JPS52151089A - Quantifying method for foreign matter in metal - Google Patents

Quantifying method for foreign matter in metal

Info

Publication number
JPS52151089A
JPS52151089A JP6766576A JP6766576A JPS52151089A JP S52151089 A JPS52151089 A JP S52151089A JP 6766576 A JP6766576 A JP 6766576A JP 6766576 A JP6766576 A JP 6766576A JP S52151089 A JPS52151089 A JP S52151089A
Authority
JP
Japan
Prior art keywords
metal
foreign matter
quantifying method
quantifying
analyze
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6766576A
Other languages
Japanese (ja)
Inventor
Takao Edamura
Yutaka Hiratsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6766576A priority Critical patent/JPS52151089A/en
Publication of JPS52151089A publication Critical patent/JPS52151089A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To analyze in short time foreign matter in metal by detecting cathode luminescence within metal.
JP6766576A 1976-06-11 1976-06-11 Quantifying method for foreign matter in metal Pending JPS52151089A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6766576A JPS52151089A (en) 1976-06-11 1976-06-11 Quantifying method for foreign matter in metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6766576A JPS52151089A (en) 1976-06-11 1976-06-11 Quantifying method for foreign matter in metal

Publications (1)

Publication Number Publication Date
JPS52151089A true JPS52151089A (en) 1977-12-15

Family

ID=13351515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6766576A Pending JPS52151089A (en) 1976-06-11 1976-06-11 Quantifying method for foreign matter in metal

Country Status (1)

Country Link
JP (1) JPS52151089A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5332093U (en) * 1976-08-25 1978-03-20

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5332093U (en) * 1976-08-25 1978-03-20
JPS5929256Y2 (en) * 1976-08-25 1984-08-22 シャープ株式会社 vending machine

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