JPS5741712A - Control system of contact and detachment mechanism system - Google Patents

Abstract

PURPOSE:To reduce the noncontacting regions produced at the tip and the rear edge of a subject, by carrying out an operation timing correction in accordance with the working time of a mechanism system. CONSTITUTION:The facilities 4 has a contact and detachment to and from a subject (material to be inspected) 1 through a driving circuit 14 to perform the flaw detection. The working time t1 during which a contact is carried out is stored in a setter 9a; while the distance lT between a sensor 8 and a probe 2 is stored in a setter 12a. When the material 1 comes in from the left side, a sensor 7 detects the tip of the material 1. And a counter 9a counts the pulses sent from a length measuring pulse generator 6a for the time t1 and delivers the value l1 to a counter 11a. The counter 11a counts the pulses sent from the generator 6a with a preset value of lT-l1 after the tip of the material 1 is detected by the sensor 8, and then gives a contact designation to the circuit 14 when it reaches the preset value. Setters 10b and 12b, counters 9b and 11b plus a length measuring pulse generator 6b work at the rear edge part of the material 1.