Pending JPS5743279A (en) 1980-08-29 1980-08-29 Method for detecting position of x-y symmetrical body

Country Status (5)

Country Link
US (1) US4424588A (ja)
EP (1) EP0047127B1 (ja)
JP (1) JPS5743279A (ja)
DE (1) DE3167094D1 (ja)
IE (1) IE51678B1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064589A (ja) * 1983-09-19 1985-04-13 Matsushita Electric Ind Co Ltd 画像位置検出方法

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3204021A1 (de) * 1982-02-05 1983-08-18 Gebhardt Fördertechnik GmbH, 6920 Sinsheim Verteileranlage fuer bewegte stueckgueter
DE3485604D1 (de) * 1983-04-11 1992-04-23 Komatsu Mfg Co Ltd Verfahren zum identifizieren von objekten.
EP0124789B1 (en) * 1983-04-11 1990-01-24 Kabushiki Kaisha Komatsu Seisakusho Method of identifying objects
US4680704A (en) * 1984-12-28 1987-07-14 Telemeter Corporation Optical sensor apparatus and method for remotely monitoring a utility meter or the like
US4641244A (en) * 1985-04-05 1987-02-03 Opti-Copy, Inc. Method and apparatus for registering color separation film
JPS62103508A (ja) * 1985-10-31 1987-05-14 Hajime Sangyo Kk 物体の外形検査方法及び装置
US4823394A (en) * 1986-04-24 1989-04-18 Kulicke & Soffa Industries, Inc. Pattern recognition system
US4796187A (en) * 1986-12-24 1989-01-03 Hughes Aircraft Company Method for processing image data to select a target aimpoint
US4849914A (en) * 1987-09-22 1989-07-18 Opti-Copy, Inc. Method and apparatus for registering color separation film
EP0425943A3 (en) * 1989-10-31 1991-08-28 Inoex Gmbh Procedure to determine the geometry of a transversal cut of an object coming out of a profiling machine, in particular a longitudinal extruder object
JPH0723997B2 (ja) * 1990-08-24 1995-03-15 富士ゼロックス株式会社 文字・図形描画装置
US5278634A (en) 1991-02-22 1994-01-11 Cyberoptics Corporation High precision component alignment sensor system
IT1258006B (it) * 1992-01-13 1996-02-20 Gd Spa Sistema e metodo per il prelievo automatico di oggetti
JP2851022B2 (ja) * 1992-06-09 1999-01-27 株式会社鷹山 Ｉｃの傾き検査方法
US5455899A (en) * 1992-12-31 1995-10-03 International Business Machines Corporation High speed image data processing circuit
GB2276446B (en) * 1993-03-26 1996-07-03 Honda Motor Co Ltd Method of measuring the position of a hole
DE4416707A1 (de) * 1994-05-11 1995-11-16 Tax Ingenieurgesellschaft Mbh Verfahren zur Zielwegkorrektur eines Lastträgers und Lastentransportanlage
US5515447A (en) * 1994-06-07 1996-05-07 United Parcel Service Of America, Inc. Method and apparatus for locating an acquisition target in two-dimensional images by detecting symmetry in two different directions
DE19825829C2 (de) * 1998-06-10 2000-07-27 Leica Microsystems Verfahren zur Bestimmung des Abstandes P einer Kante eines Strukturelementes auf einem Substrat
US6728391B1 (en) 1999-12-03 2004-04-27 United Parcel Service Of America, Inc. Multi-resolution label locator
US20050201638A1 (en) * 2004-03-12 2005-09-15 Hanbyn Cha Method and system for measuring an object in digital image
US20060261541A1 (en) * 2005-05-18 2006-11-23 Duanfeng He System and method for data capture within a predefined area
US7873220B2 (en) * 2007-01-03 2011-01-18 Collins Dennis G Algorithm to measure symmetry and positional entropy of a data set
WO2008115532A1 (en) 2007-03-20 2008-09-25 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) * 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging
HUE057765T2 (hu) * 2017-09-01 2022-06-28 Bekaert Sa Nv Megfogószerkezet orsókhoz

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142557A (ja) * 1974-10-09 1976-04-10 Hitachi Ltd Saibokenshutsusochi
JPS5533220A (en) * 1978-08-31 1980-03-08 Fuji Xerox Co Ltd Detection system for deviation value

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4115806A (en) * 1975-05-23 1978-09-19 Bausch & Lomb Incorporated Image analysis data transfer
US4200393A (en) * 1976-06-07 1980-04-29 Tokyo Shibaura Elecric Co., Ltd. Method of positioning a semiconductor member by examining it and a die bonding apparatus using the same
US4213117A (en) * 1977-11-28 1980-07-15 Hitachi, Ltd. Method and apparatus for detecting positions of chips on a semiconductor wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142557A (ja) * 1974-10-09 1976-04-10 Hitachi Ltd Saibokenshutsusochi
JPS5533220A (en) * 1978-08-31 1980-03-08 Fuji Xerox Co Ltd Detection system for deviation value

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064589A (ja) * 1983-09-19 1985-04-13 Matsushita Electric Ind Co Ltd 画像位置検出方法
JPH0446038B2 (ja) * 1983-09-19 1992-07-28 Matsushita Electric Ind Co Ltd

Also Published As

Publication number Publication date
IE811985L (en) 1982-02-28
EP0047127A1 (en) 1982-03-10
DE3167094D1 (en) 1984-12-13
EP0047127B1 (en) 1984-11-07
US4424588A (en) 1984-01-03
IE51678B1 (en) 1987-02-04

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